His main research concerns Optoelectronics, Ferroelectricity, Field-effect transistor, Electrical engineering and Transistor. Stefan Slesazeck combines subjects such as Thin film and Capacitor with his study of Ferroelectricity. His studies deal with areas such as Nanotechnology, Non-volatile memory, Coercivity, Threshold voltage and CMOS as well as Field-effect transistor.
His study in CMOS is interdisciplinary in nature, drawing from both Neuromorphic engineering, Electronic circuit and Vacancy defect. His work in the fields of Electrical engineering, such as Logic gate and Integrated injection logic, overlaps with other areas such as Tin. His Transistor study deals with Dram intersecting with Transient, Nanoelectronics, MOSFET and Capacitance.
Stefan Slesazeck focuses on Optoelectronics, Ferroelectricity, Transistor, Capacitor and Field-effect transistor. His Optoelectronics research is multidisciplinary, relying on both Electrical engineering, Voltage and Electrode. He has researched Ferroelectricity in several fields, including Non-volatile memory and Negative impedance converter.
His Transistor research incorporates themes from Electronic circuit, Neuromorphic engineering, Electronic engineering, Logic gate and Hafnium oxide. His work on Ferroelectric RAM as part of general Capacitor research is often related to Polarization, thus linking different fields of science. Field-effect transistor and Threshold voltage are commonly linked in his work.
Ferroelectricity, Transistor, Optoelectronics, Engineering physics and Non-volatile memory are his primary areas of study. The concepts of his Ferroelectricity study are interwoven with issues in Threshold voltage, Negative impedance converter, Hafnium oxide and Capacitor. His research in Transistor intersects with topics in Neuromorphic engineering and Electronic engineering, CMOS, Logic gate.
His study looks at the intersection of CMOS and topics like Coercivity with Memory array. His Optoelectronics research focuses on Metal gate and how it connects with Static random-access memory. His study looks at the relationship between Non-volatile memory and topics such as Reliability, which overlap with Charge and Degradation.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Physical Mechanisms behind the Field-Cycling Behavior of HfO2-Based Ferroelectric Capacitors
Milan Pešić;Franz Paul Gustav Fengler;Luca Larcher;Andrea Padovani.
Advanced Functional Materials (2016)
Reconfigurable Silicon Nanowire Transistors
André Heinzig;Stefan Slesazeck;Franz Kreupl;Thomas Mikolajick.
Nano Letters (2012)
A FeFET based super-low-power ultra-fast embedded NVM technology for 22nm FDSOI and beyond
S. Dunkel;M. Trentzsch;R. Richter;P. Moll.
international electron devices meeting (2017)
Unveiling the double-well energy landscape in a ferroelectric layer
Michael Hoffmann;Franz P. G. Fengler;Melanie Herzig;Terence Mittmann.
Nature (2019)
A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs
M. Trentzsch;S. Flachowsky;R. Richter;J. Paul.
international electron devices meeting (2016)
Direct Observation of Negative Capacitance in Polycrystalline Ferroelectric HfO2
Michael Hoffmann;Milan Pešić;Korok Chatterjee;Asif I. Khan.
Advanced Functional Materials (2016)
Ferroelectricity in HfO 2 enables nonvolatile data storage in 28 nm HKMG
J. Muller;E. Yurchuk;T. Schlosser;J. Paul.
symposium on vlsi technology (2012)
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors
Halid Mulaosmanovic;Johannes Ocker;Stefan Müller;Uwe Schroeder.
ACS Applied Materials & Interfaces (2017)
Ferroelectric hafnium oxide for ferroelectric random-access memories and ferroelectric field-effect transistors
Thomas Mikolajick;Stefan Slesazeck;Min Hyuk Park;Uwe Schroeder.
Mrs Bulletin (2018)
Novel ferroelectric FET based synapse for neuromorphic systems
H. Mulaosmanovic;J. Ocker;S. Muller;M. Noack.
symposium on vlsi technology (2017)
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