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Materials Science

D-Index
64
Citations
10755
World Ranking
6018
National Ranking
1535

Research.com Recognitions

  • 1987 - Member of the National Academy of Sciences
  • 1986 - Member of the National Academy of Engineering For contributions to the conceptualization and fabrication of heterojunction semiconductor lasers.
  • 1972 - Fellow of American Physical Society (APS)

Overview

Morton B. Panish is affiliated with Nokia in the United States. Throughout their career, they have contributed to the development of semiconductor laser technology, particularly focusing on heterojunction semiconductor lasers.

The scientist has been recognized with several awards acknowledging their contributions to the field. These include being named a Fellow of the American Physical Society (APS) in 1972. In 1986, they were elected as a Member of the National Academy of Engineering for contributions to the conceptualization and fabrication of heterojunction semiconductor lasers. The following year, in 1987, they became a Member of the National Academy of Sciences.

Morton B. Panish's research has primarily been situated within the broader scope of semiconductor physics and optoelectronics, as evidenced by their work on heterojunction lasers, which play a significant role in optical communication technologies.

Best Publications

  • Low‐temperature photoluminescence from InGaAs/InP quantum wires and boxes

    H. Temkin;G. J. Dolan;M. B. Panish;S. N. G. Chu

  • Phase equilibria in ternary III–V systems

    M.B. Panish;M. Ilegems

  • Subpicosecond InP/InGaAs heterostructure bipolar transistors

    Y.-K. Chen;R.N. Nottenburg;M.B. Panish;R.A. Hamm

  • Temperature Dependence of the Energy Gap in GaAs and GaP

    Unknown

  • Refractive index of AlxGa1−xAs between 1.2 and 1.8 eV

    Unknown

  • Molecular Beam Epitaxy of GaAs and InP with Gas Sources for As and P

    Unknown

  • GaAs–AlxGa1−xAs Double Heterostructure Injection Lasers

    Unknown

  • Effects of two‐dimensional confinement on the optical properties of InGaAs/InP quantum wire structures

    D. Gershoni;H. Temkin;G. J. Dolan;J. Dunsmuir

  • Measurement of heterojunction band offsets by admittance spectroscopy: InP/Ga0.47In0.53As

    D. V. Lang;M. B. Panish;F. Capasso;J. Allam

  • InGaAs/InP long wavelength quantum well infrared photodetectors

    S. D. Gunapala;B. F. Levine;D. Ritter;R. Hamm

  • Kinetic surface roughening in molecular beam epitaxy of InP.

    M. A. Cotta;R. A. Hamm;T. W. Staley;S. N. G. Chu

  • Molecular-beam epitaxy

    Morton B. Panish

  • Gas source MBE of InP and GaxIn1−xPyAs1−y : Materials properties and heterostructure lasers

    M. B. Panish;H. Temkin;S. Sumski

  • Phase equilibria in III–V quaternary systems—application to Al-Ga-P-As

    M. Ilegems;M.B. Panish

  • Implant‐induced high‐resistivity regions in InP and InGaAs

    S. J. Pearton;C. R. Abernathy;M. B. Panish;R. A. Hamm

  • Gas-Source Molecular Beam Epitaxy

    Morton B. Panish;Henryk Temkin

  • High-resolution x-ray diffraction studies of InGaAs(P)/InP superlattices grown by gas-source molecular-beam epitaxy

    J. M. Vandenberg;R. A. Hamm;M. B. Panish;H. Temkin

  • Reflection noise in index-guided InGaAsP lasers

    H. Temkin;N. Olsson;J. Abeles;R. Logan

  • Control of lattice parameters and dislocations in the system Ga1−xAlxAs1−yPy/GaAs

    G.A. Rozgonyi;P.M. Petroff;M.B. Panish

  • Composition Dependence of the Ga1−xAlxAs Direct and Indirect Energy Gaps

    Unknown

  • Optical properties of very thin GaInAs(P)/InP quantum wells grown by gas source molecular beam epitaxy

    M. B. Panish;H. Temkin;R. A. Hamm;S. N. G. Chu

  • Ga-Al-As: Phase, thermodynamic and optical properties

    M.B Panish;S Sumski

  • GaInAs(P)/InP quantum well structures grown by gas source molecular beam epitaxy

    H. Temkin;M. B. Panish;P. M. Petroff;R. A. Hamm

  • Hot-electron InGaAs/InP heterostructure bipolar transistors with f/sub T/ of 110 GHz

    R.N. Nottenburg;Y.K. Chen;M.B. Panish;D.A. Humphrey

  • Critical layer thickness in strained Ga1−xInxAs/InP quantum wells

    H. Temkin;D. G. Gershoni;S. N. G. Chu;J. M. Vandenberg

  • Admittance spectroscopy measurement of band offsets in strained layers of InxGa1−xAs grown on InP

    R. E. Cavicchi;D. V. Lang;D. Gershoni;A. M. Sergent

Frequent Co-Authors

Henryk Temkin
Henryk Temkin Texas Tech University
Dan Ritter
Dan Ritter Technion – Israel Institute of Technology
Young-Kai Chen
Young-Kai Chen Princeton University
A. F. J. Levi
A. F. J. Levi University of Southern California
Alfred Y. Cho
Alfred Y. Cho Nokia (United States)
Federico Capasso
Federico Capasso Harvard University
Peter H. Beton
Peter H. Beton University of Nottingham
Marc Ilegems
Marc Ilegems École Polytechnique Fédérale de Lausanne
Igal Brener
Igal Brener Sandia National Laboratories

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Best Scientists Citing Morton B. Panish