World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
46
Citations
8805
World Ranking
5129
National Ranking
84

Wei Gao publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Wei Gao sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 525 publications — 95th percentile

95% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

Wei Gao D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Wei Gao sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 46 D-Index — 49th percentile

49% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Research.com Recognitions

  • 2005 - SPIE Fellow
  • 2001 - Fellow of the Royal Society of New Zealand

Overview

Wei Gao is affiliated with Tohoku University in Japan and has contributed extensively to the field of engineering, with a focus on mechanical engineering, electrical and electronic engineering, biomedical engineering, computer vision and pattern recognition, and computational mechanics. Their research encompasses a variety of specialized subfields within these disciplines.

The main topics covered by Wei Gao's research include:

  • Advanced Measurement and Metrology Techniques
  • Optical measurement and interference techniques
  • Advanced Surface Polishing Techniques
  • Surface Roughness and Optical Measurements
  • Advanced machining processes and optimization
  • Advanced Fiber Laser Technologies
  • Advanced Fiber Optic Sensors

Wei Gao's recent academic publications demonstrate engagement with issues surrounding machine tool precision, thermal management, ceramics, and sensor technologies. A selection of their recent papers includes:

  • "Machine tool calibration: Measurement, modeling, and compensation of machine tool errors," 2023, International Journal of Machine Tools and Manufacture
  • "Preparation and performance of alumina ceramic coating doped with aluminum nitride by micro arc oxidation," 2020, Ceramics International
  • "Optical Angle Sensor Technology Based on the Optical Frequency Comb Laser," 2020, Applied Sciences
  • "Numerical investigation on thermal runaway propagation and prevention in cell-to-chassis lithium-ion battery system," 2023, Applied Thermal Engineering
  • "Experimental and numerical study on thermofluidic characteristics of microchannel heat sinks with various micro pin-fin arrays arrangement patterns," 2023, Applied Thermal Engineering

Frequent co-authors collaborating with Wei Gao include Hiraku Matsukuma, Yuki Shimizu, Ryo Sato, Lue Quan, and Ping Ping.

The main publication venues where Wei Gao's work appears most often are:

  • Applied Sciences
  • Precision Engineering
  • International Journal of Automation Technology
  • Sensors
  • Optics Express

Wei Gao has been recognized by major professional organizations, receiving distinctions such as the SPIE Fellow in 2005 and becoming a Fellow of the Royal Society of New Zealand in 2001.

Best Publications

  • Measurement technologies for precision positioning

    W. Gao;S.W. Kim;H. Bosse;H. Haitjema

  • On-machine and in-process surface metrology for precision manufacturing

    W. Gao;H. Haitjema;F.Z. Fang;F.Z. Fang;R.K. Leach

  • Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder

    Wei Gao;Takeshi Araki;Satoshi Kiyono;Yuichi Okazaki

  • A surface motor-driven planar motion stage integrated with an XYθZ surface encoder for precision positioning

    Wei Gao;Shuichi Dejima;Hiroaki Yanai;Kei Katakura

  • A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage

    Xinghui Li;Wei Gao;Hiroshi Muto;Yuki Shimizu

  • Ductile Regime Nanomachining of Single-Crystal Silicon Carbide

    John Patten;Wei Gao;Kudo Yasuto

  • Measurement of multi-degree-of-freedom error motions of a precision linear air-bearing stage

    Wei Gao;Yoshikazu Arai;Atsushi Shibuya;Satoshi Kiyono

  • A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement

    Akihide Kimura;Wei Gao;WooJae Kim;Koji Hosono

  • Nanomanufacturing—Perspective and applications

    F. Z. Fang;F. Z. Fang;X. D. Zhang;W.W. Gao;Y. B. Guo

  • Precision measurement of cylinder straightness using a scanning multi-probe system

    Wei Gao;Jun Yokoyama;Hidetoshi Kojima;Satoshi Kiyono

  • A new multiprobe method of roundness measurements

    Wei Gao;Satoshi Kiyono;Tadatoshi Nomura

  • Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness

    Akihide Kimura;Wei Gao;Yoshikazu Arai;Zeng Lijiang

  • A three-axis autocollimator for detection of angular error motions of a precision stage

    W. Gao;Y. Saito;H. Muto;Y. Arai

  • A Three-axis Displacement Sensor with Nanometric Resolution

    W. Gao;A. Kimura

  • A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers

    Wei Gao;Peisen S Huang;Tomohiko Yamada;Satoshi Kiyono

  • High accuracy profile measurement of a machined surface by the combined method

    Wei Gao;Satoshi Kiyono

  • High-accuracy roundness measurement by a new error separation method

    Wei Gao;Satoshi Kiyono;Takamitu Sugawara

  • A three-probe system for measuring the parallelism and straightness of a pair of rails for ultra-precision guideways

    Jooho Hwang;Jooho Hwang;Chun-Hong Park;Wei Gao;Seung-Woo Kim

  • Surface profile measurement of a sinusoidal grid using an atomic force microscope on a diamond turning machine

    Wei Gao;Jun Aoki;Bing Feng Ju;Satoshi Kiyono

  • Profile measurement of machined surface with a new differential method

    Satoshi Kiyono;Wei Gao

Frequent Co-Authors

Fengzhou Fang
Fengzhou Fang University College Dublin
Tsunemoto Kuriyagawa
Tsunemoto Kuriyagawa Tohoku University
Andrew Forbes
Andrew Forbes Monash University
Kazuhiro Hane
Kazuhiro Hane Tohoku University
Seung-Woo Kim
Seung-Woo Kim Pusan National University
Takahito Ono
Takahito Ono Tohoku University
Abhijit Chandra
Abhijit Chandra Jadavpur University
Richard Leach
Richard Leach University of Nottingham
Yuebin Guo
Yuebin Guo Rutgers, The State University of New Jersey
Liangchi Zhang
Liangchi Zhang Southern University of Science and Technology

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