World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
57
Citations
12017
World Ranking
1980
National Ranking
775

Overview

Chris H. Kim is affiliated with the University of Minnesota in the United States. Their research spans multiple areas within engineering and computer science, with a focus on electrical and electronic engineering as a primary subfield. Other relevant subfields of their work include artificial intelligence, computer networks and communications, electronic, optical and magnetic materials, and hardware and architecture.

The scientist's work covers several main topics including semiconductor materials and devices, quantum computing algorithms and architecture, advancements in semiconductor devices and circuit design, neural networks and reservoir computing, advanced memory and neural computing, radiation effects in electronics, and copper interconnects and reliability.

Chris H. Kim has published frequently in the following venues:

  • Nature Electronics
  • IEEE Journal of Solid-State Circuits
  • IEEE Transactions on Device and Materials Reliability
  • arXiv (Cornell University)
  • Scientific Reports

Their recent notable papers include:

  • "A 1,968-node coupled ring oscillator circuit for combinatorial optimization problem solving," 2022, Nature Electronics
  • "A Probabilistic Compute Fabric Based on Coupled Ring Oscillators for Solving Combinatorial Optimization Problems," 2021, IEEE Journal of Solid-State Circuits
  • "An Ising solver chip based on coupled ring oscillators with a 48-node all-to-all connected array architecture," 2023, Nature Electronics
  • "Impact of Process Variability on Write Error Rate and Read Disturbance in STT-MRAM Devices," 2020, IEEE Transactions on Magnetics
  • "An Embedded nand Flash-Based Compute-In-Memory Array Demonstrated in a Standard Logic Process," 2021, IEEE Journal of Solid-State Circuits

Frequent co-authors in Chris H. Kim's publications include:

  • Sachin S. Sapatnekar
  • Ulya R. Karpuzcu
  • William Moy
  • Luke Everson
  • S Ramprasath

Best Publications

  • Printed, sub-3V digital circuits on plastic from aqueous carbon nanotube inks.

    Mingjing Ha;Yu Xia;Alexander A. Green;Wei Zhang

  • Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits

    Tae-Hyoung Kim;R. Persaud;C.H. Kim

  • A Scaling Roadmap and Performance Evaluation of In-Plane and Perpendicular MTJ Based STT-MRAMs for High-Density Cache Memory

    Ki Chul Chun;Hui Zhao;Jonathan D. Harms;Tae-Hyoung Kim

  • Impact of NBTI on SRAM Read Stability and Design for Reliability

    Sanjay V. Kumar;Chris H. Kim;Sachin S. Sapatnekar

  • An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation

    John Keane;Tae-Hyoung Kim;Chris H Kim

  • NBTI-aware synthesis of digital circuits

    Sanjay V. Kumar;Chris H. Kim;Sachin S. Sapatnekar

  • A 0.2 V, 480 kb Subthreshold SRAM With 1 k Cells Per Bitline for Ultra-Low-Voltage Computing

    Tae-Hyoung Kim;J. Liu;J. Keane;C.H. Kim

  • An analytical model for negative bias temperature instability

    Sanjay V. Kumar;Chris H. Kim;Sachin S. Sapatnekar

  • Aerosol jet printed, low voltage, electrolyte gated carbon nanotube ring oscillators with sub-5 μs stage delays.

    Mingjing Ha;Jung Woo T. Seo;Pradyumna L. Prabhumirashi;Wei Zhang

  • CorNET: Deep Learning Framework for PPG-Based Heart Rate Estimation and Biometric Identification in Ambulant Environment

    Dwaipayan Biswas;Luke Everson;Muqing Liu;Madhuri Panwar

  • An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB

    J. Keane;Xiaofei Wang;D. Persaud;C.H. Kim

  • Printed Sub-2 V Gel-Electrolyte-Gated Polymer Transistors and Circuits

    Yu Xia;Wei Zhang;Mingjing Ha;Jeong Ho Cho

  • Solution-processed carbon nanotube thin-film complementary static random access memory

    Michael L. Geier;Julian J. McMorrow;Weichao Xu;Jian Zhu

  • Ultra-low power DLMS adaptive filter for hearing aid applications

    Hyung-il Kim;Kaushik Roy

  • Gate leakage reduction for scaled devices using transistor stacking

    S. Mukhopadhyay;C. Neau;R.T. Cakici;A. Agarwal

  • Leakage Power Analysis and Reduction for Nanoscale Circuits

    Amit Agarwal;Saibal Mukhopadhyay;Arijit Raychowdhury;Kaushik Roy

  • A High-Density Subthreshold SRAM with Data-Independent Bitline Leakage and Virtual Ground Replica Scheme

    Tae-Hyoung Kim;J. Liu;J. Keane;C.H. Kim

  • A Voltage Scalable 0.26 V, 64 kb 8T SRAM With V $_{\min}$ Lowering Techniques and Deep Sleep Mode

    Tae-Hyoung Kim;J. Liu;C.H. Kim

  • Spin-Based Computing: Device Concepts, Current Status, and a Case Study on a High-Performance Microprocessor

    Jongyeon Kim;Ayan Paul;Paul A. Crowell;Steven J. Koester

  • Ultra-low-power DLMS adaptive filter for hearing aid applications

    C.H.-I. Kim;H. Soeleman;K. Roy

  • An all-in-one silicon Odometer for separately monitoring HCI, BTI, and TDDB

    John Keane;Devin Persaud;Chris H. Kim

Frequent Co-Authors

Sachin S. Sapatnekar
Sachin S. Sapatnekar University of Minnesota
Kaushik Roy
Kaushik Roy Purdue University West Lafayette
Keshab K. Parhi
Keshab K. Parhi University of Minnesota
Saibal Mukhopadhyay
Saibal Mukhopadhyay Georgia Institute of Technology
Ram Krishnamurthy
Ram Krishnamurthy Intel (United States)
C. Daniel Frisbie
C. Daniel Frisbie University of Minnesota
Mark C. Hersam
Mark C. Hersam Northwestern University
Steven J. Koester
Steven J. Koester University of Minnesota
Tobin J. Marks
Tobin J. Marks Northwestern University

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