The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Tetsu Ohsuna sits on this spectrum.
This scientist: 189 publications — 27th percentile
27% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Tetsu Ohsuna sits on this spectrum.
This scientist: 51 D-Index — 24th percentile
24% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Tetsu Ohsuna is affiliated with Toyota Motor Corporation in Japan, focusing research primarily within the fields of Engineering, Materials Science, and Physics and Astronomy. Their work spans multiple subfields including Electrical and Electronic Engineering, Atomic and Molecular Physics and Optics, Materials Chemistry, Mechanics of Materials, and Surfaces, Coatings and Films.
The scientist's research covers several key topics, notably semiconductor materials and devices, metal and thin film mechanics, electron and X-ray spectroscopy techniques, surface and thin film phenomena, semiconductor materials and interfaces, silicon nanostructures and photoluminescence, and the electronic and structural properties of oxides.
Recent publications by Tetsu Ohsuna include:
Additional papers with coauthors connected to Tetsu Ohsuna include:
Frequent coauthors collaborating with Ohsuna include Keiichiro Oh-ishi, Nico Alexander Gaida, Takuya Sasaki, Zheng Liu, and Ken Niwa. These collaborations reflect interdisciplinary approaches within the domains of materials characterization, crystal growth, and electronic properties analysis.
Ohsuna's work is published in a range of journals, with recent venues featuring:
Overall, Tetsu Ohsuna's research integrates advanced microscopy techniques such as STEM-EELS and HAADF-STEM with materials synthesis and characterization to explore structural and electronic properties relevant to semiconductor and thin film technologies.
Shinae Jun;Sang Hoon Joo;Ryong Ryoo;Michal Kruk
Shinji Inagaki;Shiyou Guan;Yoshiaki Fukushima;Tetsu Ohsuna
Shinji Inagaki;Shiyou Guan;Tetsu Ohsuna;Osamu Terasaki
Shunai Che;Zheng Liu;Tetsu Ohsuna;Kazutami Sakamoto
M. W. Anderson;O. Terasaki;T. Ohsuna;A. Philippou
Mizue Kaneda;Toshikazu Tsubakiyama;Anna Carlsson;Yasuhiro Sakamoto
Kazuyuki Tohji;Takashi Goto;Hideyuki Takahashi;Yasushi Shinoda
M. W. Anderson;O. Terasaki;T. Ohsuna;P. J. O. Malley
Zheng Liu;Yasuhiro Sakamoto;Tetsu Ohsuna;Kenji Hiraga
Fabian Gramm;Christian Baerlocher;Lynne B. McCusker;Stewart J. Warrender
Chia Wen Wu;Tetsu Ohsuna;Makoto Kuwabara;Kazuyuki Kuroda
Haiying Jin;Zheng Liu;Tetsu Ohsuna;Osamu Terasaki
O. Terasaki;K. Yamazaki;J. M. Thomas;T. Ohsuna
Nobuhiro Ogihara;Tomomi Yasuda;Yoshihiro Kishida;Tetsu Ohsuna
T. Inoue;T. Ohsuna;L. Luo;X. D. Wu
Chia Wen Wu;Yusuke Yamauchi;Tetsu Ohsuna;Kazuyuki Kuroda
Zheng Liu;Osamu Terasaki;Tetsu Ohsuna;Kenji Hiraga
Atsushi Shimojima;Zheng Liu;Zheng Liu;Tetsu Ohsuna;Osamu Terasaki
Kenji Amiya;Tetsu Ohsuna;Akihisa Inoue
Tetsu Ohsuna;Zheng Liu;Shunai Che;Osamu Terasaki
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Kyoto University
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