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D-Index & Metrics

Materials Science

D-Index
54
Citations
11485
World Ranking
8847
National Ranking
2162

Lloyd J. Whitman publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Lloyd J. Whitman sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 167 publications — 19th percentile

19% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Lloyd J. Whitman D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Lloyd J. Whitman sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 54 D-Index — 32nd percentile

32% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

Lloyd J. Whitman is affiliated with the United States Naval Research Laboratory in the United States. Their research spans several areas within computer science and engineering, with a particular focus on computing architectures and memory technologies.

Their publication record includes work on advanced computing methods that diverge from traditional silicon-based and von Neumann architectures. A notable recent paper is titled Nonsilicon, Non-von Neumann Computing-Part II, published in 2020 in the Proceedings of the IEEE. This paper has been cited five times and explores alternative computing paradigms beyond classical semiconductor technologies.

Whitman frequently collaborates with researchers including:

  • Sankar Basu
  • Randal E. Bryant
  • Giovanni De Micheli
  • Thomas Theis

Their work appears primarily in the Proceedings of the IEEE, a venue known for disseminating research in electrical engineering, computer science, and related fields.

Main fields of study for Whitman cover broad disciplines, such as:

  • Computer Science
  • Engineering

Diving deeper into specific subfields, their research engages with:

  • Electrical and Electronic Engineering
  • Computational Theory and Mathematics
  • Artificial Intelligence

Whitman's contributions focus on several advanced topics, particularly regarding computation and memory, including:

  • Advanced Memory and Neural Computing
  • Quantum-Dot Cellular Automata
  • Quantum Computing Algorithms and Architecture

Their emphasis on quantum-dot cellular automata and quantum computing architectures indicates a strong interest in emerging technologies that could redefine computing hardware paradigms. The integration of neural computing and advanced memory concepts reflects multidisciplinary expertise bridging theoretical and applied aspects of computer science and engineering.

Best Publications

  • Detection Limits for Nanoscale Biosensors

    Paul E. Sheehan;Lloyd J. Whitman

  • The BARC biosensor applied to the detection of biological warfare agents.

    R. L. Edelstein;C. R. Tamanaha;P. E. Sheehan;M. M. Miller

  • Base-dependent competitive adsorption of single-stranded DNA on gold.

    Hiromi Kimura-Suda;Dmitri Y. Petrovykh;Michael J. Tarlov;Lloyd J. Whitman

  • Design and Performance of GMR Sensors for the Detection of Magnetic Microbeads in Biosensors

    J.C. Rife;M.M. Miller;P.E. Sheehan;C.R. Tamanaha

  • Quantitative Analysis and Characterization of DNA Immobilized on Gold

    Dmitri Y. Petrovykh;Hiromi Kimura-Suda;Lloyd J. Whitman;Michael J. Tarlov

  • Manipulation of adsorbed atoms and creation of new structures on room-temperature surfaces with a scanning tunneling microscope

    L Whitman;Joseph A. Stroscio;Robert A. Dragoset;Robert Celotta

  • A DNA array sensor utilizing magnetic microbeads and magnetoelectronic detection

    M.M. Miller;P.E. Sheehan;R.L. Edelstein;C.R. Tamanaha

  • The structure of silicon surfaces from (001) to (111)

    A.A. Baski;S.C. Erwin;L.J. Whitman

  • INFLUENCE OF SUBSTRATE SURFACE RECONSTRUCTION ON THE GROWTH AND MAGNETIC PROPERTIES OF FE ON GAAS(001)

    E. M. Kneedler;B. T. Jonker;P. M. Thibado;R. J. Wagner

  • Independent control of grafting density and conformation of single-stranded DNA brushes

    Aric Opdahl;Dmitri Y. Petrovykh;Hiromi Kimura-Suda;Michael J. Tarlov

  • Magnetic labeling, detection, and system integration

    C.R. Tamanaha;S.P. Mulvaney;J.C. Rife;L.J. Whitman

  • Thiol Diffusion and the Role of Humidity in "Dip Pen Nanolithography"

    P. E. Sheehan;L. J. Whitman

  • Quantitative Characterization of DNA Films by X-ray photoelectron spectroscopy

    D Y. Petrovykh;H Y. Kimura-Suda;Michael J. Tarlov;L J. Whitman

  • Geometric and electronic properties of Cs structures on III-V (110) surfaces: From 1D and 2D insulators to 3D metals.

    L Whitman;Joseph A. Stroscio;Robert A. Dragoset;Robert Celotta

  • Nanoscale deposition of solid inks via thermal dip pen nanolithography

    P. E. Sheehan;L. J. Whitman;William Paul King;Brent A. Nelson

  • Engineering electron and hole tunneling with asymmetric InAs quantum dot molecules

    A. S. Bracker;M. Scheibner;M. F. Doty;E. A. Stinaff

  • The chemisorption of chlorosilanes and chlorine on Si(111)7 × 7

    L.J Whitman;S.A Joyce;J.A Yarmoff;F.R McFeely

  • Investigation of plasma etching mechanisms using beams of reactive gas ions

    T. M. Mayer;R. A. Barker;L. J. Whitman

  • Chemical and electronic properties of sulfur-passivated InAs surfaces

    D.Y. Petrovykh;D.Y. Petrovykh;M.J. Yang;L.J. Whitman

  • A Stable High-Index Surface of Silicon: Si(5 5 12)

    A. A. Baski;L. J. Whitman;S. C. Erwin

  • Rapid, Femtomolar Bioassays in Complex Matrices ComBining Microfluidics and Magnetoelectronics

    S.P. Mulvaney;C.L. Cole;M.D. Kniller;M. Malito

Frequent Co-Authors

Brian R. Bennett
Brian R. Bennett United States Naval Research Laboratory
Paul E. Sheehan
Paul E. Sheehan Defense Advanced Research Projects Agency
Michael J. Tarlov
Michael J. Tarlov National Institute of Standards and Technology
Joseph A. Stroscio
Joseph A. Stroscio National Institute of Standards and Technology
Igor Vurgaftman
Igor Vurgaftman United States Naval Research Laboratory
Jerry R. Meyer
Jerry R. Meyer United States Naval Research Laboratory
William P. King
William P. King University of Illinois at Urbana-Champaign
Lane A. Baker
Lane A. Baker Texas A&M University
Steven C. Erwin
Steven C. Erwin United States Naval Research Laboratory
B. T. Jonker
B. T. Jonker United States Naval Research Laboratory

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