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Sani R. Nassif

Sani R. Nassif

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
53
Citations
10824
World Ranking
2411
National Ranking
932

Research.com Recognitions

  • 2008 - IEEE Fellow For contributions to semiconductor manufacturing processes

Overview

Sani R. Nassif is affiliated with Radyalis LLC in the United States. Their research profile includes contributions to semiconductor manufacturing processes, recognized by the IEEE Fellow award received in 2008.

Their recent scholarly work includes the publication titled Function Approximation Using Analog Building Blocks in Flexible Electronics published in 2025 through arXiv (Cornell University).

  • Function Approximation Using Analog Building Blocks in Flexible Electronics (2025, arXiv (Cornell University))

The scientist has collaborated frequently with the following coauthors:

  • Paula Carolina Lozano Duarte
  • A. Dubé
  • Georgios Zervakis
  • Mehdi B. Tahoori

The primary venue where Nassif has published is:

  • arXiv (Cornell University)

Best Publications

  • High-performance CMOS variability in the 65-nm regime and beyond

    K. Bernstein;D. J. Frank;A. E. Gattiker;W. Haensch

  • Modeling and analysis of manufacturing variations

    S.R. Nassif

  • Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events

    Rouwaida Kanj;Rajiv Joshi;Sani Nassif

  • Full chip leakage-estimation considering power supply and temperature variations

    Haihua Su;Frank Liu;Anirudh Devgan;Emrah Acar

  • A multigrid-like technique for power grid analysis

    J.N. Kozhaya;S.R. Nassif;F.N. Najm

  • Delay variability: sources, impacts and trends

    S. Nassif

  • Design for variability in DSM technologies [deep submicron technologies]

    S.R. Nassif

  • Design for Manufacturability and Statistical Design: A Constructive Approach

    Michael Orshansky;Sani Nassif;Duane Boning

  • Fast power grid simulation

    Sani R. Nassif;Joseph N. Kozhaya

  • Modeling and forecasting of manufacturing variations

    S.R. Nassif

  • Reliable on-chip systems in the nano-era: lessons learnt and future trends

    Jorg Henkel;Lars Bauer;Nikil Dutt;Puneet Gupta

  • Power grid analysis benchmarks

    Sani R. Nassif

  • Benefits and costs of power-gating technique

    Hailin Jiang;M. Marek-Sadowska;S.R. Nassif

  • A Linear-Centric Simulation Framework for Parametric Fluctuations

    E. Acar;L.T. Pileggi;S.R. Nassif

  • Random walks in a supply network

    Haifeng Qian;Sani R. Nassif;Sachin S. Sapatnekar

  • Power grid analysis using random walks

    Haifeng Qian;S.R. Nassif;S.S. Sapatnekar

  • Statistical analysis of SRAM cell stability

    Kanak Agarwal;Sani Nassif

  • FABRICS II: A Statistically Based IC Fabrication Process Simulator

    S.R. Nassif;A.J. Strojwas

  • Characterizing process variation in nanometer CMOS

    Kanak Agarwal;Sani Nassif

  • Impact of interconnect variations on the clock skew of a gigahertz microprocessort

    Ying Liu;Sani R. Nassif;Lawrence T. Pileggi;Andrzej J. Strojwas

  • Multigrid-like technique for power grid analysis

    Joseph N. Kozhaya;Sani R. Nassif;Farid N. Najm

Frequent Co-Authors

Sachin S. Sapatnekar
Sachin S. Sapatnekar University of Minnesota
Malgorzata Marek-Sadowska
Malgorzata Marek-Sadowska University of California, Santa Barbara
Dennis Sylvester
Dennis Sylvester University of Michigan–Ann Arbor
Mehdi B. Tahoori
Mehdi B. Tahoori Karlsruhe Institute of Technology
Farid N. Najm
Farid N. Najm University of Toronto
Yao-Wen Chang
Yao-Wen Chang National Taiwan University
Ulf Schlichtmann
Ulf Schlichtmann Technical University of Munich
Wilfried Haensch
Wilfried Haensch Argonne National Laboratory
Norbert Wehn
Norbert Wehn Technical University of Kaiserslautern
Larry Pileggi
Larry Pileggi Carnegie Mellon University

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