World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
48
Citations
10401
World Ranking
3047
National Ranking
137

Farid N. Najm publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Farid N. Najm sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 198 publications — 29th percentile

29% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Farid N. Najm D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Farid N. Najm sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 48 D-Index — 56th percentile

56% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2003 - IEEE Fellow For contributions to estimation and modeling of power dissipation in integrated circuits.
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering

Overview

Farid N. Najm is affiliated with the University of Toronto in Canada. Their research spans multiple interconnected fields including Engineering and Materials Science, with a particular focus on Electrical and Electronic Engineering as well as Electronic, Optical, and Magnetic Materials. The scientist's work also touches on subfields such as Atomic and Molecular Physics, Optics, and Mechanics of Materials.

The main topics covered by their research include:

  • Copper Interconnects and Reliability
  • Semiconductor materials and devices
  • Electronic Packaging and Soldering Technologies
  • Semiconductor materials and interfaces
  • Metal and Thin Film Mechanics

Farid N. Najm has contributed to research published in several prominent scientific journals. Frequent publication venues include:

  • Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Microelectronics Reliability

Notable recent papers authored or co-authored by Farid N. Najm are:

  • "Equivalent circuits for electromigration," 2021, Microelectronics Reliability
  • "Electromigration simulation and design considerations for integrated circuit power grids," 2020, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

Other relevant papers in the field of electromigration and power grid assessment, though authored by frequent collaborators, include:

  • "Novel physics-based tool-prototype for electromigration assessment in commercial-grade power delivery networks," 2020, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
  • "Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids," 2021, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "Novel Partitioning-Based Approach for Electromigration Assessment With Neural Networks," 2025, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

The scientist frequently collaborates with colleagues such as Valeriy Sukharev, Sofya Torosyan, Armen Kteyan, Jun-Ho Choy, and Yong Hyeon Yi.

Farid N. Najm has been recognized with awards including the IEEE Fellow distinction in 2003, granted for contributions to estimation and modeling of power dissipation in integrated circuits. The Canadian Academy of Engineering has also acknowledged their work.

Best Publications

  • A survey of power estimation techniques in VLSI circuits

    F.N. Najm

  • Transition density: a new measure of activity in digital circuits

    F.N. Najm

  • A Monte Carlo approach for power estimation

    R. Burch;F.N. Najm;P. Yang;T.N. Trick

  • A gate-level leakage power reduction method for ultra-low-power CMOS circuits

    J.P. Halter;F.N. Najm

  • A multigrid-like technique for power grid analysis

    J.N. Kozhaya;S.R. Nassif;F.N. Najm

  • Transition density, a stochastic measure of activity in digital circuits

    Farid N. Najm

  • Low-leakage asymmetric-cell SRAM

    N. Azizi;F.N. Najm;A. Moshovos

  • Power macromodeling for high level power estimation

    Subodh Gupta;Farid N. Najm

  • Probabilistic simulation for reliability analysis of CMOS VLSI circuits

    F.N. Najm;R. Burch;P. Yang;I.N. Hajj

  • Statistical Estimation of the Switching Activity in Digital Circuitsy

    Michael G. Xakellis;Farid N. Najm

  • Circuit Simulation

    Farid N. Najm

  • Towards a high-level power estimation capability

    Farid N. Najm

  • Active leakage power optimization for FPGAs

    J.H. Anderson;F.N. Najm

  • Active leakage power optimization for FPGAs

    Jason H. Anderson;Farid N. Najm;Tim Tuan

  • Towards a high-level power estimation capability [digital ICs]

    M. Nemani;F.N. Najm

  • Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution

    H. Kriplani;F.N. Najm;I.N. Hajj

  • Power modeling for high-level power estimation

    S. Gupta;F.N. Najm

  • High-level area and power estimation for VLSI circuits

    M. Nemani;F.N. Najm

  • Power estimation techniques for FPGAs

    J.H. Anderson;F.N. Najm

  • Low-leakage asymmetric-cell SRAM

    Navid Azizi;Andreas Moshovos;Farid N. Najm

  • Circuit Simulation: Najm/Circuit Simulation

    Unknown

  • Multigrid-like technique for power grid analysis

    Joseph N. Kozhaya;Sani R. Nassif;Farid N. Najm

Frequent Co-Authors

Ibrahim N. Hajj
Ibrahim N. Hajj University of Illinois at Urbana-Champaign
Andreas Moshovos
Andreas Moshovos University of Toronto
Sani R. Nassif
Sani R. Nassif Radyalis LLC
Anirudh Devgan
Anirudh Devgan Cadence Design Systems
Vivek De
Vivek De Intel (United States)
Muhammad M. Khellah
Muhammad M. Khellah Intel (United States)
Igor L. Markov
Igor L. Markov Synopsys (United States)
Sarma Vrudhula
Sarma Vrudhula Arizona State University
Luca Benini
Luca Benini ETH Zurich
Jiang Hu
Jiang Hu Texas A&M University

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