World's Best Scientists 2026 revealed!
Antonio Orlandi

Antonio Orlandi

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
37
Citations
6817
World Ranking
5067
National Ranking
201

Antonio Orlandi publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Antonio Orlandi sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 366 publications — 70th percentile

70% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Antonio Orlandi D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Antonio Orlandi sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 37 D-Index — 27th percentile

27% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Antonio Orlandi is affiliated with the University of L'Aquila in Italy and has a research focus primarily within the field of engineering. Their work spans multiple subfields including electrical and electronic engineering, mechanical engineering, aerospace engineering, industrial and manufacturing engineering, and artificial intelligence.

The scholar's research contributions are notable in topics such as electromagnetic compatibility and noise suppression, power system optimization and stability, microwave and dielectric measurement techniques, electromagnetic compatibility and measurements, electrical contact performance and analysis, electronic packaging and soldering technologies, and antenna design and optimization.

Frequent publication venues for Orlandi's work include:

  • Electronics
  • SSRN Electronic Journal
  • International Journal of RF and Microwave Computer-Aided Engineering
  • Energies
  • Applied Sciences

Key recent papers by Antonio Orlandi include:

  • Effective PCB Decoupling Optimization by Combining an Iterative Genetic Algorithm and Machine Learning, 2020, Electronics
  • Estimation of Modal Parameters for Inter-Area Oscillations Analysis by a Machine Learning Approach with Offline Training, 2020, Energies
  • Highly Integrated Wideband Transmit/Receive Module for X-Band SAR Applications, 2023, Applied Sciences
  • Single-step algorithm for the cascade assembly of multiple S-parameters based multiports networks, 2022, International Journal of RF and Microwave Computer-Aided Engineering
  • Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly, 2021, Electronics

Among frequent co-authors collaborating with Orlandi are Francesco de Paulis, Carlo Olivieri, Cosimo Pisani, Giorgio Maria Giannuzzi, and Lino Di Leonardo.

Best Publications

  • Feature selective validation (FSV) for validation of computational electromagnetics (CEM). part I-the FSV method

    A.P. Duffy;A.J.M. Martin;A. Orlandi;G. Antonini

  • Feature selective validation (FSV) for validation of computational electromagnetics (CEM). part II- assessment of FSV performance

    A. Orlandi;A.P. Duffy;B. Archambeault;G. Antonini

  • Signal Integrity Design for High-Speed Digital Circuits: Progress and Directions

    Jun Fan;Xiaoning Ye;Jingook Kim;Bruce Archambeault

  • Nonorthogonal PEEC formulation for time- and frequency-domain EM and circuit modeling

    A.E. Ruehli;G. Antonini;J. Esch;J. Ekman

  • EMI reduction in switched power converters using frequency Modulation techniques

    J. Balcells;A. Santolaria;A. Orlandi;D. Gonzalez

  • FDTD analysis of lossy, multiconductor transmission lines terminated in arbitrary loads

    A. Orlandi;C.R. Paul

  • Power integrity modeling and design for semiconductors and systems [Book review]

    Unknown

  • Internal impedance of conductors of rectangular cross section

    G. Antonini;A. Orlandi;C.R. Paul

  • Quantifying SMT decoupling capacitor placement in dc power-bus design for multilayer PCBs

    Jun Fan;J.L. Drewniak;J.L. Knighten;N.W. Smith

  • 5G Over-the-Air Measurement Challenges: Overview

    Yihong Qi;Guang Yang;Lie Liu;Jun Fan

  • Causal RLGC ( $f$ ) Models for Transmission Lines From Measured $S$ -Parameters

    Jianmin Zhang;J.L. Drewniak;D.J. Pommerenke;M.Y. Koledintseva

  • EMC characterization of SMPS devices: circuit and radiated emissions model

    G. Antonini;S. Cristina;A. Orlandi

  • Wavelet packet-based EMI signal processing and source identification

    G. Antonini;A. Orlandi

  • A Simple and Efficient Design Procedure for Planar Electromagnetic Bandgap Structures on Printed Circuit Boards

    L Raimondo;F De Paulis;A Orlandi

  • PEEC modeling of lightning protection systems and coupling to coaxial cables

    G. Antonini;S. Cristina;A. Orlandi

  • Calculation of the induced effects due to a lightning stroke

    S. Cristina;A. Orlandi

  • Long-cable effects on conducted emissions levels

    S.A. Pignari;A. Orlandi

  • Circuit model for bulk current injection test on shielded coaxial cables

    A. Orlandi

  • Modeling DC power-bus structures with vertical discontinuities using a circuit extraction approach based on a mixed-potential integral equation

    Jun Fan;Hao Shi;A. Orlandi;J.L. Knighten

  • Through Silicon Via (TSV) Defect Modeling, Measurement, and Analysis

    Daniel H. Jung;Youngwoo Kim;Jonghoon J. Kim;Heegon Kim

  • Validation of a Three-Dimensional Transmission Line Matrix (TLM) Model Implementation of a Mode-Stirred Reverberation Chamber

    A. Coates;H.G. Sasse;D.E. Coleby;A.P. Duffy

  • Frequency analysis of the induced effects due to the lightning stroke radiated electromagnetic field

    C. Buccella;S. Cristina;A. Orlandi

  • S-parameters characterization of through, blind, and buried via holes

    G. Antonini;A.C. Scogna;A. Orlandi

Frequent Co-Authors

Giulio Antonini
Giulio Antonini University of L'Aquila
James L. Drewniak
James L. Drewniak Missouri University of Science and Technology
Jun Fan
Jun Fan Missouri University of Science and Technology
Joungho Kim
Joungho Kim Korea Advanced Institute of Science and Technology
Tzong-Lin Wu
Tzong-Lin Wu National Taiwan University
Dong-Hyun Kim
Dong-Hyun Kim Kyung Hee University
David Pommerenke
David Pommerenke Graz University of Technology
Madhavan Swaminathan
Madhavan Swaminathan Pennsylvania State University
Albert E. Ruehli
Albert E. Ruehli Missouri University of Science and Technology
Todd H. Hubing
Todd H. Hubing Clemson University

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