L.K.J. Vandamme

L.K.J. Vandamme publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where L.K.J. Vandamme sits on this spectrum.

L.K.J. Vandamme D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where L.K.J. Vandamme sits on this spectrum.

Best Publications

• EXPERIMENTAL STUDIES ON 1/F NOISE

  F N Hooge;T G M Kleinpenning;L K J Vandamme

  1516
  Citations

• General relation between refractive index and energy gap in semiconductors

  P.J.L. Herve;L.K.J. Vandamme

  978
  Citations

• Noise as a diagnostic tool for quality and reliability of electronic devices

  L.K.J. Vandamme

  786
  Citations

• 1/f noise in MOS devices, mobility or number fluctuations?

  L.K.J. Vandamme;Xiaosong Li;D. Rigaud

  518
  Citations

• Empirical temperature dependence of the refractive index of semiconductors

  P. J. L. Hervé;L. K. J. Vandamme

  375
  Citations

• Lattice scattering causes 1/ƒ noise

  Unknown

  293
  Citations

• Critical discussion on unified 1/f noise models for MOSFETs

  E.P. Vandamme;L.K.J. Vandamme

  233
  Citations

• 1/f noise in MODFETs at low drain bias

  J.-M. Peransin;P. Vignaud;D. Rigaud;L.K.J. Vandamme

  233
  Citations

• Model for 1/f; noise in MOS transistors biased in the linear region

  L.K.J. Vandamme

  108
  Citations

• Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

  S. Bychikhin;D. Pogany;L. K. J. Vandamme;G. Meneghesso

  102
  Citations

• Modeling random telegraph noise under switched bias conditions using cyclostationary RTS noise

  A.P. van der Wel;E.A.M. Klumperink;L.K.J. Vandamme;B. Nauta

  95
  Citations

• Bulk and surface 1/f noise

  L.K.J. Vandamme

  87
  Citations

• 1/f; noise model for MOSTs biased in nonohmic region

  L.K.J. Vandamme;H.M.M. de Werd

  83
  Citations

• Conductance noise investigations with four arbitrarily shaped and placed electrodes

  L. K. J. Vandamme;W. M. G. van Bokhoven

  82
  Citations

• Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

  N. Nenadovic;S. Mijalkovic;L.K. Nanver;L.K.J. Vandamme

  80
  Citations

• 1/f noise as a reliability estimation for solar cells

  L.K.J. Vandamme;R. Alabedra;M. Zommiti

  77
  Citations

• 1/f noise in pentacene and poly-thienylene vinylene thin film transistors

  L. K. J. Vandamme;R. Feyaerts;Gy. Trefán;C. Detcheverry

  75
  Citations

• Parameter extraction and 1/f noise in a surface and a bulk-type p-channel LDD MOSFET

  Xiaosong Li;C. Barros;E.P. Vandamme;L.K.J. Vandamme

  70
  Citations

• Impact of silicidation on the excess noise behaviour of MOS transistors

  E Vandamme;Lorenz Vandamme;Cor Claeys;Eddy Simoen

  70
  Citations

• 1/f noise in homogeneous and inhomogeneous media

  L.K.J. Vandamme;Gy. Trefán

  69
  Citations