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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
31
Citations
5299
World Ranking
6490
National Ranking
79

Overview

Jurriaan Schmitz is affiliated with the University of Twente in the Netherlands and focuses on research primarily within the field of Engineering. Their work emphasizes Electrical and Electronic Engineering, with additional contributions in Atomic and Molecular Physics and Optics, Plant Science, Renewable Energy and Sustainability, and Biomedical Engineering.

The scientist's research topics prominently cover Silicon and Solar Cell Technologies and Chalcogenide Semiconductor Thin Films. Further areas of investigation include Integrated Circuits and Semiconductor Failure Analysis, Semiconductor Materials and Interfaces, Photovoltaic System Optimization Techniques, Semiconductor Materials and Devices, and Thin-Film Transistor Technologies.

Frequent coauthors collaborating with Jurriaan Schmitz include Mirjam Theelen, Pelin Yilmaz, Dennis Alveringh, Tom van den Berg, and Thomas L. Hackett.

Jurriaan Schmitz has published in several scientific venues, including multiple articles in Progress in Photovoltaics Research and Applications, Renewable and Sustainable Energy Reviews, IEEE Transactions on Electron Devices, Solar Energy Materials and Solar Cells, and IEEE Sensors Letters.

Among the recent papers authored or coauthored by Schmitz are:

  • Review of degradation and failure phenomena in photovoltaic modules, 2022, Renewable and Sustainable Energy Reviews
  • Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies, 2022, Progress in Photovoltaics Research and Applications
  • Potential induced degradation of CIGS PV systems: A literature review, 2021, Renewable and Sustainable Energy Reviews
  • On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination, 2020, IEEE Transactions on Electron Devices
  • In-depth analysis of potential-induced degradation in a commercial CIGS PV module, 2023, Progress in Photovoltaics Research and Applications

Best Publications

  • The Charge Plasma P-N Diode

    R.J.E. Hueting;B. Rajasekharan;C. Salm;J. Schmitz

  • Si-Ge CMOS semiconductor device

    Jurriaan Schmitz;Pierre H. Woerlee

  • Fabrication and Characterization of the Charge-Plasma Diode

    Bijoy Rajasekharan;Raymond J E Hueting;Cora Salm;Tom van Hemert

  • A silicon-based electrical source of surface plasmon polaritons.

    R.J. Walters;R.V.A. van Loon;I. Brunets;Jurriaan Schmitz

  • Electron, pion and multiparticle detection with a lead/scintillating-fiber calorimeter

    D. Acosta;S. Buontempo;L. Calôba;M. Caria

  • An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

    M.A. Chefdeville;P. Colas;Y. Giomataris;H. van der Graaf

  • The detection of single electrons by means of a Micromegas-covered MediPix2 pixel CMOS readout circuit

    M. Campbell;M. Chefdeville;P. Colas;A.P. Colijn

  • The readout of a GEM or Micromegas-equipped TPC by means of the Medipix2 CMOS sensor as direct anode

    P. Colas;A.P. Colijn;A. Fornaini;Y. Giomataris

  • Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

    H.P. Tuinhout;A.H. Montree;J. Schmitz;P.A. Stolk

  • Study of screen printed metallization for polysilicon based passivating contacts

    G.J.M. Janssen;L.J. Geerligs;J. Loffler;Y. Wu

  • Charge carrier transport and electroluminescence in atomic layer deposited poly-GaN/c-Si heterojunction diodes

    Gaurav Gupta;Sourish Banerjee;Satadal Dutta;Antonius A. I. Aarnink

  • Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells

    Maciej K. Stodolny;John Anker;Bart L.J. Geerligs;Gaby J.M. Janssen

  • The electrical conduction and dielectric strength of SU-8

    Joost Melai;Cora Salm;Sander Smits;Jan Visschers

  • Low temperature thin films for next-generation microelectronics (invited)

    Jurriaan Schmitz

  • Characterization of dielectric charging in RF MEMS capacitive switches

    R.W. Herfst;H.G.A. Huizing;P.G. Steeneken;J. Schmitz

  • Localizing particles showering in a Spaghetti Calorimeter

    D. Acosta;S. Buontempo;L. Calôba;M. Caria

  • RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics

    J. Schmitz;F.N. Cubaynes;R.J. Havens;R. de Kort

  • MOSFET Degradation Under RF Stress

    G.T. Sasse;F.G. Kuper;J. Schmitz

  • Time and voltage dependence of dielectric charging in RF MEMS capacitive switches

    R.W. Herfst;P.G. Steeneken;J. Schmitz

  • Method of manufacturing semiconductor device with field effect transistor

    Schmitz J;Woerlee P H;Montree A H

  • Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches

    R.W. Herfst;P.G. Steeneken;J. Schmitz;A.J.G. Mank

  • Adding functionality to microchips by wafer post-processing

    Jurriaan Schmitz

Frequent Co-Authors

Bene Poelsema
Bene Poelsema University of Twente
Albert Polman
Albert Polman Institute for Atomic and Molecular Physics
Fred Roozeboom
Fred Roozeboom University of Twente
Lis K. Nanver
Lis K. Nanver University of Twente
Ruud E. I. Schropp
Ruud E. I. Schropp Jinan University
Bram Nauta
Bram Nauta University of Twente
David Esseni
David Esseni University of Udine

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