The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Lionel C. Kimerling sits on this spectrum.
This scientist: 773 publications — 97th percentile
97% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Lionel C. Kimerling sits on this spectrum.
This scientist: 106 D-Index — 94th percentile
94% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Lionel C. Kimerling is affiliated with MIT in the United States and has contributed extensively to the fields of Engineering and Physics and Astronomy. Their research primarily focuses on Electrical and Electronic Engineering as well as Atomic and Molecular Physics, and Optics, with additional work in Artificial Intelligence, Materials Chemistry, and Biomedical Engineering.
The main topics covered in Kimerling's work include Photonic and Optical Devices, Semiconductor Lasers and Optical Devices, Advanced Fiber Laser Technologies, Neural Networks and Reservoir Computing, Optical Network Technologies, Advanced Fiber Optic Sensors, and Semiconductor Quantum Structures and Devices.
Frequent coauthors in Lionel C. Kimerling's research include:
Kimerling has published repeatedly in the following venues:
Recent papers authored or coauthored by Kimerling include:
Throughout their career, Lionel C. Kimerling has been recognized with fellowships including Fellow of the American Physical Society in 1987, noted for contributions to understanding electrical properties of defects in semiconductors. They were also named Fellow of the American Association for the Advancement of Science (AAAS) in 1992 and Fellow of the Materials Research Society in 2012.
Jurgen Michel;Jifeng Liu;Lionel C. Kimerling
J. S. Foresi;P. R. Villeneuve;J. Ferrera;E. R. Thoen
Jifeng Liu;Xiaochen Sun;Rodolfo Camacho-Aguilera;Lionel C. Kimerling
Lei Bi;Juejun Hu;Peng Jiang;Dong Hun Kim
Rodolfo E. Camacho-Aguilera;Yan Cai;Neil Patel;Jonathan T. Bessette
Peter Bermel;Chiyan Luo;Lirong Zeng;Lionel C. Kimerling
Hsin-Chiao Luan;Desmond R. Lim;Kevin K. Lee;Kevin M. Chen
Kevin K. Lee;Desmond R. Lim;Lionel C. Kimerling;Jangho Shin
B.E. Little;J.S. Foresi;G. Steinmeyer;E.R. Thoen
Jifeng Liu;Xiaochen Sun;Dong Pan;Xiaoxin Wang
G. L. Miller;D. V. Lang;L. C. Kimerling
Kevin K. Lee;Desmond R. Lim;Hsin-Chiao Luan;Anuradha Agarwal
Jifeng Liu;Mark Beals;Andrew Pomerene;Sarah Bernardis
J. Michel;J. L. Benton;R. F. Ferrante;D. C. Jacobson
Donghwan Ahn;Ching-yin Hong;Jifeng Liu;Wojciech Giziewicz
L.C. Kimerling
Yasuhiko Ishikawa;Kazumi Wada;Douglas D. Cannon;Jifeng Liu
B. Zheng;J. Michel;F. Y. G. Ren;L. C. Kimerling
Randolph Kirchain;Lionel Kimerling
L. Zeng;Y. Yi;C. Hong;J. Liu
Hongtao Lin;Zhengqian Luo;Zhengqian Luo;Tian Gu;Lionel C Kimerling
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