World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
48
Citations
10401
World Ranking
3047
National Ranking
137

Research.com Recognitions

  • 2003 - IEEE Fellow For contributions to estimation and modeling of power dissipation in integrated circuits.
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering
  • The Canadian Academy of Engineering

Overview

Farid N. Najm is affiliated with the University of Toronto in Canada. Their research spans multiple interconnected fields including Engineering and Materials Science, with a particular focus on Electrical and Electronic Engineering as well as Electronic, Optical, and Magnetic Materials. The scientist's work also touches on subfields such as Atomic and Molecular Physics, Optics, and Mechanics of Materials.

The main topics covered by their research include:

  • Copper Interconnects and Reliability
  • Semiconductor materials and devices
  • Electronic Packaging and Soldering Technologies
  • Semiconductor materials and interfaces
  • Metal and Thin Film Mechanics

Farid N. Najm has contributed to research published in several prominent scientific journals. Frequent publication venues include:

  • Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Microelectronics Reliability

Notable recent papers authored or co-authored by Farid N. Najm are:

  • "Equivalent circuits for electromigration," 2021, Microelectronics Reliability
  • "Electromigration simulation and design considerations for integrated circuit power grids," 2020, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

Other relevant papers in the field of electromigration and power grid assessment, though authored by frequent collaborators, include:

  • "Novel physics-based tool-prototype for electromigration assessment in commercial-grade power delivery networks," 2020, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
  • "Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids," 2021, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • "Novel Partitioning-Based Approach for Electromigration Assessment With Neural Networks," 2025, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

The scientist frequently collaborates with colleagues such as Valeriy Sukharev, Sofya Torosyan, Armen Kteyan, Jun-Ho Choy, and Yong Hyeon Yi.

Farid N. Najm has been recognized with awards including the IEEE Fellow distinction in 2003, granted for contributions to estimation and modeling of power dissipation in integrated circuits. The Canadian Academy of Engineering has also acknowledged their work.

Best Publications

  • A survey of power estimation techniques in VLSI circuits

    F.N. Najm

  • Transition density: a new measure of activity in digital circuits

    F.N. Najm

  • A Monte Carlo approach for power estimation

    R. Burch;F.N. Najm;P. Yang;T.N. Trick

  • A gate-level leakage power reduction method for ultra-low-power CMOS circuits

    J.P. Halter;F.N. Najm

  • A multigrid-like technique for power grid analysis

    J.N. Kozhaya;S.R. Nassif;F.N. Najm

  • Transition density, a stochastic measure of activity in digital circuits

    Farid N. Najm

  • Low-leakage asymmetric-cell SRAM

    N. Azizi;F.N. Najm;A. Moshovos

  • Power macromodeling for high level power estimation

    Subodh Gupta;Farid N. Najm

  • Probabilistic simulation for reliability analysis of CMOS VLSI circuits

    F.N. Najm;R. Burch;P. Yang;I.N. Hajj

  • Statistical Estimation of the Switching Activity in Digital Circuitsy

    Michael G. Xakellis;Farid N. Najm

  • Circuit Simulation

    Farid N. Najm

  • Towards a high-level power estimation capability

    Farid N. Najm

  • Active leakage power optimization for FPGAs

    J.H. Anderson;F.N. Najm

  • Active leakage power optimization for FPGAs

    Jason H. Anderson;Farid N. Najm;Tim Tuan

  • Towards a high-level power estimation capability [digital ICs]

    M. Nemani;F.N. Najm

  • Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution

    H. Kriplani;F.N. Najm;I.N. Hajj

  • Power modeling for high-level power estimation

    S. Gupta;F.N. Najm

  • High-level area and power estimation for VLSI circuits

    M. Nemani;F.N. Najm

  • Power estimation techniques for FPGAs

    J.H. Anderson;F.N. Najm

  • Low-leakage asymmetric-cell SRAM

    Navid Azizi;Andreas Moshovos;Farid N. Najm

  • Circuit Simulation: Najm/Circuit Simulation

    Unknown

  • Multigrid-like technique for power grid analysis

    Joseph N. Kozhaya;Sani R. Nassif;Farid N. Najm

Frequent Co-Authors

Sani R. Nassif
Sani R. Nassif Radyalis LLC
Vivek De
Vivek De Intel (United States)
Muhammad M. Khellah
Muhammad M. Khellah Intel (United States)
Petru Eles
Petru Eles Linköping University
David Z. Pan
David Z. Pan The University of Texas at Austin
David Blaauw
David Blaauw University of Michigan–Ann Arbor
Igor L. Markov
Igor L. Markov Synopsys (United States)
Sarma Vrudhula
Sarma Vrudhula Arizona State University
Luca Benini
Luca Benini ETH Zurich
Jiang Hu
Jiang Hu Texas A&M University

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