The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Peter Ercius sits on this spectrum.
This scientist: 316 publications — 63rd percentile
63% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Peter Ercius sits on this spectrum.
This scientist: 58 D-Index — 41st percentile
41% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Peter Ercius is affiliated with the Lawrence Berkeley National Laboratory in the United States. Their work spans several fields of study, primarily focusing on materials science, physics and astronomy, and engineering. Within these broader disciplines, Ercius has contributed extensively to subfields including materials chemistry, structural biology, surfaces, coatings and films, atomic and molecular physics, and optics, as well as electrical and electronic engineering.
The research topics covered in Ercius's publications emphasize advanced microscopy and spectroscopy techniques. These include advanced electron microscopy techniques and applications, electron and X-ray spectroscopy techniques, advanced X-ray imaging techniques, materials characterization methods, 2D materials and their applications, force microscopy techniques, and catalytic processes in materials science.
Ercius has published numerous papers in a variety of scientific venues, with frequent contributions to:
Among their recent papers are:
Frequent collaborators in Ercius's research include:
The scope of Ercius's work demonstrates a multidisciplinary approach integrating advanced electron microscopy with materials science and physical chemistry. Their publication record indicates a sustained effort in pushing forward the understanding of atomic and molecular structures, as well as new imaging and characterization techniques applicable to nanomaterials and complex molecular systems.
Jong Min Yuk;Jong Min Yuk;Jong Min Yuk;Jungwon Park;Jungwon Park;Peter Ercius;Kwanpyo Kim;Kwanpyo Kim
M. C. Scott;Chien-Chun Chen;Matthew Mecklenburg;Chun Zhu
Hong Gang Liao;Danylo Zherebetskyy;Huolin L Xin;Cory Czarnik
Yao Yang;Jihan Zhou;Jihan Zhou;Fan Zhu;Yakun Yuan
Deli Wang;Yingchao Yu;Huolin L. Xin;Huolin L. Xin;Robert Hovden
Yongsoo Yang;Chien Chun Chen;Chien Chun Chen;M. C. Scott;M. C. Scott;Colin Ophus
Jihan Zhou;Yongsoo Yang;Yongsoo Yang;Yao Yang;Dennis S. Kim
Jianwei Miao;Peter Ercius;Simon J. L. Billinge;Simon J. L. Billinge
Jungwon Park;Jungwon Park;Hans Olof Elmlund;Peter Ercius;Jong Min Yuk;Jong Min Yuk
Rui Xu;Chien Chun Chen;Chien Chun Chen;Li Wu;M. C. Scott
Xingchen Ye;Chenhui Zhu;Peter Ercius;Shilpa N. Raja;Shilpa N. Raja
Mingyuan Ge;Yunhao Lu;Peter Ercius;Jiepeng Rong
Xingchen Ye;Matthew R. Jones;Layne B. Frechette;Qian Chen
Amin Azizi;Xiaolong Zou;Peter Ercius;Zhuhua Zhang
Sungho Jeon;Taeyeong Heo;Sang Yeon Hwang;Jim Ciston
V. B. Ozdol;C. Gammer;C. Gammer;C. Gammer;X. G. Jin;P. Ercius
Peter Ercius;Osama Alaidi;Matthew J. Rames;Gang Ren
Kedar Hippalgaonkar;Baoling Huang;Renkun Chen;Karma Sawyer
Jungwon Park;Hyesung Park;Peter Ercius;Adrian F. Pegoraro
Yasuhiro Yamada;Kazumasa Murota;Ryo Fujita;Jungpil Kim
Yao Yang;Jihan Zhou;Fan Zhu;Dillan Chang
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