L.K.J. Vandamme

Best Publications

• EXPERIMENTAL STUDIES ON 1/F NOISE

  F N Hooge;T G M Kleinpenning;L K J Vandamme

  1516
  Citations

• General relation between refractive index and energy gap in semiconductors

  P.J.L. Herve;L.K.J. Vandamme

  978
  Citations

• Noise as a diagnostic tool for quality and reliability of electronic devices

  L.K.J. Vandamme

  786
  Citations

• 1/f noise in MOS devices, mobility or number fluctuations?

  L.K.J. Vandamme;Xiaosong Li;D. Rigaud

  518
  Citations

• Empirical temperature dependence of the refractive index of semiconductors

  P. J. L. Hervé;L. K. J. Vandamme

  375
  Citations

• Lattice scattering causes 1/ƒ noise

  Unknown

  293
  Citations

• Critical discussion on unified 1/f noise models for MOSFETs

  E.P. Vandamme;L.K.J. Vandamme

  233
  Citations

• 1/f noise in MODFETs at low drain bias

  J.-M. Peransin;P. Vignaud;D. Rigaud;L.K.J. Vandamme

  233
  Citations

• Model for 1/f; noise in MOS transistors biased in the linear region

  L.K.J. Vandamme

  108
  Citations

• Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

  S. Bychikhin;D. Pogany;L. K. J. Vandamme;G. Meneghesso

  102
  Citations

• Modeling random telegraph noise under switched bias conditions using cyclostationary RTS noise

  A.P. van der Wel;E.A.M. Klumperink;L.K.J. Vandamme;B. Nauta

  95
  Citations

• Bulk and surface 1/f noise

  L.K.J. Vandamme

  87
  Citations

• 1/f; noise model for MOSTs biased in nonohmic region

  L.K.J. Vandamme;H.M.M. de Werd

  83
  Citations

• Conductance noise investigations with four arbitrarily shaped and placed electrodes

  L. K. J. Vandamme;W. M. G. van Bokhoven

  82
  Citations

• Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

  N. Nenadovic;S. Mijalkovic;L.K. Nanver;L.K.J. Vandamme

  80
  Citations

• 1/f noise as a reliability estimation for solar cells

  L.K.J. Vandamme;R. Alabedra;M. Zommiti

  77
  Citations

• 1/f noise in pentacene and poly-thienylene vinylene thin film transistors

  L. K. J. Vandamme;R. Feyaerts;Gy. Trefán;C. Detcheverry

  75
  Citations

• Parameter extraction and 1/f noise in a surface and a bulk-type p-channel LDD MOSFET

  Xiaosong Li;C. Barros;E.P. Vandamme;L.K.J. Vandamme

  70
  Citations

• Impact of silicidation on the excess noise behaviour of MOS transistors

  E Vandamme;Lorenz Vandamme;Cor Claeys;Eddy Simoen

  70
  Citations

• 1/f noise in homogeneous and inhomogeneous media

  L.K.J. Vandamme;Gy. Trefán

  69
  Citations