World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
40
Citations
6798
World Ranking
12807
National Ranking
414

Best Publications

  • First direct observation of a nearly ideal graphene band structure.

    M. Sprinkle;D. Siegel;Y. Hu;J. Hicks

  • Chemistry and electronic properties of metal-organic semiconductor interfaces: Al, Ti, In, Sn, Ag, and Au on PTCDA.

    Y. Hirose;A. Kahn;V. Aristov;V. Aristov;P. Soukiassian;P. Soukiassian

  • Adsorbate-induced shifts of electronic surface states: Cs on the (100) faces of tungsten, molybdenum, and tantalum.

    P. Soukiassian;R. Riwan;J. Lecante;E. Wimmer

  • Chemistry, diffusion, and electronic properties of a metal/organic semiconductor contact: In/perylenetetracarboxylic dianhydride

    Y. Hirose;Antoine Kahn;V. Aristov;P. Soukiassian

  • Nanochemistry at the atomic scale revealed in hydrogen-induced semiconductor surface metallization.

    Vincent Derycke;Patrick G. Soukiassian;Fabrice Amy;Fabrice Amy;Yves J. Chabal;Yves J. Chabal

  • Direct Observation of a β-SiC(100)- c\(4×2\) Surface Reconstruction

    P. Soukiassian;F. Semond;L. Douillard;A. Mayne

  • Bonding at the K/Si(100) 2×1 interface: A surface extended x-ray-absorption fine-structure study

    T. Kendelewicz;P. Soukiassian;P. Soukiassian;R.S. List;J.C. Woicik

  • Atomic Structure of the beta -SiC(100)-(3 x 2) Surface.

    F Semond;P Soukiassian;A Mayne;G Dujardin

  • Highly Stable Si Atomic Line Formation on the {beta} -SiC(100) Surface

    P. Soukiassian;F. Semond;A. Mayne;G. Dujardin

  • Si-rich 6 H - and 4 H − SiC ( 0001 ) 3×3 surface oxidation and initial SiO 2 / S i C interface formation from 25 to 650 °C

    F. Amy;F. Amy;P. Soukiassian;P. Soukiassian;Y. K. Hwu;C. Brylinski

  • Soft-x-ray photoemission study of chemisorption and Fermi-level pinning at the Cs/GaAs(110) and K/GaAs(110) interfaces.

    T. Kendelewicz;P. Soukiassian;M. H. Bakshi;Z. Hurych

  • Electronic promoters and semiconductor oxidation: Alkali metals on Si(111) surfaces.

    A. Franciosi;P. Philip;S. Chang;A. Wall

  • SiO2‐Si interface formation by catalytic oxidation using alkali metals and removal of the catalyst species

    P. Soukiassian;T. M. Gentle;M. H. Bakshi;Z. Hurych

  • Alkali-metal-promoted oxidation of the Si(100)2×1 surface: Coverage dependence and nonlocality

    Starnberg Hi;Soukiassian P;Hurych Z

  • Multilayer epitaxial graphene grown on the ({ m SiC}\,\,000ar{1}) surface; structure and electronic properties

    M Sprinkle;J Hicks;A Tejeda;A Taleb-Ibrahimi

  • Electronic properties of alkali metal/silicon interfaces: A new picture

    P. Soukiassian;P. Soukiassian;M.H. Bakshi;Z. Hurych;T.M. Gentle

  • Graphene etching on SiC grains as a path to interstellar polycyclic aromatic hydrocarbons formation.

    P. Merino;M. Švec;J.I. Martinez;P. Jelinek

  • Atomic scale oxidation of a complex system: O2/alpha-SiC(0001)-( 3 x 3).

    Amy F;Enriquez H;Soukiassian P;Storino Pf

  • Temperature-Induced Semiconducting {ital c}(4 {times} 2) {Leftrightarrow} Metallic (2 {times} 1) Reversible Phase Transition on the {beta} -SiC(100) Surface

    V. Yu. Aristov;L. Douillard;O. Fauchoux;P. Soukiassian

  • Electronic evidence of asymmetry in the Si(111)(3)×(3)-Ag structure

    Iwao Matsuda;Harumo Morikawa;Canhua Liu;Satoru Ohuchi

Frequent Co-Authors

Vincent Derycke
Vincent Derycke University of Paris-Saclay
Guy Le Lay
Guy Le Lay Aix-Marseille University
Mathieu G. Silly
Mathieu G. Silly Centre national de la recherche scientifique, CNRS
Antoine Kahn
Antoine Kahn Princeton University
I. Lindau
I. Lindau Stanford University
W. E. Spicer
W. E. Spicer Stanford University
Yeukuang Hwu
Yeukuang Hwu Academia Sinica
Yves J. Chabal
Yves J. Chabal The University of Texas at Dallas
Claire Berger
Claire Berger Georgia Institute of Technology
Arthur J Freeman
Arthur J Freeman Northwestern University

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