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Computer Science

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Electronics and Electrical Engineering

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10189
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3830
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Research.com Recognitions

  • 1993 - IEEE Fellow For contributions to fault simulation and automatic test generation algorithms for VLSI circuits.

Overview

Miron Abramovici is affiliated with Broadcom in the United States. The professional focus is on areas related to fault simulation and automatic test generation algorithms for VLSI circuits, as highlighted by the recognition received in 1993 when Abramovici was named an IEEE Fellow for contributions to these fields.

Although there are no recent papers listed, no frequent co-authors, or frequent publication venues associated with the profile, the key academic and research contributions are centered on the development of methodologies for testing and verifying the reliability of complex integrated circuits.

The awarded IEEE Fellow status signals work that has been influential in the domain of VLSI testing, specifically targeting algorithms that improve fault simulation processes and facilitate the automatic creation of test patterns. These areas are crucial for ensuring that very-large-scale integration circuits operate correctly and reliably, thereby supporting advances in hardware design and manufacturing.

As no specific book publications, detailed research topics, or fields of study are enumerated beyond the award citation, the core identifiable expertise lies in testing and fault simulation techniques within electronic circuit design.

Best Publications

  • Digital Systems Testing and Testable Design

    Miron Abramovici;Melvin A. Breuer;Arthur D. Friedman

  • Critical Path Tracing: An Alternative to Fault Simulation

    Miron Abramovici;P. R. Menon;David T. Miller

  • A reconfigurable design-for-debug infrastructure for SoCs

    Miron Abramovici;Paul Bradley;Kumar Dwarakanath;Peter Levin

  • Built-in self-test of FPGA interconnect

    C. Stroud;S. Wijesuriya;C. Hamilton;M. Abramovici

  • Autonomous distributed programmable logic for monitoring and securing electronic systems

    Miron Abramovici;Paul Bradley;David J. Whelihan

  • Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)

    C. Stroud;S. Konala;Ping Chen;M. Abramovici

  • Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications

    M. Abramovici;C. Strond;C. Hamilton;S. Wijesuriya

  • Dynamic fault tolerance in FPGAs via partial reconfiguration

    J. Emmert;C. Stroud;B. Skaggs;M. Abramovici

  • Integrated circuit security: new threats and solutions

    Miron Abramovici;Paul Bradley

  • Virtual logic system for reconfigurable hardware

    Miron Abramovici

  • BIST-based test and diagnosis of FPGA logic blocks

    M. Abramovici;C.E. Stroud

  • Protection Against Hardware Trojan Attacks: Towards a Comprehensive Solution

    Swarup Bhunia;Miron Abramovici;Dakshi Agrawal;Paul Bradley

  • A Logic Simulation Machine

    M. Abramovici;Y.H. Levendel;P.R. Menon

  • Online Fault Tolerance for FPGA Logic Blocks

    J.M. Emmert;C.E. Stroud;M. Abramovici

  • BIST-based diagnostics of FPGA logic blocks

    C. Stroud;E. Lee;M. Abramovici

  • FIRE: a fault-independent combinational redundancy identification algorithm

    M.A. Iyer;M. Abramovici

  • BIST-Based Delay-Fault Testing in FPGAs

    Miron Abramovici;Charles E. Stroud

  • Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks

    Charles Stroud;Ping Chen;Srinivasa Konala;Miron Abramovici

  • Using ILA testing for BIST in FPGAs

    C. Stroud;E. Lee;S. Konala;M. Abramovici

  • Roving STARs: an integrated approach to on-line testing, diagnosis, and fault tolerance for FPGAs in adaptive computing systems

    M. Abramovici;J.M. Emmert;C.E. Stroud

  • BIST-based test and diagnosis of FPGA logic blocks : Reconfigurable and Adaptive VLSI Systems

    Miron Abramovici;Charles E. Stroud

Frequent Co-Authors

Charles E. Stroud
Charles E. Stroud Auburn University
Melvin A. Breuer
Melvin A. Breuer University of Southern California
Swarup Bhunia
Swarup Bhunia University of Florida
Valeria Bertacco
Valeria Bertacco University of Michigan–Ann Arbor
Dakshi Agrawal
Dakshi Agrawal IBM (United States)
Vishwani D. Agrawal
Vishwani D. Agrawal Auburn University
Alan J. Hu
Alan J. Hu University of British Columbia
Michael S. Hsiao
Michael S. Hsiao Virginia Tech

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