World's Best Scientists 2026 revealed!
IEEE

IEEE Electronic Components and Technology Conference (ECTC)

Location: Orlando, Florida , United States

Conference dates: 5/30/2023 - 6/2/2023

Research H-index
17

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 8 61 193 11
Electronics and Electrical Engineering 56 84 298 15
Engineering and Technology 17 30 97 11

Call for Papers

Highly rated abstracts are accepted for presentation at the ECTC conference. It is important
that authors identify the subcommittees whose topic areas best fit their abstracts. Abstracts
should include original and previously unpublished, non-confidential, and non-commercial
information on new developments, technology, and knowledge in the areas including, but not
limited to, those given below for each technical subcommittee.
Applied Reliability: Reliability of 2D, 2.5D, Si-bridge, 3D, chiplets, SiP, WLCSP, FOWLP,
FOPLP & heterogeneous integration; Interconnect reliability in micro-bump, micro-pillar, Cupillar, TSV, TGV, RDL, HDI, stacked-die, hybrid-bond, flip chip & wire bonded packages; Novel
reliability test methods, life models, FA techniques & materials characterization; Component
and board level reliability in computing, HPC, mobile, networking, automotive, power
electronics, harsh/hi-temp environments, IoT, sensors, AI, autonomous vehicles, medical,
wearable electronics, LEDs, displays & memory.
Assembly and Manufacturing Technology: Assembly and manufacturing challenges
for new markets; Die bonding methods and processes; embedded packaging and modules;
Wafer level process/materials technologies; Die and package singulation manufacturing;
New & next generation substrates; Smart factory/manufacturing; Design for Manufacturing;
Assembly related test/yield hardware development; Integrating advanced thermal solutions
in manufacturing: Design/performance, integrating solutions, thermal materials, low stress/
high thermal; Process advancements/yield enhancements: Cost of inspection, sampling,
metrology, new processes for fine RDL, small via fabrication, transfer/compression/injection
mold; Heterogeneous integration and process: chiplets, 3D stacking, bridge technology, large
body, warpage management; Shielding/protection technologies and manufacturing and market
requirements.
Emerging Technologies: Emerging, novel and unique packaging and material technologies
for: Soft and intelligent packaging; Flexible/stretchable hybrid electronics; Implantable biosensors
and bioelectronics; Bio-resorbable packaging; Extreme harsh environment; Nanomanufacturing;
Paper sensors/electronics pop-up/origami; MEMS & NEMS; Close-To-Motor high-voltage
power electronics; Packaging for wide band gap devices; Anti-tamper, cryptography; Additive
manufacturing; Packaging for quantum computing and electro-optical integration; Recyclable
and sustainable electronics packaging; AI, ML and computer vision for packaging; Point-of-care
diagnostic packaging; Space hardened packaging; Green and sustainable electronics; Net zero
strategy/technology.
Interconnections: Interconnection Technology and Processing: Hybrid/direct Cu bonding,
fan-out, panel-level, chiplets, SiP, flip-chip, 2.5D/3D, Si/glass/organic interposers, TSV, microbump, Cu pillar, wirebonding, thermo-compression bonding, fine-pitch/multi-layer RDL,
printable interconnects, flexible substrates, photonic interconnects, quantum interconnects;
Interconnection material, characterization and reliability; Conductive/non-conductive adhesives,
low temperature solder, underfill, molding compounds, thermal interface materials, thermal/
mechanical/electrical tests and reliability; Interconnection physical co-design and architectures
for emerging applications- HPC, mobile, 5G, IoT, power and rugged electronics, medical and
health, automotive, aerospace, flexible hybrid electronics, micro-LED display.
Materials & Processing: Wafer & panel level packaging materials; Materials for harsh
environments; Packaging substrates; Flexible, stretchable, & wearable electronics; Wafer bond/
debond materials; TSV; Emerging electronic materials & processes; Novel solder metallurgies;
Dielectrics and underfills; Molding compounds; Thermal interface materials; Advanced
wirebonding, conductive adhesives
Packaging Technologies: Architectures, chiplets, and applications for 2.5 & 3D, TSV &
interposer; Advanced flip-chip, SiP, CSP, PoP, MEMS, sensors & IoT; Automotive & power
electronics; bio, medical, flexible & wearable packaging; Embedded & advanced substrates; Fanout, wafer & panel level processes; Heterogeneous integration.
Photonics: Assembly and packaging for all applications that leverage photonics components
and circuits. Packaging of Photonics Integrated Circuits for telecom, datacom, and 5G; Copackaged and near-packaged optics; Heterogeneous integration; Artificial intelligence; quantum
systems such as processors, sensors, and networks; Medical devices; Automotive/LIDAR;
Aerospace, defense, and cryogenic/harsh environment; RF/MW photonics; Free-space optics;
AR/VR; WDM, and high power lasers; Micro-LEDs and 3D light-field displays; Imaging and
environmental sensors; New materials, connectors; EDA tools, and test methods/equipment.
RF, High-Speed Components & Systems: 5G/6G, IoT, cloud computing, autonomous
vehicles, AI/machine learning; Antennas, radars, sensors, power transfer, EM shielding, wired/
wireless communications, RF to THz; Electrical and multi-physics modeling, simulation and
characterization of interconnects, components, modules, and heterogeneous integration;
Signal/power integrity, and chip/package/board co-design.
Thermal/Mechanical Simulation & Characterization: Thermal/mechanical simulation
and characterization at component, board, and system levels for all packaging technologies:
Reliability-related modeling including fracture mechanics, fatigue, electromigration, warpage,
delamination, moisture, drop, shock and vibration, and modeling for harsh environments
(thermal, chemical, etc.); Material constitutive relations; Chip-package interaction for
heterogeneous integration, wafer fabrication and package assembly process related modeling;
Novel modeling techniques including multi-scale physics, co-design approaches; Quantum
computing; Measurement methodologies, characterization and correlations, model order
reduction, sensitivity analysis, optimization, statistical analysis; Application of artificial intelligence
on modeling, characterization, digital twin; Simulations for virtual release.
Interactive Presentations: Highly encouraged at ECTC, presenters and attendees often
communicate more efficiently here than in oral presentations. Abstracts can relate to any
electronics packaging topic. Interactive presentation session papers are published and archived
in equal merit with the other ECTC papers.
You are invited to submit an abstract between 250 and 750 words with 1 table (or figure)
that describes the novelty, scope, content, and key points of your proposed manuscript via the
website at www.ectc.net. Please start your abstract with a first paragraph of no more than
50 words to clearly highlight and summarize the novelty of your work.

