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Sourabh Khandelwal

Sourabh Khandelwal

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
33
Citations
5019
World Ranking
6015
National Ranking
171

Best Publications

  • Sustained Sub-60 mV/decade switching via the negative capacitance effect in MoS2 transistors

    Felicia A. Mcguire;Yuh-Chen Lin;Katherine Margaret Price;G. Bruce Rayner

  • Negative Capacitance in Short-Channel FinFETs Externally Connected to an Epitaxial Ferroelectric Capacitor

    Asif Islam Khan;Korok Chatterjee;Juan Pablo Duarte;Zhongyuan Lu

  • A Physics-Based Analytical Model for 2DEG Charge Density in AlGaN/GaN HEMT Devices

    S. Khandelwal;N. Goyal;T. A. Fjeldly

  • FinFET Modeling for IC Simulation and Design: Using the BSIM-CMG Standard

    Yogesh Singh Chauhan;Darsen Duane Lu;Vanugopalan Sriramkumar;Sourabh Khandelwal

  • Analytical Modeling of Surface-Potential and Intrinsic Charges in AlGaN/GaN HEMT Devices

    S. Khandelwal;Y. S. Chauhan;T. A. Fjeldly

  • Analysis and Compact Modeling of Negative Capacitance Transistor with High ON-Current and Negative Output Differential Resistance—Part I: Model Description

    Girish Pahwa;Tapas Dutta;Amit Agarwal;Sourabh Khandelwal

  • A physics based compact model of I–V and C–V characteristics in AlGaN/GaN HEMT devices

    Sourabh Khandelwal;T.A. Fjeldly

  • BSIM6: Analog and RF Compact Model for Bulk MOSFET

    Yogesh Singh Chauhan;Sriramkumar Venugopalan;Maria-Anna Chalkiadaki;Muhammed Ahosan Ul Karim

  • Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design

    Sourabh Khandelwal;Chandan Yadav;Shantanu Agnihotri;Yogesh Singh Chauhan

  • ASM GaN: Industry Standard Model for GaN RF and Power Devices—Part 1: DC, CV, and RF Model

    Sourabh Khandelwal;Yogesh Singh Chauhan;Tor A. Fjeldly;Sudip Ghosh

  • BSIM-IMG: A Compact Model for Ultrathin-Body SOI MOSFETs With Back-Gate Control

    S. Khandelwal;Y. S. Chauhan;D. D. Lu;S. Venugopalan

  • Compact Charge-Based Physical Models for Current and Capacitances in AlGaN/GaN HEMTs

    Fetene Mulugeta Yigletu;Sourabh Khandelwal;Tor A. Fjeldly;Benjamin Iniguez

  • Capacitance Modeling in Dual Field-Plate Power GaN HEMT for Accurate Switching Behavior

    Sheikh Aamir Ahsan;Sudip Ghosh;Khushboo Sharma;Avirup Dasgupta

  • Compact models of negative-capacitance FinFETs: Lumped and distributed charge models

    Juan P. Duarte;Sourabh Khandelwal;Asif I. Khan;Angada Sachid

  • ASM GaN: Industry Standard Model for GaN RF and Power Devices—Part-II: Modeling of Charge Trapping

    Sayed Ali Albahrani;Dhawal Mahajan;Jason Hodges;Yogesh Singh Chauhan

  • BSIM-CMG: Standard FinFET compact model for advanced circuit design

    Juan Pablo Duarte;Sourabh Khandelwal;Aditya Medury;Chenming Hu

  • Impact of Parasitic Capacitance and Ferroelectric Parameters on Negative Capacitance FinFET Characteristics

    Sourabh Khandelwal;Juan Pablo Duarte;Asif Islam Khan;Sayeef Salahuddin

  • Physics-Based Multi-Bias RF Large-Signal GaN HEMT Modeling and Parameter Extraction Flow

    Sheikh Aamir Ahsan;Sudip Ghosh;Sourabh Khandelwal;Yogesh Singh Chauhan

  • BSIM — Industry standard compact MOSFET models

    Yogesh Singh Chauhan;Sriram Venugopalan;Mohammed A. Karim;Sourabh Khandelwal

  • Ferroelectric Oscillators and Their Coupled Networks

    Zheng Wang;Sourabh Khandelwal;Asif Islam Khan

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