World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
55
Citations
25092
World Ranking
2131
National Ranking
838

Computer Science

D-Index
66
Citations
30213
World Ranking
2259
National Ranking
1128

Todd Austin publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Todd Austin sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 159 publications — 17th percentile

17% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Todd Austin D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Todd Austin sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 55 D-Index — 69th percentile

69% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2002 - Fellow of Alfred P. Sloan Foundation

Overview

Todd Austin is affiliated with the University of Michigan-Ann Arbor in the United States. Their research primarily focuses on the field of Computer Science, with a particular emphasis on Hardware and Architecture, Artificial Intelligence, Electrical and Electronic Engineering, Computer Vision and Pattern Recognition, and Software.

The scientist's work spans various topics within these fields, notably:

  • Parallel Computing and Optimization Techniques
  • Security and Verification in Computing
  • Embedded Systems Design Techniques
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Software Testing and Debugging Techniques
  • Ferroelectric and Negative Capacitance Devices
  • VLSI and Analog Circuit Testing

Todd Austin has published papers in several notable venues. These include:

  • Proceedings of the 59th ACM/IEEE Design Automation Conference
  • 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
  • ACM Journal on Emerging Technologies in Computing Systems
  • 2022 IEEE International Solid-State Circuits Conference (ISSCC)
  • arXiv (Cornell University)

Selected recent publications illustrate the scope of their research interests:

  • PriMax, 2022, Proceedings of the 59th ACM/IEEE Design Automation Conference
  • Software-driven Security Attacks: From Vulnerability Sources to Durable Hardware Defenses, 2021, ACM Journal on Emerging Technologies in Computing Systems
  • Twine: A Chisel Extension for Component-Level Heterogeneous Design, 2022, 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
  • F6: Computer Systems Under Attack - Paying the Performance Price for Protection, 2022, 2022 IEEE International Solid-State Circuits Conference (ISSCC)
  • ADA, the Center for Applications Driving Architectures: accomplishments and vision forward, 2022, Proceedings of the 59th ACM/IEEE Design Automation Conference

Frequent collaborators include Valeria Bertacco and Sharad Malik, with whom Todd Austin has co-authored multiple publications, as well as Nicholas Wendt, Shibo Chen, and Yonathan Fisseha.

In recognition of their work, Todd Austin was awarded the title of Fellow of the Alfred P. Sloan Foundation in 2002.

Best Publications

  • The SimpleScalar tool set, version 2.0

    Doug Burger;Todd M. Austin

  • MiBench: A free, commercially representative embedded benchmark suite

    M.R. Guthaus;J.S. Ringenberg;D. Ernst;T.M. Austin

  • SimpleScalar: an infrastructure for computer system modeling

    T. Austin;E. Larson;D. Ernst

  • Razor: a low-power pipeline based on circuit-level timing speculation

    Dan Ernst;Nam Sung Kim;Shidhartha Das;Sanjay Pant

  • Leakage current: Moore's law meets static power

    N.S. Kim;T. Austin;D. Baauw;T. Mudge

  • A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor

    Shubhendu S. Mukherjee;Christopher Weaver;Joel Emer;Steven K. Reinhardt

  • DIVA: a reliable substrate for deep submicron microarchitecture design

    Todd M. Austin

  • Evaluating future microprocessors : The SimpleScalar tool set

    Doug Burger;Todd M. Austin;Steve Bennett

  • DIVA: a reliable substrate for deep submicron microarchitecture design

    Unknown

  • Efficient detection of all pointer and array access errors

    Todd M. Austin;Scott E. Breach;Gurindar S. Sohi

  • A self-tuning DVS processor using delay-error detection and correction

    S. Das;D. Roberts;Seokwoo Lee;S. Pant

  • Razor: circuit-level correction of timing errors for low-power operation

    D. Ernst;S. Das;S. Lee;D. Blaauw

  • Cache-conscious data placement

    Brad Calder;Chandra Krintz;Simmi John;Todd Austin

  • A2: Analog Malicious Hardware

    Kaiyuan Yang;Matthew Hicks;Qing Dong;Todd Austin

  • A 2.60pJ/Inst Subthreshold Sensor Processor for Optimal Energy Efficiency

    Bo Zhai;L. Nazhandali;J. Olson;A. Reeves

  • Dynamic dependency analysis of ordinary programs

    Todd M. Austin;Gurindar S. Sohi

  • BulletProof: a defect-tolerant CMP switch architecture

    K. Constantinides;S. Plaza;J. Blome;B. Zhang

  • Reliable Systems on Unreliable Fabrics

    T. Austin;V. Bertacco;S. Mahlke;Yu Cao

  • Energy-Efficient Subthreshold Processor Design

    Bo Zhai;S. Pant;L. Nazhandali;S. Hanson

  • CryptoManiac: a fast flexible architecture for secure communication

    Lisa Wu;Chris Weaver;Todd Austin

  • Making typical silicon matter with Razor

    T. Austin;D. Blaauw;T. Mudge;K. Flautner

Frequent Co-Authors

Valeria Bertacco
Valeria Bertacco University of Michigan–Ann Arbor
Trevor Mudge
Trevor Mudge University of Michigan–Ann Arbor
David Blaauw
David Blaauw University of Michigan–Ann Arbor
Krisztian Flautner
Krisztian Flautner University of Michigan–Ann Arbor
Brad Calder
Brad Calder Google (United States)
Dennis Sylvester
Dennis Sylvester University of Michigan–Ann Arbor
Gurindar S. Sohi
Gurindar S. Sohi University of Wisconsin–Madison
Glenn Reinman
Glenn Reinman University of California, Los Angeles
Scott Mahlke
Scott Mahlke University of Michigan–Ann Arbor
Nam Sung Kim
Nam Sung Kim University of Illinois at Urbana-Champaign

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