European Solid-State Device Research Conference (ESSDERC)

This ranking presents a comprehensive evaluation of scientific conferences within the field of Engineering and Technology. The list has been meticulously assembled by Research.com, a leading resource in the domain of science research, renowned for providing trusted and authoritative data on scientific achievements across all major fields since 2014.

The position of each conference in the ranking is determined by a unique bibliometric score developed by Research.com. This score is calculated based on two principal criteria: the estimated h-index and the number of leading scientists who have participated in the conference over the past three years. This innovative combination of metrics ensures that the rankings reflect both citation impact and the concentration of distinguished contributors.

The Impact Score values presented were gathered as of 2024-11-27, ensuring the data reflects the most current and reliable metrics available. The ranking process itself involved the thorough examination of more than 2,262 conferences, selected following a detailed and rigorous review. This process included an exhaustive analysis of over 26,934 scientific documents published within the last three years, authored by a cohort of 9,385 leading and well-respected scientists specializing in Engineering and Technology.

For further insights into the calculation and selection criteria, a comprehensive explanation of the methodology can be found on our Methodology Page. This resource provides an in-depth overview of the analytical approach and criteria utilized to ensure the highest standards of accuracy and credibility in the conference ranking.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at European Solid-State Device Research Conference (based on the number of publications) are:

• Adrian M. Ionescu (10 papers) published 3 papers at the last edition, 4 less than at the previous edition,
• Gerard Ghibaudo (7 papers) published 1 paper at the last edition, 5 less than at the previous edition,
• Jean-Pierre Raskin (7 papers) published 3 papers at the last edition, 1 less than at the previous edition,
• Denis Flandre (6 papers) published 4 papers at the last edition, 2 more than at the previous edition,
• Bertrand Parvais (5 papers) published 3 papers at the last edition, 1 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at European Solid-State Device Research Conference (based on the number of publications) are:

• STMicroelectronics (24 papers) published 6 papers at the last edition, 12 less than at the previous edition,
• Katholieke Universiteit Leuven (20 papers) published 14 papers at the last edition, 8 more than at the previous edition,
• École Polytechnique Fédérale de Lausanne (16 papers) published 6 papers at the last edition, 4 less than at the previous edition,
• IBM (10 papers) published 3 papers at the last edition, 4 less than at the previous edition,
• Université catholique de Louvain (9 papers) published 4 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 3.80% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 43.42% were posted by at least one author from the top 10 institutions publishing at the conference. Another 13.16% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.79% of all publications and 27.63% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.