Overview

The ranking presented on this page showcases a comprehensive evaluation of scientific conferences within the domain of Engineering and Technology. This authoritative list has been meticulously prepared by Research.com, a leading platform recognized for providing trusted and insightful data on scientific contributions across all major research fields, including Engineering and Technology, since 2014.

Each conference’s position in the ranking is determined using a unique bibliometric score devised by Research.com, which incorporates both the estimated h-index and the number of leading scientists who have participated in the conference over the previous three years. The Impact Score values included in this ranking were collected as of 2024-11-27, ensuring the most up-to-date and relevant assessment.

The rigorous ranking process involved a thorough examination of more than 2,262 conferences. These events were selected after a detailed and methodical review of over 26,934 scientific documents published in the last three years by 9,385 distinguished scientists within the field of Engineering and Technology. This depth of analysis underscores the commitment of our expert team to providing a credible and meaningful evaluation of research excellence.

For a comprehensive overview of the methodology underpinning the computation of ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Electronic Components and Technology Conference (based on the number of publications) are:

  • Rao Tummala (201 papers) published 17 papers at the last edition, 6 less than at the previous edition,
  • Venky Sundaram (118 papers) published 10 papers at the last edition, 5 less than at the previous edition,
  • C.P. Wong (107 papers) published 2 papers at the last edition, 2 less than at the previous edition,
  • Kyung-Wook Paik (106 papers) published 7 papers at the last edition, 1 more than at the previous edition,
  • Pradeep Lall (89 papers) published 7 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Electronic Components and Technology Conference (based on the number of publications) are:

  • Georgia Institute of Technology (660 papers) published 35 papers at the last edition the same number as at the previous edition,
  • IBM (371 papers) published 18 papers at the last edition, 5 less than at the previous edition,
  • Intel (219 papers) published 9 papers at the last edition, 3 less than at the previous edition,
  • KAIST (175 papers) published 11 papers at the last edition, 2 less than at the previous edition,
  • Fraunhofer Society (131 papers) published 8 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 9.31% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 38.74% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.26% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 20.53% of all publications and 30.46% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference