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Toru Tatsumi

Toru Tatsumi

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
30
Citations
3380
World Ranking
6838
National Ranking
296

Overview

Toru Tatsumi is affiliated with NEC (Japan) in Japan. The scientist's work is primarily situated within this institutional context.

There are no recent papers, frequent co-authors, or specific publication venues recorded for Toru Tatsumi. Likewise, there is no available data regarding book publications, main fields of study, subfields, or main topics of research.

No awards have been documented, and there is no indication that the scientist is deceased.

Best Publications

  • Ge growth on Si using atomic hydrogen as a surfactant

    Akira Sakai;Toru Tatsumi

  • Fluorinated amorphous carbon thin films grown by plasma enhanced chemical vapor deposition for low dielectric constant interlayer dielectrics

    Kazuhiko Endo;Toru Tatsumi

  • Si/Ge0.3Si0.7/Si heterojunction bipolar transistor made with Si molecular beam epitaxy

    Toru Tatsumi;Hiroyuki Hirayama;Naoaki Aizaki

  • Method for fabricating polycrystalline silicon having micro roughness on the surface

    Hirohito Watanabe;Toru Tatsumi

  • Plasma deposition of low-dielectric-constant fluorinated amorphous carbon

    Kazuhiko Endo;Keisuke Shinoda;Toru Tatsumi

  • A 0.1-/spl mu/m delta-doped MOSFET fabricated with post-low-energy implanting selective epitaxy

    K. Noda;T. Tatsumi;T. Uchida;K. Nakajima

  • Fluorinated amorphous carbon thin films grown by helicon plasma enhanced chemical vapor deposition for low dielectric constant interlayer dielectrics

    Kazuhiko Endo;Toru Tatsumi

  • Near‐band‐gap photoluminescence of Si1−xGex alloys grown on Si(100) by molecular beam epitaxy

    Koichi Terashima;Michio Tajima;Toru Tatsumi

  • Dual workfunction Ni-Silicide/HfSiON gate stacks by phase-controlled full-silicidation (PC-FUSI) technique for 45nm-node LSTP and LOP devices

    K. Takahashi;K. Manabe;T. Ikarashi;N. Ikarashi

  • Selective growth condition in disilane gas source silicon molecular beam epitaxy

    Hiroyuki Hirayama;Toru Tatsumi;Naoaki Aizaki

  • SEMICONDUCTOR DEVICE WITH CONTACT PLUG AND MANUFACTURING METHOD THEREOF

    Hada Hiromitsu;Mori Hidemitsu;Toru Tatsumi;Kasai Naoki

  • NV-SRAM: a nonvolatile SRAM with back-up ferroelectric capacitors

    T. Miwa;J. Yamada;H. Koike;H. Toyoshima

  • Semiconductor device having polycrystalline silicon layer with uneven surface defined by hemispherical or mushroom like shape silicon grain

    Hirohito Watanabe;Toru Tatsumi

  • Hemispherical Grained Silicon (HSG-Si) Formation on In-Situ Phosphorous Doped Amorphous-Si Using The Seeding Method

    H. Watanabe;T. Tatsumi;A. Sakai;S. Shishiguchi

  • Facet formation mechanism of silicon selective epitaxial layer by Si ultrahigh vacuum chemical vapor deposition

    Tohru Aoyama;Taeko Ikarashi;Keiko Miyanaga;Toru Tatsumi

  • Boron heavy doping for Si molecular beam epitaxy using a HBO2 source

    Toru Tatsumi;Hiroyuki Hirayama;Naoaki Aizaki

  • Advanced Techniques to Decrease Defect Density in Molecular Beam Epitaxial Silicon Films

    Toru Tatsumi;Naoaki Aizaki;Hideki Tsuya

  • Semiconductor device and production method therefor

    Kiyoshi Takeuchi;Koichi Terashima;Hitoshi Wakabayashi;Shigeharu Yamagami

  • Growth of strain-relaxed Ge films on Si(001) surfaces

    Akira Sakai;Toru Tatsumi;Keiko Aoyama

  • Metal Organic Atomic Layer Deposition of High-k Gate Dielectrics Using Plasma Oxidation

    Kazuhiko Endo;Toru Tatsumi

  • Reflection high energy electron diffraction and Auger electron spectroscopic study on B/Si(111) surfaces

    Hiroyuki Hirayama;Toru Tatsumi;Naoaki Aizaki

  • Selective epitaxial growth by UHV-CVD using Si2H6 and Cl2

    Toru Tatsumi;Ken-ichi Aketagawa;Masayuki Hiroi;Junro Sakai

  • Selective heteroepitaxial growth of Si1−xGex using gas source molecular beam epitaxy

    Hiroyuki Hirayama;Masayuki Hiroi;Kazuhisa Koyama;Toru Tatsumi

  • Defect-mediated island formation in Stranski-Krastanov growth of Ge on Si(001).

    Akira Sakai;Toru Tatsumi

  • Hydrogen passivation effect in Si molecular beam epitaxy

    Hiroyuki Hirayama;Toru Tatsumi

  • Crystallization of Amorphous Silicon with Clean Surfaces

    Akira Sakai;Haruhiko Ono;Koichi Ishida;Taeko Niino

  • Nitrogen doped fluorinated amorphous carbon thin films grown by plasma enhanced chemical vapor deposition for low dielectric constant interlayer dielectrics

    Kazuhiko Endo;Toru Tatsumi

  • Gas source Si-MBE

    Hiroyuki Hirayama;Masayuki Hiroi;Kazuhisa Koyama;Toru Tatsumi

Frequent Co-Authors

Masahiro Nomura
Masahiro Nomura University of Tokyo
Chenming Hu
Chenming Hu University of California, Berkeley
Yukinori Ochiai
Yukinori Ochiai NEC (Japan)
Atsushi Oshiyama
Atsushi Oshiyama Nagoya University
Seiji Samukawa
Seiji Samukawa Tohoku University

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