World's Best Scientists 2026 revealed!
Andrew L. Sternberg

Andrew L. Sternberg

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
31
Citations
3442
World Ranking
6638
National Ranking
2162

Andrew L. Sternberg publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Andrew L. Sternberg sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 111 publications — 5th percentile

5% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Andrew L. Sternberg D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Andrew L. Sternberg sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 31 D-Index — 6th percentile

6% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Best Publications

  • Charge Collection and Charge Sharing in a 130 nm CMOS Technology

    O.A. Amusan;A.F. Witulski;L.W. Massengill;B.L. Bhuva

  • Single-Event Burnout Mechanisms in SiC Power MOSFETs

    Arthur F. Witulski;Dennis R. Ball;Kenneth F. Galloway;Arto Javanainen

  • Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

    O.A. Amusan;L.W. Massengill;M.P. Baze;A.L. Sternberg

  • HBD layout isolation techniques for multiple node charge collection mitigation

    J.D. Black;A.L. Sternberg;M.L. Alles;A.F. Witulski

  • Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

    D. R. Ball;J. M. Hutson;A. Javanainen;J.-M. Lauenstein

  • Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing

    O.A. Amusan;L.W. Massengill;M.P. Baze;B.L. Bhuva

  • Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

    Y. Boulghassoul;L.W. Massengill;A.L. Sternberg;B.L. Bhuva

  • Proton radiation response mechanisms in bipolar analog circuits

    H.J. Barnaby;R.D. Schrimpf;A.L. Sternberg;V. Berthe

  • Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices

    A. F. Witulski;R. Arslanbekov;A. Raman;R. D. Schrimpf

  • Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

    R.L. Pease;A.L. Sternberg;Y. Boulghassoul;L.W. Massengill

  • Electron-Induced Single-Event Upsets in Static Random Access Memory

    M. P. King;R. A. Reed;R. A. Weller;M. H. Mendenhall

  • Effects of technology scaling on the SET sensitivity of RF CMOS Voltage-controlled oscillators

    Y. Boulghassoul;L.W. Massengill;A.L. Sternberg;B.L. Bhuva

  • Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis

    Y. Boulghassoul;L.W. Massengill;A.L. Sternberg;R.L. Pease

  • Total-dose and single-event effects in DC/DC converter control circuitry

    P.C. Adell;R.D. Schrimpf;W.T. Holman;J. Boch

  • Critical charge for single-event transients (SETs) in bipolar linear circuits

    R.L. Pease;A. Sternberg;L. Massengill;R. Schrimpf

  • Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs

    D. R. Ball;B. D. Sierawski;K. F. Galloway;R. A. Johnson

  • Spatial and temporal characteristics of energy deposition by protons and alpha particles in silicon

    A.S. Kobayashi;A.L. Sternberg;L.W. Massengill;R.D. Schrimpf

  • The role of parasitic elements in the single-event transient response of linear circuits

    A.L. Sternberg;L.W. Massengill;S. Buchner;R.L. Pease

  • Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

    S. Buchner;D. McMorrow;A. Sternberg;L. Massengill

  • Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs

    D. R. Ball;K. F. Galloway;R. A. Johnson;M. L. Alles

Frequent Co-Authors

Ronald D. Schrimpf
Ronald D. Schrimpf Vanderbilt University
Robert A. Reed
Robert A. Reed Vanderbilt University
Lloyd W. Massengill
Lloyd W. Massengill Vanderbilt University
M. L. Alles
M. L. Alles Vanderbilt University
Daniel M. Fleetwood
Daniel M. Fleetwood Vanderbilt University
Bharat L. Bhuva
Bharat L. Bhuva Vanderbilt University
Robert A. Weller
Robert A. Weller Woods Hole Oceanographic Institution
Dale McMorrow
Dale McMorrow United States Naval Research Laboratory
Arthur F. Witulski
Arthur F. Witulski Vanderbilt University
Kenneth F. Galloway
Kenneth F. Galloway Vanderbilt University

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Related Online Degrees & Career Pathways

For those interested in advancing their career in Electronics and Electrical Engineering, online degree options offer flexibility and accessibility. Many programs are designed specifically for working professionals, making accelerated learning possible without sacrificing job responsibilities. Exploring degree programs for working adults can help you find courses that fit your busy schedule.

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Competency-based education is another growing trend, allowing students to progress at their own pace by demonstrating mastery of key concepts. Reviewing the list of competency-based colleges can guide you toward programs that value real-world skills and practical knowledge in electrical and electronics fields.

For military spouses and dependents, finding flexible educational opportunities is essential. Many top online institutions cater to this community, providing tailored support and resources. Check out the online universities for military spouses to discover accessible degree options that accommodate unique lifestyles.

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