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Materials Science

D-Index
47
Citations
8502
World Ranking
11110
National Ranking
149

Overview

Yasin Ekinci is affiliated with the Paul Scherrer Institute in Switzerland and has a research focus that spans several interconnected fields within engineering and materials science. Their body of work primarily addresses advances in photolithography and nanofabrication techniques as well as the study of semiconductor materials and devices. The integration of spectroscopy methods for material analysis also forms a significant part of their research portfolio.

The major fields of study associated with Ekinci's research include:

  • Engineering
  • Materials Science

They further specialize in subfields such as:

  • Electrical and Electronic Engineering
  • Biomedical Engineering
  • Surfaces, Coatings and Films
  • Materials Chemistry
  • Radiation

The scientist's research topics illustrate a focus on technological and analytical advancements, including:

  • Advancements in Photolithography Techniques
  • Nanofabrication and Lithography Techniques
  • Integrated Circuits and Semiconductor Failure Analysis
  • Electron and X-Ray Spectroscopy Techniques
  • Semiconductor materials and devices
  • Advanced X-ray Imaging Techniques
  • Microfluidic and Bio-sensing Technologies

Yasin Ekinci has collaborated extensively with several coauthors, establishing recurring research partnerships with:

  • Dimitrios Kazazis
  • Michaela Vockenhuber
  • Iacopo Mochi
  • Guoqiang Yang
  • Yi Li

The research has been published repeatedly in specific scientific venues, highlighting the areas of micro/nanopatterning and applied materials research. Key publication venues include:

  • Journal of Micro/Nanopatterning Materials and Metrology
  • ACS Applied Materials & Interfaces
  • Nanoscale
  • ACS Applied Nano Materials
  • ACS Applied Polymer Materials

Among notable recent publications are:

  • "Extreme ultraviolet lithography," 2024, Nature Reviews Methods Primers
  • "Unravelling the effect of fluorinated ligands in hybrid EUV photoresists by X-ray spectroscopy," 2020, Journal of Materials Chemistry C
  • "Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography," 2020, Journal of Materials Chemistry C
  • "Universal direct patterning of colloidal quantum dots by (extreme) ultraviolet and electron beam lithography," 2020, Nanoscale
  • "The Extent of Platinum-Induced Hydrogen Spillover on Cerium Dioxide," 2022, ACS Nano

Best Publications

  • Catalyst support effects on hydrogen spillover

    Waiz Karim;Waiz Karim;Clelia Spreafico;Armin Kleibert;Jens Gobrecht

  • Plasmon resonances of aluminum nanoparticles and nanorods

    Y. Ekinci;H. H. Solak;Jörg F. Löffler

  • Symmetry Breaking in a Plasmonic Metamaterial at Optical Wavelength

    Andre Christ;Olivier J. F. Martin;Yasin Ekinci;Nikolai A. Gippius

  • Deep-UV surface-enhanced resonance Raman scattering of adenine on aluminum nanoparticle arrays.

    Shankar K. Jha;Zeeshan Ahmed;Mario Agio;Yasin Ekinci;Yasin Ekinci

  • Three-dimensional Si/Ge quantum dot crystals.

    Detlev Grützmacher;Thomas Fromherz;Christian Dais;Julian Stangl

  • Controlling the Fano interference in a plasmonic lattice

    A. Christ;Y. Ekinci;H. H. Solak;N. A. Gippius

  • Sub-10 nm patterning using EUV interference lithography.

    Birgit Päivänranta;Andreas Langner;Eugenie Kirk;Christian David

  • Bilayer Al wire-grids as broadband and high-performance polarizers

    Yasin Ekinci;Harun H. Solak;Christian David;Hans Sigg

  • Photolithographic properties of tin-oxo clusters using extreme ultraviolet light (13.5 nm)

    Brian Cardineau;Ryan Del Re;Miles Marnell;Hashim Al-Mashat

  • Beyond EUV lithography: a comparative study of efficient photoresists' performance.

    Nassir Mojarad;Jens Gobrecht;Yasin Ekinci

  • Nonlinear Superchiral Meta-Surfaces: Tuning Chirality and Disentangling Non-Reciprocity at the Nanoscale

    Vk K. Valev;Jj J. Baumberg;B. De Clercq;N. Braz

  • Interference lithography at EUV and soft X-ray wavelengths

    Nassir Mojarad;Jens Gobrecht;Yasin Ekinci

  • Single-digit-resolution nanopatterning with extreme ultraviolet light for the 2.5 nm technology node and beyond.

    N. Mojarad;M. Hojeij;L. Wang;J. Gobrecht

  • High Aspect Ratio Plasmonic Nanostructures for Sensing Applications

    Birgit Päivänranta;Hannes Merbold;Reto Giannini;Luca Büchi

  • Photon-beam lithography reaches 12.5nm half-pitch resolution

    Harun H. Solak;Yasin Ekinci;Philipp Käser;Sunggook Park

  • Dynamic absorption coefficients of chemically amplified resists and nonchemically amplified resists at extreme ultraviolet

    Roberto Fallica;Jason K. Stowers;Andrew Grenville;Andreas Frommhold

  • Engineering metal adhesion layers that do not deteriorate plasmon resonances.

    Thomas Siegfried;Yasin Ekinci;Olivier J. F. Martin;Hans Sigg

  • Fabrication of sub-10 nm gap arrays over large areas for plasmonic sensors

    Thomas Gerd Siegfried;Y. Ekinci;H. H. Solak;Olivier J. F. Martin

  • Gap plasmons and near-field enhancement in closely packed sub-10 nm gap resonators.

    Thomas Siegfried;Yasin Ekinci;Olivier J. F. Martin;Hans Sigg

  • Electric and magnetic resonances in arrays of coupled gold nanoparticle in-tandem pairs

    Y. Ekinci;A. Christ;M. Agio;O. J.F. Martin

  • Beyond EUV lithography: a comparative study of efficient photoresists'

    Jens Gobrecht;Yasin Ekinci

  • Engineering Metal Adhesion Layers That Do Not Deteriorate Plasmon

    Yasin Ekinci;Hans Sigg

Frequent Co-Authors

Harun H. Solak
Harun H. Solak Paul Scherrer Institute
Olivier J. F. Martin
Olivier J. F. Martin École Polytechnique Fédérale de Lausanne
Hans Sigg
Hans Sigg Paul Scherrer Institute
Xiaolong Wang
Xiaolong Wang University of California, San Diego
Christian David
Christian David Paul Scherrer Institute
Seiichi Tagawa
Seiichi Tagawa Osaka University
Ralph Spolenak
Ralph Spolenak ETH Zurich

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