World's Best Scientists 2026 revealed!
Toshiro Hiramoto

Toshiro Hiramoto

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
45
Citations
8425
World Ranking
3540
National Ranking
129

Toshiro Hiramoto publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Toshiro Hiramoto sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 591 publications — 90th percentile

90% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Toshiro Hiramoto D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Toshiro Hiramoto sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 45 D-Index — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Toshiro Hiramoto is affiliated with the University of Tokyo in Japan, with a primary focus on engineering, particularly in electrical and electronic engineering. Their research portfolio encompasses a broad range of topics within semiconductor materials and devices, with significant emphasis on advancements in semiconductor devices and circuit design, ferroelectric and negative capacitance devices, advanced memory and neural computing, nanowire synthesis and applications, silicon carbide semiconductor technologies, and MXene and MAX phase materials.

Their frequent publication venues highlight engagement with highly specialized journals and conferences, including:

  • Japanese Journal of Applied Physics
  • IEEE Transactions on Electron Devices
  • IEEE Journal of the Electron Devices Society
  • IEEE Silicon Nanoelectronics Workshop
  • Applied Physics Letters

Toshiro Hiramoto has been a contributor to various research papers over the years. Notable recent publications include:

  • Low-Voltage Operating Ferroelectric FET with Ultrathin IGZO Channel for High-Density Memory Application, 2020, IEEE Journal of the Electron Devices Society
  • A 3D Vertical-Channel Ferroelectric/Anti-Ferroelectric FET With Indium Oxide, 2022, IEEE Electron Device Letters
  • Mesoscopic-scale grain formation in HfO2-based ferroelectric thin films and its impact on electrical characteristics, 2022, Nano Convergence
  • Monolithic Integration of Oxide Semiconductor FET and Ferroelectric Capacitor Enabled by Sn-Doped InGaZnO for 3-D Embedded RAM Application, 2021, IEEE Transactions on Electron Devices
  • Reliability characteristics of metal/ferroelectric-HfO2/IGZO/metal capacitor for non-volatile memory application, 2020, Applied Physics Express

The scientist often collaborates with several co-authors across different studies. Frequent co-authors include:

  • Takuya Saraya
  • Masaharu Kobayashi
  • Kiyoshi Takeuchi
  • T. Mizutani
  • Fei Mo

Their work centers on engineering approaches that integrate various semiconductor and ferroelectric materials to develop devices for memory applications and advanced electronics. The range of publication venues and topics illustrates a focus on both the fundamental materials chemistry and applied device physics underlying modern semiconductor technology.

Best Publications

  • Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals

    Yi Shi;Yi Shi;Kenichi Saito;Hiroki Ishikuro;Toshiro Hiramoto

  • Quantum mechanical effects in the silicon quantum dot in a single-electron transistor

    Hiroki Ishikuro;Toshiro Hiramoto

  • Understanding Random Threshold Voltage Fluctuation by Comparing Multiple Fabs and Technologies

    K. Takeuchi;T. Fukai;T. Tsunomura;A.T. Putra

  • Coulomb blockade oscillations at room temperature in a Si quantum wire metal‐oxide‐semiconductor field‐effect transistor fabricated by anisotropic etching on a silicon‐on‐insulator substrate

    H. Ishikuro;T. Fujii;T. Saraya;G. Hashiguchi

  • Impact of drain induced barrier lowering on read scheme in silicon nanocrystal memory with two-bit-per-cell operation

    Sangsu Park;Sangsu Park;Hyunsik Im;Ilgweon Kim;Toshiro Hiramoto

  • Boosted gate MOS (BGMOS): device/circuit cooperation scheme to achieve leakage-free giga-scale integration

    T. Inukai;M. Takamiya;K. Nose;H. Kawaguchi

  • On device design for steep-slope negative-capacitance field-effect-transistor operating at sub-0.2V supply voltage with ferroelectric HfO2 thin film

    Masaharu Kobayashi;Toshiro Hiramoto

  • Low-Voltage Operating Ferroelectric FET with Ultrathin IGZO Channel for High-Density Memory Application

    Fei Mo;Yusaku Tagawa;Chengji Jin;MinJu Ahn

  • Negative Capacitance for Boosting Tunnel FET performance

    Masaharu Kobayashi;Kyungmin Jang;Nozomu Ueyama;Toshiro Hiramoto

  • Experimental evidence for quantum mechanical narrow channel effect in ultra-narrow MOSFET's

    H. Majima;H. Ishikuro;H. Ishikuro;T. Hiramoto

  • Phase coherence length of electron waves in narrow AlGaAs/GaAs quantum wires fabricated by focused ion beam implantation

    Toshiro Hiramoto;Kazuhiko Hirakawa;Yasuhiro Iye;Toshiaki Ikoma

  • Ferroelectric HfO 2 Tunnel Junction Memory With High TER and Multi-Level Operation Featuring Metal Replacement Process

    Masaharu Kobayashi;Yusaku Tagawa;Fei Mo;Takuya Saraya

  • Impact of Parameter Variations and Random Dopant Fluctuations on Short-Channel Fully Depleted SOI MOSFETs With Extremely Thin BOX

    T. Ohtou;N. Sugii;T. Hiramoto

  • Experimental study on polarization-limited operation speed of negative capacitance FET with ferroelectric HfO 2

    Masaharu Kobayashi;Nozomu Ueyama;Kyungmin Jang;Toshiro Hiramoto

  • Control of Coulomb blockade oscillations in silicon single electron transistors using silicon nanocrystal floating gates

    Nobuyoshi Takahashi;Hiroki Ishikuro;Toshiro Hiramoto

  • Experimental study on quantum confinement effects in silicon nanowire metal-oxide-semiconductor field-effect transistors and single-electron transistors

    Masaharu Kobayashi;Toshiro Hiramoto

  • On the origin of tunneling barriers in silicon single electron and single hole transistors

    Hiroki Ishikuro;Toshiro Hiramoto

  • Low Power and Low Voltage MOSFETs with Variable Threshold Voltage Controlled by Back-Bias

    Toshiro Hiramoto;Makoto Takamiya

  • Direct Measurement of Correlation Between SRAM Noise Margin and Individual Cell Transistor Variability by Using Device Matrix Array

    T. Hiramoto;M. Suzuki;X. Song;K. Shimizu

  • Extension of Coulomb blockade region by quantum confinement in the ultrasmall silicon dot in a single-hole transistor at room temperature

    Masumi Saitoh;Toshiro Hiramoto

  • VTCMOS characteristics and its optimum conditions predicted by a compact analytical model

    Hyunsik Im;T. Inukai;H. Gomyo;T. Hiramoto

Frequent Co-Authors

Hiroshi Toshiyoshi
Hiroshi Toshiyoshi University of Tokyo
Makoto Takamiya
Makoto Takamiya University of Tokyo
Takayasu Sakurai
Takayasu Sakurai University of Tokyo
Hiroshi Iwai
Hiroshi Iwai Tokyo Institute of Technology
Hyunsik Im
Hyunsik Im Dongguk University
Hiromichi Ohashi
Hiromichi Ohashi Tokyo Institute of Technology
Hiroyuki Fujita
Hiroyuki Fujita Tokyo City University
Hiroshi Kawaguchi
Hiroshi Kawaguchi University of Tokyo
Kazuhiko Hirakawa
Kazuhiko Hirakawa University of Tokyo
Shinichiro Kimura
Shinichiro Kimura Hitachi (Japan)

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