World's Best Scientists 2026 revealed!
Yervant Zorian

Yervant Zorian

D-Index & Metrics

Computer Science

D-Index
50
Citations
10641
World Ranking
5597
National Ranking
2556

Yervant Zorian publication distribution in Computer Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Computer Science in 2026. The highlighted bar marks where Yervant Zorian sits on this spectrum.

32–41 publications: 7 scientists 42–51 publications: 22 scientists 52–61 publications: 82 scientists 62–71 publications: 134 scientists 72–81 publications: 249 scientists 82–91 publications: 324 scientists 92–101 publications: 421 scientists 102–111 publications: 420 scientists 112–121 publications: 497 scientists 122–131 publications: 544 scientists 132–141 publications: 555 scientists 142–151 publications: 609 scientists 152–161 publications: 559 scientists 162–171 publications: 534 scientists 172–181 publications: 556 scientists 182–191 publications: 583 scientists 192–201 publications: 519 scientists 202–211 publications: 508 scientists 212–221 publications: 490 scientists 222–231 publications: 437 scientists 232–241 publications: 423 scientists 242–251 publications: 408 scientists 252–261 publications: 377 scientists 262–271 publications: 301 scientists 272–281 publications: 335 scientists 282–291 publications: 320 scientists 292–301 publications: 293 scientists 302–311 publications: 250 scientists 312–321 publications: 238 scientists 322–331 publications: 206 scientists 332–341 publications: 209 scientists 342–351 publications: 208 scientists 352–361 publications: 162 scientists 362–371 publications: 176 scientists 372–381 publications: 127 scientists 382–391 publications: 158 scientists 392–401 publications: 128 scientists 402–411 publications: 104 scientists 412–421 publications: 94 scientists 422–431 publications: 99 scientists 432–441 publications: 83 scientists 442–451 publications: 108 scientists 452–461 publications: 73 scientists 462–471 publications: 77 scientists 472–481 publications: 69 scientists 482–491 publications: 84 scientists 492–501 publications: 62 scientists 502–511 publications: 54 scientists 512–521 publications: 57 scientists 522–531 publications: 51 scientists 532–541 publications: 51 scientists 542–551 publications: 32 scientists 552–561 publications: 38 scientists 562–571 publications: 28 scientists 572–581 publications: 43 scientists 582–591 publications: 33 scientists 592–601 publications: 41 scientists 602–611 publications: 32 scientists 612–621 publications: 28 scientists 622–631 publications: 25 scientists 632–641 publications: 27 scientists 642–651 publications: 17 scientists 652–661 publications: 20 scientists 662–671 publications: 17 scientists 672–681 publications: 15 scientists 682–691 publications: 14 scientists 692–701 publications: 21 scientists 702–711 publications: 13 scientists 712–721 publications: 12 scientists 722–731 publications: 19 scientists 732–741 publications: 14 scientists 742–751 publications: 12 scientists 752–761 publications: 10 scientists 762–771 publications: 10 scientists 772–781 publications: 11 scientists 782–791 publications: 10 scientists 792–801 publications: 11 scientists 802–811 publications: 8 scientists 812–821 publications: 8 scientists 822–831 publications: 7 scientists 832–841 publications: 11 scientists 842–851 publications: 10 scientists 852–861 publications: 5 scientists 862–871 publications: 9 scientists 872–881 publications: 4 scientists 882–891 publications: 6 scientists 892–901 publications: 3 scientists 902–911 publications: 6 scientists 912–921 publications: 3 scientists 922–931 publications: 2 scientists 932–941 publications: 2 scientists 942–951 publications: 2 scientists 952–961 publications: 3 scientists 962–971 publications: 3 scientists 972–981 publications: 3 scientists 982–990 publications: 5 scientists 991+ publications: 100 scientists
32 publications 991+

This scientist: 295 publications — 73rd percentile

73% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 991 publications or more.

