2008 - IEEE Fellow For contributions to semiconductor manufacturing processes
His primary areas of investigation include Electronic engineering, Integrated circuit design, Power grid, Integrated circuit and Voltage. His Electronic engineering study integrates concerns from other disciplines, such as Algorithm, Electrical engineering and Noise margin. He has included themes like Computer engineering and Chip in his Integrated circuit design study.
His Power grid research incorporates elements of Routing, Algorithm complexity, CAD, Power electronics and Range. His study in the field of RLC circuit also crosses realms of Multigrid method. Sani R. Nassif usually deals with CMOS and limits it to topics linked to Operating temperature and Low-power electronics.
His scientific interests lie mostly in Electronic engineering, Integrated circuit design, Integrated circuit, Electrical engineering and Voltage. His Electronic engineering study combines topics from a wide range of disciplines, such as Reliability, Process variation and Leakage. His research in Integrated circuit design intersects with topics in Physical design, Chip, Circuit extraction, Very-large-scale integration and Mathematical optimization.
His Integrated circuit research includes themes of Reliability engineering, Interconnection, Process variability and Sensitivity. His studies in Voltage integrate themes in fields like Power grid, Waveform and Logic gate. His work on Semiconductor device modeling as part of his general CMOS study is frequently connected to Scale, thereby bridging the divide between different branches of science.
The scientist’s investigation covers issues in Electronic engineering, Process variation, Reliability, Algorithm and Reliability engineering. He is interested in Static random-access memory, which is a branch of Electronic engineering. The study incorporates disciplines such as Technology CAD, Semiconductor device modeling and Noise margin in addition to Static random-access memory.
Sani R. Nassif focuses mostly in the field of Algorithm, narrowing it down to topics relating to Column and, in certain cases, Memory architecture, Reliability, Degradation and Key. Sani R. Nassif combines subjects such as Physical design, Circuit design, Circuit extraction, Very-large-scale integration and Reliability with his study of Reliability engineering. In the subject of general Electrical engineering, his work in Chip is often linked to Thermal, thereby combining diverse domains of study.
Sani R. Nassif focuses on Electronic engineering, Process variation, Static random-access memory, Data mining and Metric. Sani R. Nassif does research in Electronic engineering, focusing on Very-large-scale integration specifically. His Process variation study combines topics in areas such as Single event upset and Soft error.
His Static random-access memory research is multidisciplinary, incorporating perspectives in CMOS, Semiconductor device modeling, Transistor, Noise margin and Technology CAD. His Data mining study combines topics in areas such as Sampling, Importance sampling and Failure rate.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
High-performance CMOS variability in the 65-nm regime and beyond
K. Bernstein;D. J. Frank;A. E. Gattiker;W. Haensch.
Ibm Journal of Research and Development (2006)
Modeling and analysis of manufacturing variations
custom integrated circuits conference (2001)
Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events
Rouwaida Kanj;Rajiv Joshi;Sani Nassif.
design automation conference (2006)
Full chip leakage-estimation considering power supply and temperature variations
Haihua Su;Frank Liu;Anirudh Devgan;Emrah Acar.
international symposium on low power electronics and design (2003)
A multigrid-like technique for power grid analysis
J.N. Kozhaya;S.R. Nassif;F.N. Najm.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2002)
Delay variability: sources, impacts and trends
international solid-state circuits conference (2000)
Design for variability in DSM technologies [deep submicron technologies]
international symposium on quality electronic design (2000)
Design for Manufacturability and Statistical Design: A Constructive Approach
Michael Orshansky;Sani Nassif;Duane Boning.
Fast power grid simulation
Sani R. Nassif;Joseph N. Kozhaya.
design automation conference (2000)
Power grid analysis benchmarks
Sani R. Nassif.
asia and south pacific design automation conference (2008)
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