Teh Y. Tan

Overview

Best Publications

• Point defects, diffusion processes, and swirl defect formation in silicon

  T. Y. Tan;U. Gösele

  635
  Citations

• Intrinsic gettering by oxide precipitate induced dislocations in Czochralski Si

  T. Y. Tan;E. E. Gardner;W. K. Tice

  605
  Citations

• Silicon nanowhiskers grown on 〈111〉Si substrates by molecular-beam epitaxy

  L. Schubert;P. Werner;N. D. Zakharov;G. Gerth

  446
  Citations

• A Model for the Silicon Wafer Bonding Process

  R. Stengl;T. Tan;U. Gösele

  430
  Citations

• Oxygen diffusion and thermal donor formation in silicon

  U. Gösele;T. Y. Tan

  358
  Citations

• A “smarter-cut” approach to low temperature silicon layer transfer

  Q.-Y. Tong;R. Scholz;U. Gösele;T.-H. Lee

  316
  Citations

• Oxygen precipitation and the generation of dislocations in silicon

  T. Y. Tan;W. K. Tice

  267
  Citations

• Ion-induced defects in semiconductors

  James W. Corbett;James P. Karins;Teh Y. Tan

  243
  Citations

• Carbon-induced undersaturation of silicon self-interstitials

  R. Scholz;U. Gösele;J.-Y. Huh;T. Y. Tan

  233
  Citations

• Mechanisms of doping‐enhanced superlattice disordering and of gallium self‐diffusion in GaAs

  T. Y. Tan;U. Gösele

  208
  Citations

• Point defects, diffusion mechanisms, and superlattice disordering in gallium arsenide-based materials

  T. Y. Tan;U. Gösele;S. Yu

  208
  Citations

• The contribution of vacancies to carbon out-diffusion in silicon

  R. F. Scholz;P. Werner;U. Gösele;T. Y. Tan

  198
  Citations

• Diffusion mechanism of zinc and beryllium in gallium arsenide

  S. Yu;T. Y. Tan;U. Gösele

  197
  Citations

• Order-Disorder Transition in Single-Crystal Silicon Induced by Pulsed uv Laser Irradiation

  Raphael Tsu;Rodney T. Hodgson;Teh Yu Tan;John E. Baglin

  191
  Citations

• Formation of epitaxial CoSi2 films on (001) silicon using Ti‐Co alloy and bimetal source materials

  S. L. Hsia;T. Y. Tan;P. Smith;G. E. McGuire

  164
  Citations

• Resistance and structural stabilities of epitaxial CoSi2 films on (001) Si substrates

  S. L. Hsia;T. Y. Tan;P. Smith;G. E. McGuire

  158
  Citations

• Low energy planes for tilt grain boundaries in gold

  P.J. Goodhew;T.Y. Tan;R.W. Balluffi

  151
  Citations

• Modeling of gettering of precipitated impurities from Si for carrier lifetime improvement in solar cell applications

  P. S. Plekhanov;R. Gafiteanu;U. M. Gösele;T. Y. Tan

  151
  Citations

• Atomic modelling of homogeneous nucleation of dislocations from condensation of point defects in silicon

  T. Y. Tan

  150
  Citations

• Oxidation‐enhanced or retarded diffusion and the growth or shrinkage of oxidation‐induced stacking faults in silicon

  T. Y. Tan;U. Gösele

  145
  Citations