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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
30
Citations
4594
World Ranking
6752
National Ranking
318

Research.com Recognitions

  • 2007 - IEEE Fellow For contributions to the modeling of circuit and electronic interconnects

Overview

Flavio Canavero is affiliated with the Polytechnic University of Turin in Italy. Their research primarily focuses on engineering, with a concentration on electrical and electronic engineering. The scientist has also contributed to fields such as statistics, probability and uncertainty, control and systems engineering, mechanical engineering, and astronomy and astrophysics.

Canavero's work covers a range of topics including probabilistic and robust engineering design, electromagnetic compatibility and noise suppression, microwave engineering and waveguides, low-power high-performance VLSI design, optimal experimental design methods, control systems and identification, and advanced battery technologies research.

Recent scholarly output includes papers published in reputable venues, with selected works as follows:

  • Machine Learning Regression Techniques for the Modeling of Complex Systems: An Overview, 2021, IEEE Electromagnetic Compatibility Magazine
  • Compressed Machine Learning-Based Inverse Model for Design Optimization of Microwave Components, 2022, IEEE Transactions on Microwave Theory and Techniques
  • Comparative Analysis of Prior Knowledge-Based Machine Learning Metamodels for Modeling Hybrid Copper-Graphene On-Chip Interconnects, 2022, IEEE Transactions on Electromagnetic Compatibility
  • An Iterative Scheme for the Power-Flow Analysis of Distribution Networks based on Decoupled Circuit Equivalents in the Phasor Domain, 2020, Energies
  • Analysis of Parameter Variability in an Integrated Wireless Power Transfer System via Partial Least-Squares Regression, 2020, IEEE Transactions on Components Packaging and Manufacturing Technology

The frequent publication venues in Canavero's portfolio include:

  • IEEE Transactions on Electromagnetic Compatibility
  • IEEE Electromagnetic Compatibility Magazine
  • IEEE Transactions on Microwave Theory and Techniques
  • Energies
  • IEEE Transactions on Components Packaging and Manufacturing Technology

Frequent co-authors collaborating with Canavero are:

  • Riccardo Trinchero
  • Felipe Treviso
  • Igor Simone Stievano
  • Zain Anwer Memon
  • Yan-Zhao Xie

In 2007, Canavero was recognized as an IEEE Fellow for contributions to the modeling of circuit and electronic interconnects.

Best Publications

  • Stability, Causality, and Passivity in Electrical Interconnect Models

    P. Triverio;S. Grivet-Talocia;M.S. Nakhla;F.G. Canavero

  • Overview of Signal Integrity and EMC Design Technologies on PCB: Fundamentals and Latest Progress

    Tzong-Lin Wu;Frits Buesink;Flavio Canavero

  • Transient analysis of lossy transmission lines: an efficient approach based on the method of Characteristics

    S. Grivet-Talocia;Hao-Ming Huang;A.E. Ruehli;F. Canavero

  • Accurate Extraction of Noise Source Impedance of an SMPS Under Operating Conditions

    V. Tarateeraseth;Bo Hu;Kye Yak See;F.G. Canavero

  • Systematic Electromagnetic Interference Filter Design Based on Information From In-Circuit Impedance Measurements

    V Tarateeraseth;Kye Yak See;F G Canavero;R W Chang

  • Stochastic Analysis of Multiconductor Cables and Interconnects

    Igor S Stievano;Paolo Manfredi;Flavio G Canavero

  • Parameters Variability Effects on Multiconductor Interconnects via Hermite Polynomial Chaos

    Igor Simone Stievano;Paolo Manfredi;Flavio G. Canavero

  • Parametric macromodels of digital I/O ports

    I.S. Stievano;I.A. Maio;F.G. Canavero

  • M/spl pi/log, macromodeling via parametric identification of logic gates

    I.S. Stievano;I.A. Maio;F.G. Canavero

  • Stochastic Modeling-Based Variability Analysis of On-Chip Interconnects

    D.Vande Ginste;Daniel De Zutter;D. Deschrijver;T. Dhaene

  • Generalized Decoupled Polynomial Chaos for Nonlinear Circuits With Many Random Parameters

    Paolo Manfredi;Dries Vande Ginste;Daniel De Zutter;Flavio G. Canavero

  • Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters

    Riccardo Trinchero;Mourad Larbi;Hakki Mert Torun;Flavio G. Canavero

  • Analysis of crosstalk and field coupling to lossy MTLs in a SPICE environment

    I. Maio;F.G. Canavero;B. Dilecce

  • Theoretical assessment of bulk current injection versus radiation

    S. Pignari;F.G. Canavero

  • Stochastic Modeling of Nonlinear Circuits via SPICE-Compatible Spectral Equivalents

    Paolo Manfredi;Dries Vande Ginste;Daniel De Zutter;Flavio G. Canavero

  • Uncertainty Assessment of Lossy and Dispersive Lines in SPICE-Type Environments

    Paolo Manfredi;Dries Vande Ginste;Daniel De Zutter;Flavio G. Canavero

  • Stochastic transmission line analysis via polynomial chaos methods: an overview

    Paolo Manfredi;Dries Vande Ginste;Igor S. Stievano;Daniël De Zutter

  • Machine Learning for the Performance Assessment of High-Speed Links

    Riccardo Trinchero;Paolo Manfredi;Igor S. Stievano;Flavio G. Canavero

  • Efficient Statistical Simulation of Microwave Devices Via Stochastic Testing-Based Circuit Equivalents of Nonlinear Components

    Paolo Manfredi;Flavio G. Canavero

  • Polynomial Chaos for Random Field Coupling to Transmission Lines

    P. Manfredi;F. G. Canavero

  • Variability Analysis of Interconnects Terminated by General Nonlinear Loads

    Alessandro Biondi;Dries Vande Ginste;Daniel De Zutter;Paolo Manfredi

  • Mpilog, Macromodeling via Parametric Identification of Logic Gates

    Flavio Canavero;Ivano Adolfo Maio;Igor Simone Stievano

Frequent Co-Authors

D. De Zutter
D. De Zutter Ghent University
Madhavan Swaminathan
Madhavan Swaminathan Pennsylvania State University
Christos Christopoulos
Christos Christopoulos University of Nottingham
Tom Dhaene
Tom Dhaene Ghent University
Vladimir A. Rakov
Vladimir A. Rakov University of Florida
Michel Nakhla
Michel Nakhla Carleton University
Christopher L. Holloway
Christopher L. Holloway National Institute of Standards and Technology
Farhad Rachidi
Farhad Rachidi École Polytechnique Fédérale de Lausanne
Er-Ping Li
Er-Ping Li Zhejiang University
Athanassia Athanassiou
Athanassia Athanassiou Italian Institute of Technology

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