Yervant Zorian mainly focuses on Embedded system, Reuse, Design for testing, System testing and Standardization. When carried out as part of a general Embedded system research project, his work on Application-specific integrated circuit and Very-large-scale integration is frequently linked to work in Interoperability, Scalability and SIGNAL, therefore connecting diverse disciplines of study. His research investigates the link between Application-specific integrated circuit and topics such as Logic synthesis that cross with problems in Systems design.
His study connects Automatic test pattern generation and Design for testing. His Built-in self-test research extends to System testing, which is thematically connected. Yervant Zorian conducted interdisciplinary study in his works that combined Built-in self-test and Iterative design.
His primary areas of investigation include Embedded system, Built-in self-test, Design for testing, Fault coverage and Parallel computing. His work on Application-specific integrated circuit and Very-large-scale integration as part of his general Embedded system study is frequently connected to Standardization and Reuse, thereby bridging the divide between different branches of science. His Built-in self-test research is multidisciplinary, incorporating elements of Algorithm and Computer engineering.
His Design for testing research focuses on System testing and how it relates to System on a chip. His Fault coverage study which covers Automatic test pattern generation that intersects with Testability. His Parallel computing research focuses on Static random-access memory and how it connects with Register file.
Yervant Zorian mainly investigates Embedded system, Fault coverage, System on a chip, Test strategy and Technology roadmap. Yervant Zorian interconnects Fault detection and isolation, Circuit under test and Logic testing in the investigation of issues within Embedded system. His work deals with themes such as Logic gate, Instruction set, Multi-core processor, Parallel computing and Fault indicator, which intersect with Fault coverage.
His Instruction set research integrates issues from Built-in self-test, Application-specific integrated circuit, Test code and Functional testing. His research in Parallel computing intersects with topics in System testing, Automatic test pattern generation and Accumulator. Yervant Zorian frequently studies issues relating to Design for testing and Software engineering.
Yervant Zorian focuses on Software engineering, Engineering management, Productivity, Register-transfer level and Manufacturing engineering. His Engineering management research spans across into subjects like Semiconductor industry, Public policy, Working group, Technology roadmap and Investment decisions. In his articles, Yervant Zorian combines various disciplines, including Semiconductor industry and International Technology Roadmap for Semiconductors.
His Productivity research encompasses a variety of disciplines, including Automatic testing, Power optimization, Design for testing and Design methods.
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Testing embedded-core-based system chips
Y. Zorian;E.J. Marinissen;S. Dey.
IEEE Computer (1999)
A distributed BIST control scheme for complex VLSI devices
vlsi test symposium (1993)
On-Line Testing for VLSI—A Compendium of Approaches
M. Nicolaidis;Y. Zorian.
Journal of Electronic Testing (1998)
Introducing core-based system design
R.K. Gupta;Y. Zorian.
IEEE Design & Test of Computers (1997)
2001 technology roadmap for semiconductors
A. Allan;D. Edenfeld;W.H. Joyner;A.B. Kahng.
IEEE Computer (2002)
Test requirements for embedded core-based systems and IEEE P1500
international test conference (1997)
Towards a standard for embedded core test: an example
E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor.
international test conference (1999)
Testing the interconnect of RAM-based FPGAs
M. Renovell;J.M. Portal;J. Figueras;Y. Zorian.
IEEE Design & Test of Computers (1998)
On IEEE P1500's Standard for Embedded Core Test
Erik Jan Marinissen;Rohit Kapur;Maurice Lousberg;Teresa McLaurin.
Journal of Electronic Testing (2002)
Test of RAM-based FPGA: methodology and application to the interconnect
M. Renovell;J. Figueras;Y. Zorian.
vlsi test symposium (1997)
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