World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
46
Citations
8805
World Ranking
5127
National Ranking
84

Research.com Recognitions

  • 2005 - SPIE Fellow
  • 2001 - Fellow of the Royal Society of New Zealand

Overview

Wei Gao is affiliated with Tohoku University in Japan and has contributed extensively to the field of engineering, with a focus on mechanical engineering, electrical and electronic engineering, biomedical engineering, computer vision and pattern recognition, and computational mechanics. Their research encompasses a variety of specialized subfields within these disciplines.

The main topics covered by Wei Gao's research include:

  • Advanced Measurement and Metrology Techniques
  • Optical measurement and interference techniques
  • Advanced Surface Polishing Techniques
  • Surface Roughness and Optical Measurements
  • Advanced machining processes and optimization
  • Advanced Fiber Laser Technologies
  • Advanced Fiber Optic Sensors

Wei Gao's recent academic publications demonstrate engagement with issues surrounding machine tool precision, thermal management, ceramics, and sensor technologies. A selection of their recent papers includes:

  • "Machine tool calibration: Measurement, modeling, and compensation of machine tool errors," 2023, International Journal of Machine Tools and Manufacture
  • "Preparation and performance of alumina ceramic coating doped with aluminum nitride by micro arc oxidation," 2020, Ceramics International
  • "Optical Angle Sensor Technology Based on the Optical Frequency Comb Laser," 2020, Applied Sciences
  • "Numerical investigation on thermal runaway propagation and prevention in cell-to-chassis lithium-ion battery system," 2023, Applied Thermal Engineering
  • "Experimental and numerical study on thermofluidic characteristics of microchannel heat sinks with various micro pin-fin arrays arrangement patterns," 2023, Applied Thermal Engineering

Frequent co-authors collaborating with Wei Gao include Hiraku Matsukuma, Yuki Shimizu, Ryo Sato, Lue Quan, and Ping Ping.

The main publication venues where Wei Gao's work appears most often are:

  • Applied Sciences
  • Precision Engineering
  • International Journal of Automation Technology
  • Sensors
  • Optics Express

Wei Gao has been recognized by major professional organizations, receiving distinctions such as the SPIE Fellow in 2005 and becoming a Fellow of the Royal Society of New Zealand in 2001.

Best Publications

  • Measurement technologies for precision positioning

    W. Gao;S.W. Kim;H. Bosse;H. Haitjema

  • On-machine and in-process surface metrology for precision manufacturing

    W. Gao;H. Haitjema;F.Z. Fang;F.Z. Fang;R.K. Leach

  • Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder

    Wei Gao;Takeshi Araki;Satoshi Kiyono;Yuichi Okazaki

  • A surface motor-driven planar motion stage integrated with an XYθZ surface encoder for precision positioning

    Wei Gao;Shuichi Dejima;Hiroaki Yanai;Kei Katakura

  • A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage

    Xinghui Li;Wei Gao;Hiroshi Muto;Yuki Shimizu

  • Ductile Regime Nanomachining of Single-Crystal Silicon Carbide

    John Patten;Wei Gao;Kudo Yasuto

  • Measurement of multi-degree-of-freedom error motions of a precision linear air-bearing stage

    Wei Gao;Yoshikazu Arai;Atsushi Shibuya;Satoshi Kiyono

  • A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement

    Akihide Kimura;Wei Gao;WooJae Kim;Koji Hosono

  • Nanomanufacturing—Perspective and applications

    F. Z. Fang;F. Z. Fang;X. D. Zhang;W.W. Gao;Y. B. Guo

  • Precision measurement of cylinder straightness using a scanning multi-probe system

    Wei Gao;Jun Yokoyama;Hidetoshi Kojima;Satoshi Kiyono

  • A new multiprobe method of roundness measurements

    Wei Gao;Satoshi Kiyono;Tadatoshi Nomura

  • Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness

    Akihide Kimura;Wei Gao;Yoshikazu Arai;Zeng Lijiang

  • A three-axis autocollimator for detection of angular error motions of a precision stage

    W. Gao;Y. Saito;H. Muto;Y. Arai

  • A Three-axis Displacement Sensor with Nanometric Resolution

    W. Gao;A. Kimura

  • A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers

    Wei Gao;Peisen S Huang;Tomohiko Yamada;Satoshi Kiyono

  • High accuracy profile measurement of a machined surface by the combined method

    Wei Gao;Satoshi Kiyono

  • High-accuracy roundness measurement by a new error separation method

    Wei Gao;Satoshi Kiyono;Takamitu Sugawara

  • A three-probe system for measuring the parallelism and straightness of a pair of rails for ultra-precision guideways

    Jooho Hwang;Jooho Hwang;Chun-Hong Park;Wei Gao;Seung-Woo Kim

  • Surface profile measurement of a sinusoidal grid using an atomic force microscope on a diamond turning machine

    Wei Gao;Jun Aoki;Bing Feng Ju;Satoshi Kiyono

  • Profile measurement of machined surface with a new differential method

    Satoshi Kiyono;Wei Gao

Frequent Co-Authors

Fengzhou Fang
Fengzhou Fang University College Dublin
Tsunemoto Kuriyagawa
Tsunemoto Kuriyagawa Tohoku University
Andrew Forbes
Andrew Forbes Monash University
Kazuhiro Hane
Kazuhiro Hane Tohoku University
Seung-Woo Kim
Seung-Woo Kim Pusan National University
Takahito Ono
Takahito Ono Tohoku University
Abhijit Chandra
Abhijit Chandra Jadavpur University
Richard Leach
Richard Leach University of Nottingham
Yuebin Guo
Yuebin Guo Rutgers, The State University of New Jersey
Liangchi Zhang
Liangchi Zhang Southern University of Science and Technology

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