World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
45
Citations
9022
World Ranking
3516
National Ranking
1301

James L. Drewniak publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where James L. Drewniak sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 507 publications — 85th percentile

85% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

James L. Drewniak D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where James L. Drewniak sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 45 D-Index — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2007 - IEEE Fellow For contributions in electromagnetic interference coupling paths and numerical modeling for compatibility design

Overview

James L. Drewniak is affiliated with the Missouri University of Science and Technology in the United States. Their primary research domain lies within Engineering, with a focus on Electrical and Electronic Engineering. Drewniak's work also extends to related subfields such as Aerospace Engineering, Mechanical Engineering, Mechanics of Materials, and Astronomy and Astrophysics.

The scientist's research topics cover several key areas including:

  • Electromagnetic Compatibility and Noise Suppression
  • Electromagnetic Compatibility and Measurements
  • Electrostatic Discharge in Electronics
  • 3D IC and TSV technologies
  • Electronic Packaging and Soldering Technologies
  • Microwave and Dielectric Measurement Techniques
  • Antenna Design and Analysis

James L. Drewniak has contributed to multiple publication venues. Frequent venues include:

  • IEEE Electromagnetic Compatibility Magazine
  • 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
  • 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
  • IEEE Transactions on Electromagnetic Compatibility
  • IEEE Internet of Things Journal

Some of the recent papers authored or co-authored by Drewniak are:

  • A 60 GHz PCB Wideband Antenna-in-Package for 5G/6G Applications, 2020, IEEE Antennas and Wireless Propagation Letters
  • Dielectric Loss Tangent Extraction Using Modal Measurements and 2-D Cross-Sectional Analysis for Multilayer PCBs, 2020, IEEE Transactions on Electromagnetic Compatibility
  • Calibration Loop Antenna for Multiple Probe Antenna Measurement System, 2020, IEEE Transactions on Instrumentation and Measurement
  • S-Parameter De-Embedding Error Estimation Based on the Statistical Circuit Models of Fixtures, 2020, IEEE Transactions on Electromagnetic Compatibility
  • Rugged Linear Array for IoT Applications, 2020, IEEE Internet of Things Journal

The scientist has collaborated on multiple occasions with several frequent co-authors, including:

  • Yihong Qi
  • Jun Fan
  • Samuel Connor
  • Zibin Weng
  • Bhyrav Mutnury

James L. Drewniak was named an IEEE Fellow in 2007 for contributions in electromagnetic interference coupling paths and numerical modeling for compatibility design.

Best Publications

  • Investigation of fundamental EMI source mechanisms driving common-mode radiation from printed circuit boards with attached cables

    D.M. Hockanson;J.L. Drewniak;T.H. Hubing;T.P. Van Doren

  • EMI from cavity modes of shielding enclosures-FDTD modeling and measurements

    Min Li;J. Nuebel;J.L. Drewniak;R.E. DuBroff

  • Electromagnetic interference (EMI) of system-on-package (SOP)

    T. Sudo;H. Sasaki;N. Masuda;J.L. Drewniak

  • Power bus decoupling on multilayer printed circuit boards

    T.H. Hubing;J.L. Drewniak;T.P. Van Doren;D.M. Hockanson

  • Numerical modeling of electrostatic discharge generators

    Kai Wang;D. Pommerenke;R. Chundru;T. Van Doren

  • An efficient approach for power delivery network design with closed-form expressions for parasitic interconnect inductances

    Chen Wang;Jingkun Mao;G. Selli;Shaofeng Luan

  • Quantifying SMT decoupling capacitor placement in dc power-bus design for multilayer PCBs

    Jun Fan;J.L. Drewniak;J.L. Knighten;N.W. Smith

  • Power-bus decoupling with embedded capacitance in printed circuit board design

    Minjia Xu;T.H. Hubing;J. Chen;T.P. Van Doren

  • Modeling of Shielding Composite Materials and Structures for Microwave Frequencies

    Marina Koledintseva;James Drewniak;Richard DuBroff;Konstantin Rozanov

  • EMI from airflow aperture arrays in shielding enclosures-experiments, FDTD, and MoM modeling

    Min Li;J. Nuebel;J.L. Drewniak;R.E. DuBroff

  • EMI mitigation with multilayer power-bus stacks and via stitching of reference planes

    Xiaoning Ye;D.A. Hockanson;Min Li;Yong Ren

  • Hand-Assembled Cable Bundle Modeling for Crosstalk and Common-Mode Radiation Prediction

    Shishuang Sun;Geping Liu;J.L. Drewniak;D.J. Pommerenke

  • A Three-Dimensional FDTD Subgridding Algorithm With Separated Temporal and Spatial Interfaces and Related Stability Analysis

    Kai Xiao;D.J. Pommerenke;J.L. Drewniak

  • An EMI estimate for shielding-enclosure evaluation

    Min Li;J.L. Drewniak;S. Radu;J. Nuebel

  • Comparison of FDTD algorithms for subcellular modeling of slots in shielding enclosures

    Kuang-Pin Ma;Min Li;J.L. Drewniak;T.H. Hubing

  • Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

    G. Muchaidze;Jayong Koo;Qing Cai;Tun Li

  • Causal RLGC ( $f$ ) Models for Transmission Lines From Measured $S$ -Parameters

    Jianmin Zhang;J.L. Drewniak;D.J. Pommerenke;M.Y. Koledintseva

  • FDTD modeling of common-mode radiation from cables

    D.M. Hockanson;J.L. Drewniak;T.H. Hubing;T.P. Van Doren

  • Power bus decoupling on multilayer printed circuit boards

    Todd H. Hubing;James L. Drewniak;Thomas P. Van Doren;David M. Hockanson

  • Estimating the noise mitigation effect of local decoupling in printed circuit boards

    Jun Fan;Wei Cui;J.L. Drewniak;T.P. Van Doren

  • DC power-bus design using FDTD modeling with dispersive media and surface mount technology components

    Xiaoning Ye;M.Y. Koledintseva;Min Li;J.L. Drewniak

Frequent Co-Authors

Jun Fan
Jun Fan Missouri University of Science and Technology
Todd H. Hubing
Todd H. Hubing Clemson University
David Pommerenke
David Pommerenke Graz University of Technology
Antonio Orlandi
Antonio Orlandi University of L'Aquila
Giulio Antonini
Giulio Antonini University of L'Aquila
Genda Chen
Genda Chen Missouri University of Science and Technology
Joungho Kim
Joungho Kim Korea Advanced Institute of Science and Technology
Albert E. Ruehli
Albert E. Ruehli Missouri University of Science and Technology
Scott D. Sudhoff
Scott D. Sudhoff Purdue University West Lafayette
Rodolfo Araneo
Rodolfo Araneo Sapienza University of Rome

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