Andrew L. Sternberg

Best Publications

• Charge Collection and Charge Sharing in a 130 nm CMOS Technology

  O.A. Amusan;A.F. Witulski;L.W. Massengill;B.L. Bhuva

  493
  Citations

• Single-Event Burnout Mechanisms in SiC Power MOSFETs

  Arthur F. Witulski;Dennis R. Ball;Kenneth F. Galloway;Arto Javanainen

  163
  Citations

• Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

  O.A. Amusan;L.W. Massengill;M.P. Baze;A.L. Sternberg

  149
  Citations

• HBD layout isolation techniques for multiple node charge collection mitigation

  J.D. Black;A.L. Sternberg;M.L. Alles;A.F. Witulski

  139
  Citations

• Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

  D. R. Ball;J. M. Hutson;A. Javanainen;J.-M. Lauenstein

  121
  Citations

• Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing

  O.A. Amusan;L.W. Massengill;M.P. Baze;B.L. Bhuva

  104
  Citations

• Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

  Y. Boulghassoul;L.W. Massengill;A.L. Sternberg;B.L. Bhuva

  93
  Citations

• Proton radiation response mechanisms in bipolar analog circuits

  H.J. Barnaby;R.D. Schrimpf;A.L. Sternberg;V. Berthe

  92
  Citations

• Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices

  A. F. Witulski;R. Arslanbekov;A. Raman;R. D. Schrimpf

  90
  Citations

• Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

  R.L. Pease;A.L. Sternberg;Y. Boulghassoul;L.W. Massengill

  86
  Citations

• Electron-Induced Single-Event Upsets in Static Random Access Memory

  M. P. King;R. A. Reed;R. A. Weller;M. H. Mendenhall

  83
  Citations

• Effects of technology scaling on the SET sensitivity of RF CMOS Voltage-controlled oscillators

  Y. Boulghassoul;L.W. Massengill;A.L. Sternberg;B.L. Bhuva

  74
  Citations

• Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis

  Y. Boulghassoul;L.W. Massengill;A.L. Sternberg;R.L. Pease

  74
  Citations

• Total-dose and single-event effects in DC/DC converter control circuitry

  P.C. Adell;R.D. Schrimpf;W.T. Holman;J. Boch

  71
  Citations

• Critical charge for single-event transients (SETs) in bipolar linear circuits

  R.L. Pease;A. Sternberg;L. Massengill;R. Schrimpf

  68
  Citations

• Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs

  D. R. Ball;B. D. Sierawski;K. F. Galloway;R. A. Johnson

  61
  Citations

• Spatial and temporal characteristics of energy deposition by protons and alpha particles in silicon

  A.S. Kobayashi;A.L. Sternberg;L.W. Massengill;R.D. Schrimpf

  60
  Citations

• The role of parasitic elements in the single-event transient response of linear circuits

  A.L. Sternberg;L.W. Massengill;S. Buchner;R.L. Pease

  58
  Citations

• Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

  S. Buchner;D. McMorrow;A. Sternberg;L. Massengill

  57
  Citations

• Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs

  D. R. Ball;K. F. Galloway;R. A. Johnson;M. L. Alles

  53
  Citations