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Materials Science

D-Index
55
Citations
16266
World Ranking
8456
National Ranking
2086

Research.com Recognitions

  • 2018 - Joseph F. Keithley Award For Advances in Measurement Science, American Physical Society
  • 2010 - Fellow of the American Association for the Advancement of Science (AAAS)
  • 2002 - Fellow of American Physical Society (APS) Citation For advancing our fundamental knowledge of semiconductor and metal surfaces and the innovative development, application, and dissemination of advanced methods of scanning tunneling microscopy and spectroscopy

Overview

Joseph A. Stroscio is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on physics and materials science, with specific subfields in atomic and molecular physics, optics, materials chemistry, artificial intelligence, and electrical and electronic engineering.

The scientist's work spans multiple topics within their fields of study, including:

  • Quantum and electron transport phenomena
  • Graphene research and applications
  • Topological materials and phenomena
  • Surface and thin film phenomena
  • Force microscopy techniques and applications
  • Quantum information and cryptography
  • Mechanical and optical resonators

Among recent publications by Joseph A. Stroscio are:

  • "Achieving μeV tunneling resolution in an in-operando scanning tunneling microscopy, atomic force microscopy, and magnetotransport system for quantum materials research," 2020, Review of Scientific Instruments
  • "Tuning single-electron charging and interactions between compressible Landau level islands in graphene," 2020, Physical Review B
  • "A quantum ruler for orbital magnetism in moiré quantum matter," 2023, Science
  • "Visualizing the merger of tunably coupled graphene quantum dots," 2023, Physical Review B
  • "Roadmap on atomically-engineered quantum platforms," 2025, Nano Futures

Frequent collaborators include Fereshte Ghahari, Kenji Watanabe, Nikolai B. Zhitenev, Takashi Taniguchi, and Daniel Walkup.

The venues where Joseph A. Stroscio has published most frequently are:

  • Physical Review B
  • arXiv (Cornell University)
  • Review of Scientific Instruments
  • Science
  • Nano Futures

Joseph A. Stroscio has received several recognitions, such as the Joseph F. Keithley Award For Advances in Measurement Science from the American Physical Society in 2018. They were named a Fellow of the American Association for the Advancement of Science (AAAS) in 2010 and a Fellow of the American Physical Society in 2002. The APS fellowship citation highlights contributions to semiconductor and metal surface knowledge and the development and dissemination of advanced scanning tunneling microscopy and spectroscopy methods.

Best Publications

  • Atomic and molecular manipulation with the scanning tunneling microscope

    Joseph A. Stroscio;D. M. Eigler

  • Scattering and interference in epitaxial graphene.

    G. M. Rutter;G. M. Rutter;J. N. Crain;J. N. Crain;N. P. Guisinger;N. P. Guisinger;T. Li;T. Li

  • Tunneling spectroscopy of the Si(111)2 × 1 surface

    R.M. Feenstra;Joseph A. Stroscio;A.P. Fein

  • Electronic Structure of the Si(111)2 × 1 Surface by Scanning-Tunneling Microscopy

    Joseph A. Stroscio;R. M. Feenstra;A. P. Fein

  • Atom-selective imaging of the GaAs(110) surface.

    R. M. Feenstra;Joseph A. Stroscio;J. Tersoff;A. P. Fein

  • Scanning tunneling microscopy

    Joseph Anthony Stroscio;William J. Kaiser

  • Observing the Quantization of Zero Mass Carriers in Graphene

    David L. Miller;Kevin D. Kubista;Gregory M. Rutter;Ming Ruan

  • Tunneling spectroscopy of the GaAs(110) surface

    R. M. Feenstra;Joseph A. Stroscio

  • Scaling of diffusion-mediated island growth in iron-on-iron homoepitaxy.

    Joseph A. Stroscio;Daniel T. Pierce

  • Homoepitaxial growth of iron and a real space view of reflection-high-energy-electron diffraction.

    Joseph A. Stroscio;Daniel T. Pierce;Robert A. Dragoset

  • Manipulation of adsorbed atoms and creation of new structures on room-temperature surfaces with a scanning tunneling microscope

    L Whitman;Joseph A. Stroscio;Robert A. Dragoset;Robert Celotta

  • Controlling the dynamics of a single atom in lateral atom manipulation.

    Joseph A. Stroscio;Robert J. Celotta

  • Electromechanical Properties of Graphene Drumheads

    Nikolai N. Klimov;Nikolai N. Klimov;Suyong Jung;Suyong Jung;Shuze Zhu;Teng Li

  • Coarsening of Unstable Surface Features during Fe(001) Homoepitaxy

    Joseph A. Stroscio;Daniel T. Pierce;Mark D. Stiles;A Zangwill

  • Epitaxial Graphenes on Silicon Carbide

    Phillip N. First;Walt A. de Heer;Thomas Seyller;Claire Berger

  • Local state density and long-range screening of adsorbed oxygen atoms on the GaAs(110) surface.

    Joseph A. Stroscio;R. M. Feenstra;A. P. Fein

  • Asymmetries in dislocation densities, surface morphology, and strain of GaInAs/GaAs single heterolayers

    K. L. Kavanagh;M. A. Capano;L. W. Hobbs;J. C. Barbour

  • Experimental evidence for s-wave pairing symmetry in superconducting Cu(x)Bi2Se3 single crystals using a scanning tunneling microscope

    Niv Levy;Tong Zhang;Tong Zhang;Jeonghoon Ha;Fred Sharifi

  • Imaging the interface of epitaxial graphene with silicon carbide via scanning tunneling microscopy

    Gregory M. Rutter;N Guisinger;Jason Crain;Emily Jarvis

  • Atomic-scale observations of alloying at the Cr-Fe(001) interface.

    Angela Davies;Joseph A. Stroscio;Daniel T. Pierce;Robert Celotta

Frequent Co-Authors

Kenji Watanabe
Kenji Watanabe National Institute for Materials Science
Randall M. Feenstra
Randall M. Feenstra Carnegie Mellon University
Takashi Taniguchi
Takashi Taniguchi National Institute for Materials Science
Walt A. de Heer
Walt A. de Heer Georgia Institute of Technology
Lloyd J. Whitman
Lloyd J. Whitman United States Naval Research Laboratory
Wilson Ho
Wilson Ho University of California, Irvine
Claire Berger
Claire Berger Georgia Institute of Technology
Cory Dean
Cory Dean Columbia University
Mei-Yin Chou
Mei-Yin Chou Academia Sinica

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