World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
31
Citations
5299
World Ranking
6489
National Ranking
79

Jurriaan Schmitz publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Jurriaan Schmitz sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 345 publications — 66th percentile

66% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Jurriaan Schmitz D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Jurriaan Schmitz sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 31 D-Index — 6th percentile

6% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Jurriaan Schmitz is affiliated with the University of Twente in the Netherlands and focuses on research primarily within the field of Engineering. Their work emphasizes Electrical and Electronic Engineering, with additional contributions in Atomic and Molecular Physics and Optics, Plant Science, Renewable Energy and Sustainability, and Biomedical Engineering.

The scientist's research topics prominently cover Silicon and Solar Cell Technologies and Chalcogenide Semiconductor Thin Films. Further areas of investigation include Integrated Circuits and Semiconductor Failure Analysis, Semiconductor Materials and Interfaces, Photovoltaic System Optimization Techniques, Semiconductor Materials and Devices, and Thin-Film Transistor Technologies.

Frequent coauthors collaborating with Jurriaan Schmitz include Mirjam Theelen, Pelin Yilmaz, Dennis Alveringh, Tom van den Berg, and Thomas L. Hackett.

Jurriaan Schmitz has published in several scientific venues, including multiple articles in Progress in Photovoltaics Research and Applications, Renewable and Sustainable Energy Reviews, IEEE Transactions on Electron Devices, Solar Energy Materials and Solar Cells, and IEEE Sensors Letters.

Among the recent papers authored or coauthored by Schmitz are:

  • Review of degradation and failure phenomena in photovoltaic modules, 2022, Renewable and Sustainable Energy Reviews
  • Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies, 2022, Progress in Photovoltaics Research and Applications
  • Potential induced degradation of CIGS PV systems: A literature review, 2021, Renewable and Sustainable Energy Reviews
  • On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination, 2020, IEEE Transactions on Electron Devices
  • In-depth analysis of potential-induced degradation in a commercial CIGS PV module, 2023, Progress in Photovoltaics Research and Applications

Best Publications

  • The Charge Plasma P-N Diode

    R.J.E. Hueting;B. Rajasekharan;C. Salm;J. Schmitz

  • Si-Ge CMOS semiconductor device

    Jurriaan Schmitz;Pierre H. Woerlee

  • Fabrication and Characterization of the Charge-Plasma Diode

    Bijoy Rajasekharan;Raymond J E Hueting;Cora Salm;Tom van Hemert

  • A silicon-based electrical source of surface plasmon polaritons.

    R.J. Walters;R.V.A. van Loon;I. Brunets;Jurriaan Schmitz

  • Electron, pion and multiparticle detection with a lead/scintillating-fiber calorimeter

    D. Acosta;S. Buontempo;L. Calôba;M. Caria

  • An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

    M.A. Chefdeville;P. Colas;Y. Giomataris;H. van der Graaf

  • The detection of single electrons by means of a Micromegas-covered MediPix2 pixel CMOS readout circuit

    M. Campbell;M. Chefdeville;P. Colas;A.P. Colijn

  • The readout of a GEM or Micromegas-equipped TPC by means of the Medipix2 CMOS sensor as direct anode

    P. Colas;A.P. Colijn;A. Fornaini;Y. Giomataris

  • Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

    H.P. Tuinhout;A.H. Montree;J. Schmitz;P.A. Stolk

  • Study of screen printed metallization for polysilicon based passivating contacts

    G.J.M. Janssen;L.J. Geerligs;J. Loffler;Y. Wu

  • Charge carrier transport and electroluminescence in atomic layer deposited poly-GaN/c-Si heterojunction diodes

    Gaurav Gupta;Sourish Banerjee;Satadal Dutta;Antonius A. I. Aarnink

  • Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells

    Maciej K. Stodolny;John Anker;Bart L.J. Geerligs;Gaby J.M. Janssen

  • The electrical conduction and dielectric strength of SU-8

    Joost Melai;Cora Salm;Sander Smits;Jan Visschers

  • Low temperature thin films for next-generation microelectronics (invited)

    Jurriaan Schmitz

  • Characterization of dielectric charging in RF MEMS capacitive switches

    R.W. Herfst;H.G.A. Huizing;P.G. Steeneken;J. Schmitz

  • Localizing particles showering in a Spaghetti Calorimeter

    D. Acosta;S. Buontempo;L. Calôba;M. Caria

  • RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics

    J. Schmitz;F.N. Cubaynes;R.J. Havens;R. de Kort

  • MOSFET Degradation Under RF Stress

    G.T. Sasse;F.G. Kuper;J. Schmitz

  • Time and voltage dependence of dielectric charging in RF MEMS capacitive switches

    R.W. Herfst;P.G. Steeneken;J. Schmitz

  • Method of manufacturing semiconductor device with field effect transistor

    Schmitz J;Woerlee P H;Montree A H

  • Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches

    R.W. Herfst;P.G. Steeneken;J. Schmitz;A.J.G. Mank

  • Adding functionality to microchips by wafer post-processing

    Jurriaan Schmitz

Frequent Co-Authors

Bene Poelsema
Bene Poelsema University of Twente
Albert Polman
Albert Polman Institute for Atomic and Molecular Physics
Lis K. Nanver
Lis K. Nanver University of Twente
Roberto Ferrari
Roberto Ferrari University of Ferrara
Fred Roozeboom
Fred Roozeboom University of Twente
Ruud E. I. Schropp
Ruud E. I. Schropp Jinan University
Bram Nauta
Bram Nauta University of Twente
David Esseni
David Esseni University of Udine

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