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D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 35 5547 5323 1904 1774 223 5356

Todd H. Hubing publications per year

The chart shows the history of publications by Todd H. Hubing between 1986 and 2023, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Todd H. Hubing published across 38 years, from 1986 to 2023, averaging 6.2 papers a year. Output peaked at 16 publications in 2000. 2 of the 236 publications appeared in the last two years.

No. of publications
5 10 15
Bar chart. Horizontal axis: year, 1986 to 2023. Vertical axis: number of publications, 0 to 16. Peak 16 publications in 2000. 1986: 1 publication 1987: 0 publications 1988: 0 publications 1989: 2 publications 1990: 3 publications 1991: 0 publications 1992: 1 publication 1993: 3 publications 1994: 6 publications 1995: 6 publications 1996: 8 publications 1997: 10 publications 1998: 7 publications 1999: 12 publications 2000: 16 publications 2001: 9 publications 2002: 15 publications 2003: 10 publications 2004: 10 publications 2005: 12 publications 2006: 11 publications 2007: 10 publications 2008: 13 publications 2009: 8 publications 2010: 9 publications 2011: 6 publications 2012: 8 publications 2013: 10 publications 2014: 10 publications 2015: 8 publications 2016: 2 publications 2017: 2 publications 2018: 2 publications 2019: 2 publications 2020: 1 publication 2021: 1 publication 2022: 1 publication 2023: 1 publication
1986 2023

236 publications in total across all disciplines

View publications per year as a table
Todd H. Hubing: publications per year, 1986 to 2023
Year Publications
1986 1
1987 0
1988 0
1989 2
1990 3
1991 0
1992 1
1993 3
1994 6
1995 6
1996 8
1997 10
1998 7
1999 12
2000 16
2001 9
2002 15
2003 10
2004 10
2005 12
2006 11
2007 10
2008 13
2009 8
2010 9
2011 6
2012 8
2013 10
2014 10
2015 8
2016 2
2017 2
2018 2
2019 2
2020 1
2021 1
2022 1
2023 1
Total 236
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Todd H. Hubing publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Todd H. Hubing sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 214–233 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 223 publications — 37th percentile

37% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431 223
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Todd H. Hubing D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Todd H. Hubing sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 35 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 35 D-Index — 21st percentile

21% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236 35
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
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Overview

Todd H. Hubing is affiliated with Clemson University in the United States and has a research focus in the field of engineering, particularly in electrical and electronic engineering. Their work spans topics related to electromagnetic compatibility, noise suppression, electronic packaging, soldering technologies, and advanced 3D IC and TSV technologies. Their research also includes power line communications, noise issues, and low-power, high-performance VLSI design.

Hubing's recent papers have predominantly appeared in the IEEE Electromagnetic Compatibility Magazine, with four publications demonstrating ongoing contributions to this venue. Notable papers include:

  • "Power bus decoupling on multilayer printed circuit boards" (2020, IEEE Electromagnetic Compatibility Magazine)
  • "Signal Integrity and Power Integrity" (2023, IEEE Electromagnetic Compatibility Magazine)
  • "Announcing Special Sessions in Spokane!" (2021, IEEE Electromagnetic Compatibility Magazine)
  • "Announcing Special Sessions in Spokane!" (2022, IEEE Electromagnetic Compatibility Magazine)

Frequent collaborators have supported and co-authored many works with Hubing, including:

  • F. Maradei
  • James L. Drewniak
  • Thomas P. Van Doren
  • D.M. Hockanson
  • Jai Narayan Tripathi

The main topics covered in their research include:

  • Electromagnetic Compatibility and Noise Suppression
  • Electronic Packaging and Soldering Technologies
  • 3D IC and TSV technologies
  • Power Line Communications and Noise
  • Low-power high-performance VLSI design

The concentration on electromagnetic compatibility and related technical challenges forms the core of Hubing's contributions. Their work often addresses practical solutions and theoretical analyses connected to signal integrity, power decoupling, and noise reduction in electronic systems.

