H-Index & Metrics Best Publications

H-Index & Metrics

Discipline name H-index Citations Publications World Ranking National Ranking
Electronics and Electrical Engineering D-index 42 Citations 8,517 146 World Ranking 1698 National Ranking 91

Research.com Recognitions

Awards & Achievements

2003 - IEEE Fellow For contributions to estimation and modeling of power dissipation in integrated circuits.

The Canadian Academy of Engineering

Overview

What is he best known for?

The fields of study he is best known for:

  • Integrated circuit
  • Electrical engineering
  • Statistics

Farid N. Najm spends much of his time researching Electronic engineering, Electronic circuit, Very-large-scale integration, CMOS and Integrated circuit. His research in Electronic engineering is mostly focused on Integrated circuit design. His Electronic circuit research is multidisciplinary, incorporating elements of Threshold voltage, Computer engineering, Logic gate and Low-power electronics.

His study looks at the intersection of Very-large-scale integration and topics like Algorithm with Upper and lower bounds. Farid N. Najm has researched Integrated circuit in several fields, including Node, High-level synthesis and Circuit design. As a member of one scientific family, Farid N. Najm mostly works in the field of Circuit reliability, focusing on Voltage and, on occasion, Power grid.

His most cited work include:

  • A survey of power estimation techniques in VLSI circuits (620 citations)
  • Transition density: a new measure of activity in digital circuits (385 citations)
  • A Monte Carlo approach for power estimation (319 citations)

What are the main themes of his work throughout his whole career to date?

His main research concerns Electronic engineering, Electronic circuit, Integrated circuit, Algorithm and Very-large-scale integration. His studies deal with areas such as Voltage drop and Voltage as well as Electronic engineering. His Electronic circuit research incorporates themes from Circuit switching, Logic gate and Low-power electronics.

His research investigates the connection with Integrated circuit and areas like Computer engineering which intersect with concerns in Interconnection. Farid N. Najm has included themes like Function, Gate count, Process and Static timing analysis in his Algorithm study. His Very-large-scale integration study incorporates themes from Probabilistic logic, Electronic design automation, Electromigration and Circuit reliability.

He most often published in these fields:

  • Electronic engineering (59.16%)
  • Electronic circuit (27.75%)
  • Integrated circuit (23.56%)

What were the highlights of his more recent work (between 2010-2021)?

  • Electronic engineering (59.16%)
  • Voltage drop (16.23%)
  • Integrated circuit (23.56%)

In recent papers he was focusing on the following fields of study:

His primary areas of investigation include Electronic engineering, Voltage drop, Integrated circuit, Electromigration and Voltage. His Electronic engineering research focuses on Robustness and how it relates to Computational complexity theory and Parameterized complexity. His work carried out in the field of Voltage drop brings together such families of science as Control theory, Power grid, Integrated circuit design, Threshold voltage and Transient.

His Integrated circuit research is multidisciplinary, incorporating perspectives in Node, Model order reduction and Parallel computing. His Electromigration study combines topics in areas such as Computer engineering, Very-large-scale integration, Signoff, Redundancy and Interconnection. His research integrates issues of Process and Circuit performance in his study of Voltage.

Between 2010 and 2021, his most popular works were:

  • Power Grid Electromigration Checking Using Physics-Based Models (39 citations)
  • Redundancy-aware electromigration checking for mesh power grids (33 citations)
  • Fast Vectorless Power Grid Verification Under an RLC Model (19 citations)

In his most recent research, the most cited papers focused on:

  • Integrated circuit
  • Electrical engineering
  • Statistics

Farid N. Najm focuses on Electronic engineering, Integrated circuit, Voltage, Electromigration and Voltage drop. His Electronic engineering study frequently intersects with other fields, such as Robustness. His study explores the link between Integrated circuit and topics such as Power grid that cross with problems in Electrical engineering, Circuit extraction, Constant power circuit, Equivalent circuit and Electrical load.

His biological study spans a wide range of topics, including Real-time computing, Static timing analysis and Sensitivity. His research on Electromigration also deals with topics like

  • Signoff that connect with fields like Speedup, Very-large-scale integration and Physical model,
  • Interconnection that intertwine with fields like Computer engineering and Redundancy. The study incorporates disciplines such as Control theory, Design flow, RLC circuit, Threshold voltage and Inductance in addition to Voltage drop.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

A survey of power estimation techniques in VLSI circuits

F.N. Najm.
IEEE Transactions on Very Large Scale Integration Systems (1994)

991 Citations

Transition density: a new measure of activity in digital circuits

F.N. Najm.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1993)

567 Citations

A Monte Carlo approach for power estimation

R. Burch;F.N. Najm;P. Yang;T.N. Trick.
IEEE Transactions on Very Large Scale Integration Systems (1993)

502 Citations

A gate-level leakage power reduction method for ultra-low-power CMOS circuits

J.P. Halter;F.N. Najm.
custom integrated circuits conference (1997)

387 Citations

A multigrid-like technique for power grid analysis

J.N. Kozhaya;S.R. Nassif;F.N. Najm.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)

326 Citations

Transition density, a stochastic measure of activity in digital circuits

Farid N. Najm.
design automation conference (1991)

323 Citations

Low-leakage asymmetric-cell SRAM

N. Azizi;F.N. Najm;A. Moshovos.
IEEE Transactions on Very Large Scale Integration Systems (2003)

261 Citations

Probabilistic simulation for reliability analysis of CMOS VLSI circuits

F.N. Najm;R. Burch;P. Yang;I.N. Hajj.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1990)

256 Citations

Power macromodeling for high level power estimation

Subodh Gupta;Farid N. Najm.
design automation conference (1997)

252 Citations

Statistical Estimation of the Switching Activity in Digital Circuitsy

Michael G. Xakellis;Farid N. Najm.
design automation conference (1994)

246 Citations

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