World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
33
Citations
7678
World Ranking
9327
National Ranking
176

Best Publications

  • EXPERIMENTAL STUDIES ON 1/F NOISE

    F N Hooge;T G M Kleinpenning;L K J Vandamme

  • General relation between refractive index and energy gap in semiconductors

    P.J.L. Herve;L.K.J. Vandamme

  • Noise as a diagnostic tool for quality and reliability of electronic devices

    L.K.J. Vandamme

  • 1/f noise in MOS devices, mobility or number fluctuations?

    L.K.J. Vandamme;Xiaosong Li;D. Rigaud

  • Empirical temperature dependence of the refractive index of semiconductors

    P. J. L. Hervé;L. K. J. Vandamme

  • Lattice scattering causes 1/ƒ noise

    Unknown

  • Critical discussion on unified 1/f noise models for MOSFETs

    E.P. Vandamme;L.K.J. Vandamme

  • 1/f noise in MODFETs at low drain bias

    J.-M. Peransin;P. Vignaud;D. Rigaud;L.K.J. Vandamme

  • Model for 1/f; noise in MOS transistors biased in the linear region

    L.K.J. Vandamme

  • Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

    S. Bychikhin;D. Pogany;L. K. J. Vandamme;G. Meneghesso

  • Modeling random telegraph noise under switched bias conditions using cyclostationary RTS noise

    A.P. van der Wel;E.A.M. Klumperink;L.K.J. Vandamme;B. Nauta

  • Bulk and surface 1/f noise

    L.K.J. Vandamme

  • 1/f; noise model for MOSTs biased in nonohmic region

    L.K.J. Vandamme;H.M.M. de Werd

  • Conductance noise investigations with four arbitrarily shaped and placed electrodes

    L. K. J. Vandamme;W. M. G. van Bokhoven

  • Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

    N. Nenadovic;S. Mijalkovic;L.K. Nanver;L.K.J. Vandamme

  • 1/f noise as a reliability estimation for solar cells

    L.K.J. Vandamme;R. Alabedra;M. Zommiti

  • 1/f noise in pentacene and poly-thienylene vinylene thin film transistors

    L. K. J. Vandamme;R. Feyaerts;Gy. Trefán;C. Detcheverry

  • Parameter extraction and 1/f noise in a surface and a bulk-type p-channel LDD MOSFET

    Xiaosong Li;C. Barros;E.P. Vandamme;L.K.J. Vandamme

  • Impact of silicidation on the excess noise behaviour of MOS transistors

    E Vandamme;Lorenz Vandamme;Cor Claeys;Eddy Simoen

  • 1/f noise in homogeneous and inhomogeneous media

    L.K.J. Vandamme;Gy. Trefán

Frequent Co-Authors

Dago M. de Leeuw
Dago M. de Leeuw Holst Centre (Netherlands)
Laszlo B. Kish
Laszlo B. Kish Texas A&M University
Gaudenzio Meneghesso
Gaudenzio Meneghesso University of Padua
Robert Vajtai
Robert Vajtai Rice University
Bram Nauta
Bram Nauta University of Twente
Lis K. Nanver
Lis K. Nanver University of Twente
Eva Olsson
Eva Olsson Chalmers University of Technology
Heinz Fissan
Heinz Fissan University of Duisburg-Essen
Enrico Zanoni
Enrico Zanoni University of Padua
Eric A.M. Klumperink
Eric A.M. Klumperink University of Twente

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