Jeffrey T. Glass is affiliated with Duke University in the United States and has contributed extensively to the fields of engineering, materials science, and chemistry. Their research interests encompass various subfields, including spectroscopy, materials chemistry, electronic, optical and magnetic materials, biomedical engineering, and electrical and electronic engineering.
The scientist's work concentrates on several main topics, notably mass spectrometry techniques and applications, supercapacitor materials and fabrication, advanced sensor and energy harvesting materials, ion-surface interactions and analysis, MXene and MAX phase materials, advancements in battery materials, and anodic oxide films and nanostructures.
Recent publications illustrate a strong focus on supercapacitor technology and materials innovation. Notable papers include:
Frequent co-authors collaborating with Jeffrey T. Glass include Charles B. Parker, Jason J. Amsden, Rafael Bento Serpa, Tanouir Aloui, and Justin Keogh.
The scientist has published multiple times in venues such as the International Journal of Mass Spectrometry, Journal of Energy Storage, Journal of the American Society for Mass Spectrometry, ECS Meeting Abstracts, and ACS Nano.
R. J. Nemanich;J. T. Glass;G. Lucovsky;R. E. Shroder
R. E. Shroder;R. J. Nemanich;J. T. Glass
Sheng Zhang;Peng Kang;Stephen M. Ubnoske;M. Kyle Brennaman
B. R. Stoner;G.-H. M. Ma;S. D. Wolter;J. T. Glass
B. R. Stoner;J. T. Glass
S. D. Wolter;B. R. Stoner;J. T. Glass;P. J. Ellis
Yihao Zhou;Kathleen Maleski;Babak Anasori;James O Thostenson
B. E. Williams;J. T. Glass
R. Messier;R. Roy;J.T. Glass;J.E. Butler
David L. Dreifus;Brian R. Stoner;Jeffrey T. Glass
H. S. Kong;J. T. Glass;R. F. Davis
R.F. Davis;Z. Sitar;B.E. Williams;H.S. Kong
K. Nishimura;K. Das;J. T. Glass
Hua-Shuang Kong;Jeffrey T. Glass;Robert F. Davis
W. Zhu;B.R. Stoner;B.E. Williams;J.T. Glass
T Tachibana;BE Williams;JT Glass
Qiwei Han;Yusong Bai;Jie Liu;Jie Liu;Ke-zhao Du
L. Bergman;M. T. McClure;J. T. Glass;Robert Nemanich
J.T. Glass;R. Messier;N. Fujimori
J. Liu;V. V. Zhirnov;G. J. Wojak;A. F. Myers
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