World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
35
Citations
9068
World Ranking
8870
National Ranking
566

Overview

David J. Whitehouse is affiliated with the University of Warwick in the United Kingdom. Their professional background reflects involvement in academic research and scientific inquiry within this institution.

Information regarding recent papers authored by David J. Whitehouse, including titles, years of publication, and venues, is not available. Likewise, data concerning frequent co-authors, publication venues, and book publications is not provided.

Details on the main fields and subfields of study associated with David J. Whitehouse, as well as main topics of research focus, have not been documented in the available source data.

No record of awards or honors received by David J. Whitehouse is present in the source data. The scientist is currently living.

Best Publications

  • The Properties of Random Surfaces of Significance in their Contact

    David J. Whitehouse;J. F. Archard

  • Handbook of Surface Metrology

    David J. Whitehouse

  • Surfaces and their measurement

    D. J. Whitehouse

  • Some theoretical aspects of error separation techniques in surface metrology

    D J Whitehouse

  • Paradigm shifts in surface metrology. Part II. The current shift

    Xiang Jiang;Paul J. Scott;Paul J. Scott;D.J. Whitehouse;D.J. Whitehouse;D.J. Whitehouse;Liam Blunt

  • Technological shifts in surface metrology

    X. Jane Jiang;David J. Whitehouse

  • Handbook of Surface and Nanometrology, Second Edition

    David Whitehouse

  • Stiffness estimation of a tripod-based parallel kinematic machine

    T. Huang;M.P. Mei;X.Y. Zhao;L.H. Zhou

  • The parameter rash — is there a cure?

    D.J. Whitehouse

  • Optimal kinematic design of 2-DOF parallel manipulators with well-shaped workspace bounded by a specified conditioning index.

    Tian Huang;Meng Li;Zhanxian Li;Derek G. Chetwynd

  • REVIEW ARTICLE: Surface metrology

    Unknown

  • Paradigm shifts in surface metrology. Part I. Historical philosophy

    Xiang Jiang;Paul J. Scott;Paul J. Scott;D.J. Whitehouse;D.J. Whitehouse;Liam Blunt

  • The Local Dexterity, Optimal Architecture and Design Criteria of Parallel Machine Tools

    Tian Huang;D.J. Whitehouse;Jinsong Wang

  • Characterization of Surface Texture Generated by Plateau Honing Process

    Mark C. Malburg;Jay Raja;David J. Whitehouse

  • Discrete properties of random surfaces

    David J. Whitehouse;M. J. Phillips

  • Fractal or fiction

    D.J. Whitehouse

  • Two-freedom translational parallel robot mechanism containing only rotating sets

    Huang Tian;Li Meng;Li Zhanxian

  • Freeform surface characterisation - a fresh strategy

    Xiang Jiang;Paul J. Scott;D.J. Whitehouse;D.J. Whitehouse

  • Surfaces — A Link between Manufacture and Function:

    D. J. Whitehouse

  • A New Unified Approach to Surface Metrology

    R. C. Spragg;D. J. Whitehouse

  • A general and novel approach for parameter identification of 6-DOF parallel kinematic machines

    Tian Huang;Derek G. Chetwynd;David J. Whitehouse;Jinsong Wang

Frequent Co-Authors

Tian Huang
Tian Huang Tianjin University
Derek G. Chetwynd
Derek G. Chetwynd University of Warwick
Jinsong Wang
Jinsong Wang Tsinghua University
Clément Gosselin
Clément Gosselin Université Laval
Liam Blunt
Liam Blunt University of Huddersfield
Chi Fai Cheung
Chi Fai Cheung Hong Kong Polytechnic University
Xiangqian Jiang
Xiangqian Jiang University of Huddersfield
Suet To
Suet To Hong Kong Polytechnic University

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