World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
45
Citations
9481
World Ranking
11646
National Ranking
2719

Jim Ciston publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Jim Ciston sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 261 publications — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Jim Ciston D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Jim Ciston sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 45 D-Index — 10th percentile

10% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

Jim Ciston is affiliated with the Lawrence Berkeley National Laboratory in the United States. Their research primarily spans the field of Materials Science, with a focus on Materials Chemistry, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Structural Biology, and Radiation.

The scientist's work covers several main topics, including:

  • Graphene research and applications
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • Machine Learning in Materials Science
  • Advanced X-ray Imaging Techniques
  • Semiconductor materials and devices
  • Electronic and Structural Properties of Oxides

Recent publications by Jim Ciston include:

  • "Enhanced ferroelectricity in ultrathin films grown directly on silicon," 2020, Nature
  • "Ultrathin ferroic HfO2-ZrO2 superlattice gate stack for advanced transistors," 2022, Nature
  • "Reversible disorder-order transitions in atomic crystal nucleation," 2021, Science
  • "Dynamic Covalent Synthesis of Crystalline Porous Graphitic Frameworks," 2020, Chem
  • "Emergent ferroelectricity in subnanometer binary oxide films on silicon," 2022, Science

Jim Ciston collaborates frequently with several researchers, including:

  • Colin Ophus
  • Karen C. Bustillo
  • Madeline Van Winkle
  • D. Kwabena Bediako
  • Andrew M. Minor

The scientist's publications are often found in venues such as:

  • Microscopy and Microanalysis
  • Zenodo (CERN European Organization for Nuclear Research)
  • arXiv (Cornell University)
  • OPAL (Open@LaTrobe) (La Trobe University)
  • Nature

Best Publications

  • Electroreduction of carbon monoxide to liquid fuel on oxide-derived nanocrystalline copper

    Christina W. Li;Jim Ciston;Matthew W. Kanan

  • Enhanced ferroelectricity in ultrathin films grown directly on silicon.

    Suraj S. Cheema;Daewoong Kwon;Daewoong Kwon;Nirmaan Shanker;Roberto dos Reis

  • Facile transformation of imine covalent organic frameworks into ultrastable crystalline porous aromatic frameworks.

    Xinle Li;Changlin Zhang;Songliang Cai;Xiaohe Lei;Xiaohe Lei

  • Unravelling surface and interfacial structures of a metal–organic framework by transmission electron microscopy

    Yihan Zhu;Jim Ciston;Bin Zheng;Xiaohe Miao

  • Ultrathin ferroic HfO2–ZrO2 superlattice gate stack for advanced transistors

    Unknown

  • Atomic Resolution Imaging of Grain Boundary Defects in Monolayer Chemical Vapor Deposition-Grown Hexagonal Boron Nitride

    Ashley L. Gibb;Nasim Alem;Nasim Alem;Jian Hao Chen;Jian Hao Chen;Kristopher J. Erickson;Kristopher J. Erickson

  • Reversible disorder-order transitions in atomic crystal nucleation.

    Sungho Jeon;Taeyeong Heo;Sang Yeon Hwang;Jim Ciston

  • Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

    V. B. Ozdol;C. Gammer;C. Gammer;C. Gammer;X. G. Jin;P. Ercius

  • Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions.

    Colin Ophus;Jim Ciston;Chris T. Nelson

  • Emergent ferroelectricity in subnanometer binary oxide films on silicon

    Unknown

  • Strain fields in twisted bilayer graphene

    Nathanael P. Kazmierczak;Nathanael P. Kazmierczak;Madeline Van Winkle;Colin Ophus;Karen C. Bustillo

  • Dynamic Covalent Synthesis of Crystalline Porous Graphitic Frameworks

    Xinle Li;Hongxia Wang;Hao Chen;Qi Zheng

  • Subnanometer vacancy defects introduced on graphene by oxygen gas.

    Yasuhiro Yamada;Kazumasa Murota;Ryo Fujita;Jungpil Kim

  • Templated encapsulation of platinum-based catalysts promotes high-temperature stability to 1,100 °C

    Unknown

  • Step-Edge-Induced Oxide Growth During the Oxidation of Cu Surfaces

    Guangwen Zhou;Langli Luo;Liang Li;Jim Ciston

  • Interface lattice displacement measurement to 1 pm by geometric phase analysis on aberration-corrected HAADF STEM images

    Yuanyuan Zhu;Colin Ophus;Jim Ciston;Haiyan Wang

  • Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry

    Colin Ophus;Jim Ciston;Jordan Pierce;Tyler R. Harvey

  • 4D-STEM of Beam-Sensitive Materials.

    Karen C Bustillo;Steven E Zeltmann;Min Chen;Jennifer Donohue

  • Giant energy storage and power density negative capacitance superlattices.

    Unknown

  • Direct Observation of a Long-Lived Single-Atom Catalyst Chiseling Atomic Structures in Graphene

    Wei Li Wang;Elton J. G. Santos;Bin Jiang;Ekin Dogus Cubuk

  • In Situ Electrochemical Electron Microscopy Study of Oxygen Evolution Activity of Doped Manganite Perovskites

    Stephanie Raabe;Daniel Mierwaldt;Jim Ciston;Jim Ciston;Matthé Uijttewaal

  • Nature of the Metal-Insulator Transition in Few-Unit-Cell-Thick LaNiO 3 Films

    M. Golalikhani;Q. Lei;Ravini Chandrasena;L. Kasaei

  • Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

    Thomas C. Pekin;Christoph Gammer;Jim Ciston;Andrew M. Minor;Andrew M. Minor

  • Noncrystalline-to-Crystalline Transformations in Pt Nanoparticles

    Long Li;Lin Lin Wang;Duane D. Johnson;Duane D. Johnson;Zhongfan Zhang

  • py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets

    Benjamin H Savitzky;Lauren A Hughes;Steven E Zeltmann;Hamish G Brown

  • Strain fields in twisted bilayer graphene

    Nathanael P. Kazmierczak;Madeline Van Winkle;Colin Ophus;Karen C. Bustillo

Frequent Co-Authors

Colin Ophus
Colin Ophus Stanford University
Andrew M. Minor
Andrew M. Minor University of California, Berkeley
Peter Ercius
Peter Ercius Lawrence Berkeley National Laboratory
Alex Zettl
Alex Zettl University of California, Berkeley
Ramamoorthy Ramesh
Ramamoorthy Ramesh Rice University
Nasim Alem
Nasim Alem Pennsylvania State University
Charles S. Fadley
Charles S. Fadley University of California, Davis
Sayeef Salahuddin
Sayeef Salahuddin University of California, Berkeley
Laurence Marks
Laurence Marks Northwestern University
Eric A. Stach
Eric A. Stach University of Pennsylvania

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