2015 - Fellow, National Academy of Inventors
2008 - Fellow of the Materials Research Society
J. M. Poate mostly deals with Silicon, Ion implantation, Analytical chemistry, Crystallography and Annealing. His Silicon study improves the overall literature in Optoelectronics. His research on Ion implantation also deals with topics like
His Analytical chemistry research includes elements of Amorphous solid, Microstructure, Sputtering and Intermetallic. His Crystallography research incorporates elements of Molecular beam epitaxy, Epitaxy, Supersaturation, Molecular physics and Transmission electron microscopy. His Annealing study incorporates themes from Doping and Superlattice.
His main research concerns Silicon, Analytical chemistry, Ion implantation, Annealing and Amorphous solid. His Silicon research is multidisciplinary, relying on both Crystallography, Molecular physics, Doping and Epitaxy. In his research, Metallurgy is intimately related to Laser, which falls under the overarching field of Analytical chemistry.
His Ion implantation study also includes fields such as
The scientist’s investigation covers issues in Silicon, Annealing, Analytical chemistry, Ion implantation and Doping. J. M. Poate combines subjects such as Crystallography, Crystallographic defect, Molecular physics, Thermal diffusivity and Dopant with his study of Silicon. J. M. Poate works mostly in the field of Crystallography, limiting it down to topics relating to Condensed matter physics and, in certain cases, Microstructure.
His study in Annealing is interdisciplinary in nature, drawing from both Chemical physics, Amorphous silicon, Supersaturation, Transmission electron microscopy and Superlattice. The Analytical chemistry study combines topics in areas such as Amorphous solid, Getter, Decaborane, Metallurgy and Laser. His Ion implantation course of study focuses on Atomic physics and Ion beam.
J. M. Poate spends much of his time researching Silicon, Ion implantation, Annealing, Crystallography and Dopant. His Silicon study combines topics from a wide range of disciplines, such as Secondary ion mass spectrometry, Doping, Crystallographic defect, Thermal diffusivity and Analytical chemistry. His research integrates issues of Amorphous solid, Profilometer, Superlattice and Recrystallization in his study of Analytical chemistry.
The various areas that he examines in his Ion implantation study include Deep-level transient spectroscopy and Crystal. In his research on the topic of Annealing, Activation energy, Boron concentration and Radiochemistry is strongly related with Transmission electron microscopy. J. M. Poate has researched Crystallography in several fields, including Molecular physics, Condensed matter physics, Supersaturation and Electron beam processing.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Physical mechanisms of transient enhanced dopant diffusion in ion-implanted silicon
P. A. Stolk;H.-J. Gossmann;D. J. Eaglesham;D. C. Jacobson.
Journal of Applied Physics (1997)
Laser Annealing of Semiconductors
J. M. Poate;James W. Mayer.
(1982)
Implantation and transient B diffusion in Si: The source of the interstitials
D. J. Eaglesham;P. A. Stolk;H.‐J. Gossmann;J. M. Poate.
Applied Physics Letters (1994)
Melting temperature and explosive crystallization of amorphous silicon during pulsed laser irradiation
Michael O. Thompson;G. J. Galvin;J. W. Mayer;P. S. Peercy.
Physical Review Letters (1984)
Impurity enhancement of the 1.54‐μm Er3+ luminescence in silicon
J. Michel;J. L. Benton;R. F. Ferrante;D. C. Jacobson.
Journal of Applied Physics (1991)
Room‐temperature sharp line electroluminescence at λ=1.54 μm from an erbium‐doped, silicon light‐emitting diode
B. Zheng;J. Michel;F. Y. G. Ren;L. C. Kimerling.
Applied Physics Letters (1994)
Ion beams in silicon processing and characterization
E. Chason;S. T. Picraux;J. M. Poate;J. O. Borland.
Journal of Applied Physics (1997)
DENSITY OF AMORPHOUS SI
J. S. Custer;Michael O. Thompson;D. C. Jacobson;J. M. Poate.
Applied Physics Letters (1994)
Local structure of 1.54‐μm‐luminescence Er3+ implanted in Si
D. L. Adler;D. C. Jacobson;D. J. Eaglesham;M. A. Marcus.
Applied Physics Letters (1992)
''Sputtering'' of ice by MeV light ions
W. L. Brown;L. J. Lanzerotti;J. M. Poate;W. M. Augustyniak.
Physical Review Letters (1978)
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