Yervant Zorian D-index placement in Computer Science in 2026

The chart shows the D-index (discipline H-index) distribution of Computer Science scientists ranked by Research.com in 2026. The highlighted bar marks where Yervant Zorian sits on this spectrum.

30–31 D-Index: 879 scientists 32–33 D-Index: 983 scientists 34–35 D-Index: 918 scientists 36–37 D-Index: 990 scientists 38–39 D-Index: 968 scientists 40–41 D-Index: 907 scientists 42–43 D-Index: 821 scientists 44–45 D-Index: 763 scientists 46–47 D-Index: 689 scientists 48–49 D-Index: 543 scientists 50–51 D-Index: 543 scientists 52–53 D-Index: 518 scientists 54–55 D-Index: 500 scientists 56–57 D-Index: 458 scientists 58–59 D-Index: 400 scientists 60–61 D-Index: 337 scientists 62–63 D-Index: 308 scientists 64–65 D-Index: 292 scientists 66–67 D-Index: 249 scientists 68–69 D-Index: 213 scientists 70–71 D-Index: 192 scientists 72–73 D-Index: 189 scientists 74–75 D-Index: 165 scientists 76–77 D-Index: 139 scientists 78–79 D-Index: 119 scientists 80–81 D-Index: 121 scientists 82–83 D-Index: 113 scientists 84–85 D-Index: 88 scientists 86–87 D-Index: 87 scientists 88–89 D-Index: 75 scientists 90–91 D-Index: 69 scientists 92–93 D-Index: 57 scientists 94–95 D-Index: 46 scientists 96–97 D-Index: 38 scientists 98–99 D-Index: 34 scientists 100–101 D-Index: 36 scientists 102–103 D-Index: 27 scientists 104–105 D-Index: 37 scientists 106–107 D-Index: 18 scientists 108–109 D-Index: 31 scientists 110–111 D-Index: 19 scientists 112–113 D-Index: 16 scientists 114–115 D-Index: 12 scientists 116–117 D-Index: 20 scientists 118–119 D-Index: 15 scientists 120–121 D-Index: 5 scientists 122–123 D-Index: 20 scientists 124–125 D-Index: 8 scientists 126–127 D-Index: 5 scientists 128–129 D-Index: 7 scientists 130 D-Index: 3 scientists 131+ D-Index: 98 scientists
30 D-Index 131+

This scientist: 50 D-Index — 62nd percentile

62% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 131 D-Index or more.

Overview

Yervant Zorian is affiliated with LogicVision in the United States and specializes in multiple aspects of electrical engineering, particularly focusing on integrated circuits and semiconductor failure analysis.

Their research encompasses several fields and subfields including Electrical and Electronic Engineering, Hardware and Architecture, Control and Systems Engineering, Computer Networks and Communications, and Electronic, Optical and Magnetic Materials. Within these areas, Zorian's work covers a range of topics:

  • Integrated Circuits and Semiconductor Failure Analysis
  • VLSI and Analog Circuit Testing
  • Radiation Effects in Electronics
  • Fault Detection and Control Systems
  • Electrical Fault Detection and Protection
  • Interconnection Networks and Systems
  • Semiconductor materials and devices

Zorian has contributed to a number of journal papers primarily published in IEEE venues. Recent works include:

  • "In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies," 2024, IEEE Transactions on Device and Materials Reliability
  • "Functionally Possible Path Delay Faults With High Functional Switching Activity," 2024, IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • "In-field test solution for enhancing safety in automotive applications," 2022, Microelectronics Reliability
  • "IEEE Transactions on Very Large Scale Integration (VLSI) Systems," 2020, IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • "Testing for Electromigration in Sub-5-nm FinFET Memories," 2024, IEEE Design and Test

Their frequent publication venues include:

  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • IEEE Transactions on Computational Social Systems
  • IEEE Design and Test
  • IEEE Transactions on Device and Materials Reliability
  • Microelectronics Reliability

Zorian has collaborated repeatedly with several authors, with co-author counts indicating significant professional partnerships. Frequent co-authors include:

