2003 - IEEE Fellow For contributions to estimation and modeling of power dissipation in integrated circuits.
The Canadian Academy of Engineering
Farid N. Najm spends much of his time researching Electronic engineering, Electronic circuit, Very-large-scale integration, CMOS and Integrated circuit. His research in Electronic engineering is mostly focused on Integrated circuit design. His Electronic circuit research is multidisciplinary, incorporating elements of Threshold voltage, Computer engineering, Logic gate and Low-power electronics.
His study looks at the intersection of Very-large-scale integration and topics like Algorithm with Upper and lower bounds. Farid N. Najm has researched Integrated circuit in several fields, including Node, High-level synthesis and Circuit design. As a member of one scientific family, Farid N. Najm mostly works in the field of Circuit reliability, focusing on Voltage and, on occasion, Power grid.
His main research concerns Electronic engineering, Electronic circuit, Integrated circuit, Algorithm and Very-large-scale integration. His studies deal with areas such as Voltage drop and Voltage as well as Electronic engineering. His Electronic circuit research incorporates themes from Circuit switching, Logic gate and Low-power electronics.
His research investigates the connection with Integrated circuit and areas like Computer engineering which intersect with concerns in Interconnection. Farid N. Najm has included themes like Function, Gate count, Process and Static timing analysis in his Algorithm study. His Very-large-scale integration study incorporates themes from Probabilistic logic, Electronic design automation, Electromigration and Circuit reliability.
His primary areas of investigation include Electronic engineering, Voltage drop, Integrated circuit, Electromigration and Voltage. His Electronic engineering research focuses on Robustness and how it relates to Computational complexity theory and Parameterized complexity. His work carried out in the field of Voltage drop brings together such families of science as Control theory, Power grid, Integrated circuit design, Threshold voltage and Transient.
His Integrated circuit research is multidisciplinary, incorporating perspectives in Node, Model order reduction and Parallel computing. His Electromigration study combines topics in areas such as Computer engineering, Very-large-scale integration, Signoff, Redundancy and Interconnection. His research integrates issues of Process and Circuit performance in his study of Voltage.
Farid N. Najm focuses on Electronic engineering, Integrated circuit, Voltage, Electromigration and Voltage drop. His Electronic engineering study frequently intersects with other fields, such as Robustness. His study explores the link between Integrated circuit and topics such as Power grid that cross with problems in Electrical engineering, Circuit extraction, Constant power circuit, Equivalent circuit and Electrical load.
His biological study spans a wide range of topics, including Real-time computing, Static timing analysis and Sensitivity. His research on Electromigration also deals with topics like
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
A survey of power estimation techniques in VLSI circuits
IEEE Transactions on Very Large Scale Integration Systems (1994)
Transition density: a new measure of activity in digital circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1993)
A Monte Carlo approach for power estimation
R. Burch;F.N. Najm;P. Yang;T.N. Trick.
IEEE Transactions on Very Large Scale Integration Systems (1993)
A gate-level leakage power reduction method for ultra-low-power CMOS circuits
J.P. Halter;F.N. Najm.
custom integrated circuits conference (1997)
A multigrid-like technique for power grid analysis
J.N. Kozhaya;S.R. Nassif;F.N. Najm.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)
Transition density, a stochastic measure of activity in digital circuits
Farid N. Najm.
design automation conference (1991)
Low-leakage asymmetric-cell SRAM
N. Azizi;F.N. Najm;A. Moshovos.
IEEE Transactions on Very Large Scale Integration Systems (2003)
Probabilistic simulation for reliability analysis of CMOS VLSI circuits
F.N. Najm;R. Burch;P. Yang;I.N. Hajj.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1990)
Power macromodeling for high level power estimation
Subodh Gupta;Farid N. Najm.
design automation conference (1997)
Statistical Estimation of the Switching Activity in Digital Circuitsy
Michael G. Xakellis;Farid N. Najm.
design automation conference (1994)
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