Best Publications

  • The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future

    M. Ramdani;E. Sicard;A. Boyer;S. Ben Dhia

  • Investigation of fundamental EMI source mechanisms driving common-mode radiation from printed circuit boards with attached cables

    D.M. Hockanson;J.L. Drewniak;T.H. Hubing;T.P. Van Doren

  • EMI from cavity modes of shielding enclosures-FDTD modeling and measurements

    Min Li;J. Nuebel;J.L. Drewniak;R.E. DuBroff

  • Power bus decoupling on multilayer printed circuit boards

    T.H. Hubing;J.L. Drewniak;T.P. Van Doren;D.M. Hockanson

  • Quantifying SMT decoupling capacitor placement in dc power-bus design for multilayer PCBs

    Jun Fan;J.L. Drewniak;J.L. Knighten;N.W. Smith

  • Quantifying EMI resulting from finite-impedance reference planes

    D.M. Hockanson;J.L. Dreniak;T.H. Hubing;T.P. van Doren

  • Power-bus decoupling with embedded capacitance in printed circuit board design

    Minjia Xu;T.H. Hubing;J. Chen;T.P. Van Doren

  • EMI from airflow aperture arrays in shielding enclosures-experiments, FDTD, and MoM modeling

    Min Li;J. Nuebel;J.L. Drewniak;R.E. DuBroff

  • Model for estimating radiated emissions from a printed circuit board with attached cables due to Voltage-driven sources

    Hwan-Woo Shim;T.H. Hubing

  • An EMI estimate for shielding-enclosure evaluation

    Min Li;J.L. Drewniak;S. Radu;J. Nuebel

  • Comparison of FDTD algorithms for subcellular modeling of slots in shielding enclosures

    Kuang-Pin Ma;Min Li;J.L. Drewniak;T.H. Hubing

  • FDTD modeling of common-mode radiation from cables

    D.M. Hockanson;J.L. Drewniak;T.H. Hubing;T.P. Van Doren

  • Power bus decoupling on multilayer printed circuit boards

    Todd H. Hubing;James L. Drewniak;Thomas P. Van Doren;David M. Hockanson

  • The development of a closed-form expression for the input impedance of power-return plane structures

    Minjia Xu;T.H. Hubing

  • Numerical and experimental corroboration of an FDTD thin-slot model for slots near corners of shielding enclosures

    Min Li;Kuang-Ping Ma;D.M. Hockanson;J.L. Drewniak

  • A closed-form expression for estimating radiated emissions from the power planes in a populated printed circuit board

    Hwan-Woo Shim;T.H. Hubing

  • A hybrid FEM/MOM technique for electromagnetic scattering and radiation from dielectric objects with attached wires

    M.W. Ali;T.H. Hubing;J.L. Dreniak

  • Estimating Maximum Radiated Emissions From Printed Circuit Boards With an Attached Cable

    Shaowei Deng;T. Hubing;D. Beetner

  • Development of a closed-form expression for the input impedance of power-ground plane structures

    Minjia Xu;Yun Ji;T.H. Hubing;T.P. Van Doren

  • Imbalance Difference Model for Common-Mode Radiation From Printed Circuit Boards

    Changyi Su;T H Hubing

  • Investigation of fundamental mechanisms of common-mode radiation from printed circuit boards with attached cables

    J.L. Drewniak;T.H. Hubing;T.P. Van Doren

Frequent Co-Authors

James L. Drewniak
James L. Drewniak Missouri University of Science and Technology
Jun Fan
Jun Fan Missouri University of Science and Technology
Chunlei Guo
Chunlei Guo University of Rochester
David Pommerenke
David Pommerenke Graz University of Technology
Antonio Orlandi
Antonio Orlandi University of L'Aquila
Donald C. Wunsch
Donald C. Wunsch Missouri University of Science and Technology
Douglas H. Werner
Douglas H. Werner Pennsylvania State University
Juan R. Mosig
Juan R. Mosig École Polytechnique Fédérale de Lausanne
Christophe Fumeaux
Christophe Fumeaux University of Queensland
Natalia K. Nikolova
Natalia K. Nikolova McMaster University

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