  • David Lomet
  • Riccardo Mariani
  • Amara Amara
  • Manuel Delgado-Restituto
  • Yong Lian

Best Publications

  • Testing embedded-core-based system chips

    Y. Zorian;E.J. Marinissen;S. Dey

  • A distributed BIST control scheme for complex VLSI devices

    Y. Zorian

  • On-Line Testing for VLSI—A Compendium of Approaches

    M. Nicolaidis;Y. Zorian

  • Testing 3D chips containing through-silicon vias

    Erik Jan Marinissen;Yervant Zorian

  • Introducing core-based system design

    R.K. Gupta;Y. Zorian

  • Wrapper design for embedded core test

    E.J. Marinissen;S.K. Goel;M. Lousberg

  • 2001 technology roadmap for semiconductors

    A. Allan;D. Edenfeld;W.H. Joyner;A.B. Kahng

  • Test requirements for embedded core-based systems and IEEE P1500

    Y. Zorian

  • Towards a standard for embedded core test: an example

    E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor

  • Testing the interconnect of RAM-based FPGAs

    M. Renovell;J.M. Portal;J. Figueras;Y. Zorian

  • On IEEE P1500's Standard for Embedded Core Test

    Erik Jan Marinissen;Rohit Kapur;Maurice Lousberg;Teresa McLaurin

  • Test of RAM-based FPGA: methodology and application to the interconnect

    M. Renovell;J. Figueras;Y. Zorian

  • Challenges in Embedded Memory Design and Test

    Erik Jan Marinissen;Betty Prince;Doris Keitel-Schulz;Yervant Zorian

  • Overview of the IEEE P1500 standard

    F. DaSilva;Y. Zorian;L. Whetsel;K. Arabi

  • Principles of testing electronic systems

    Samiha Mourad;Yervant Zorian

  • 2003 technology roadmap for semiconductors

    D. Edenfeld;A.B. Kahng;M. Rodgers;Y. Zorian

  • On using IEEE P1500 SECT for test plug-n-play

    E.J. Marinissen;R. Kapur;Y. Zorian

  • Guest Editors' Introduction: Design for Yield and Reliability

    Y. Zorian;D. Gizopoulos;C. Vandenberg;P. Magarshack

  • Challenges in testing core-based system ICs

    E.J. Marinissen;Y. Zorian

  • Built-in self-test for digital integrated circuits

    Vishwani D. Agrawal;Chih-Jen Lin;Paul W. Rutkowski;Shianling Wu

  • TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING

    Gerald L. Engel;Deborah M. Cooper;Carl K. Chang;Michael R. Williams

  • An effective BIST scheme for ROM's

    Y. Zorian;A. Ivanov

  • PSBIST: A partial-scan based built-in self-test scheme

    C.-J. Lin;Y. Zorian;S. Bhawmik

  • Instruction-based self-testing of processor cores

    N. Kranitis;D. Gizopoulos;A. Paschalis;Y. Zorian

  • Test of future system-on-chips

    Yervant Zorian;Sujit Dey;Michael J. Rodgers

  • TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS

    Gerald L. Engel;Deborah M. Cooper;Carl K. Chang;Michael R. Williams

Frequent Co-Authors

Dimitris Gizopoulos
Dimitris Gizopoulos National and Kapodistrian University of Athens
Michel Renovell
Michel Renovell Montpellier Laboratory of Informatics, Robotics and Microelectronics
Sujit Dey
Sujit Dey University of California, San Diego
Michael Nicolaidis
Michael Nicolaidis TIMA Laboratory
Abhijit Chatterjee
Abhijit Chatterjee Georgia Institute of Technology
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette
Andrew B. Kahng
Andrew B. Kahng University of California, San Diego
Chih-Jen Lin
Chih-Jen Lin National Taiwan University
Lee D. Whetsel
Lee D. Whetsel Texas Instruments (United States)

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