World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
30
Citations
4594
World Ranking
6751
National Ranking
318

Flavio Canavero publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Flavio Canavero sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 355 publications — 68th percentile

68% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Flavio Canavero D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Flavio Canavero sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 30 D-Index — 3rd percentile

3% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2007 - IEEE Fellow For contributions to the modeling of circuit and electronic interconnects

Overview

Flavio Canavero is affiliated with the Polytechnic University of Turin in Italy. Their research primarily focuses on engineering, with a concentration on electrical and electronic engineering. The scientist has also contributed to fields such as statistics, probability and uncertainty, control and systems engineering, mechanical engineering, and astronomy and astrophysics.

Canavero's work covers a range of topics including probabilistic and robust engineering design, electromagnetic compatibility and noise suppression, microwave engineering and waveguides, low-power high-performance VLSI design, optimal experimental design methods, control systems and identification, and advanced battery technologies research.

Recent scholarly output includes papers published in reputable venues, with selected works as follows:

  • Machine Learning Regression Techniques for the Modeling of Complex Systems: An Overview, 2021, IEEE Electromagnetic Compatibility Magazine
  • Compressed Machine Learning-Based Inverse Model for Design Optimization of Microwave Components, 2022, IEEE Transactions on Microwave Theory and Techniques
  • Comparative Analysis of Prior Knowledge-Based Machine Learning Metamodels for Modeling Hybrid Copper-Graphene On-Chip Interconnects, 2022, IEEE Transactions on Electromagnetic Compatibility
  • An Iterative Scheme for the Power-Flow Analysis of Distribution Networks based on Decoupled Circuit Equivalents in the Phasor Domain, 2020, Energies
  • Analysis of Parameter Variability in an Integrated Wireless Power Transfer System via Partial Least-Squares Regression, 2020, IEEE Transactions on Components Packaging and Manufacturing Technology

The frequent publication venues in Canavero's portfolio include:

  • IEEE Transactions on Electromagnetic Compatibility
  • IEEE Electromagnetic Compatibility Magazine
  • IEEE Transactions on Microwave Theory and Techniques
  • Energies
  • IEEE Transactions on Components Packaging and Manufacturing Technology

Frequent co-authors collaborating with Canavero are:

  • Riccardo Trinchero
  • Felipe Treviso
  • Igor Simone Stievano
  • Zain Anwer Memon
  • Yan-Zhao Xie

In 2007, Canavero was recognized as an IEEE Fellow for contributions to the modeling of circuit and electronic interconnects.

Best Publications

  • Stability, Causality, and Passivity in Electrical Interconnect Models

    P. Triverio;S. Grivet-Talocia;M.S. Nakhla;F.G. Canavero

  • Overview of Signal Integrity and EMC Design Technologies on PCB: Fundamentals and Latest Progress

    Tzong-Lin Wu;Frits Buesink;Flavio Canavero

  • Transient analysis of lossy transmission lines: an efficient approach based on the method of Characteristics

    S. Grivet-Talocia;Hao-Ming Huang;A.E. Ruehli;F. Canavero

  • Accurate Extraction of Noise Source Impedance of an SMPS Under Operating Conditions

    V. Tarateeraseth;Bo Hu;Kye Yak See;F.G. Canavero

  • Systematic Electromagnetic Interference Filter Design Based on Information From In-Circuit Impedance Measurements

    V Tarateeraseth;Kye Yak See;F G Canavero;R W Chang

  • Stochastic Analysis of Multiconductor Cables and Interconnects

    Igor S Stievano;Paolo Manfredi;Flavio G Canavero

  • Parameters Variability Effects on Multiconductor Interconnects via Hermite Polynomial Chaos

    Igor Simone Stievano;Paolo Manfredi;Flavio G. Canavero

  • Parametric macromodels of digital I/O ports

    I.S. Stievano;I.A. Maio;F.G. Canavero

  • M/spl pi/log, macromodeling via parametric identification of logic gates

    I.S. Stievano;I.A. Maio;F.G. Canavero

  • Stochastic Modeling-Based Variability Analysis of On-Chip Interconnects

    D.Vande Ginste;Daniel De Zutter;D. Deschrijver;T. Dhaene

  • Generalized Decoupled Polynomial Chaos for Nonlinear Circuits With Many Random Parameters

    Paolo Manfredi;Dries Vande Ginste;Daniel De Zutter;Flavio G. Canavero

  • Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters

    Riccardo Trinchero;Mourad Larbi;Hakki Mert Torun;Flavio G. Canavero

  • Analysis of crosstalk and field coupling to lossy MTLs in a SPICE environment

    I. Maio;F.G. Canavero;B. Dilecce

  • Theoretical assessment of bulk current injection versus radiation

    S. Pignari;F.G. Canavero

  • Stochastic Modeling of Nonlinear Circuits via SPICE-Compatible Spectral Equivalents

    Paolo Manfredi;Dries Vande Ginste;Daniel De Zutter;Flavio G. Canavero

  • Uncertainty Assessment of Lossy and Dispersive Lines in SPICE-Type Environments

    Paolo Manfredi;Dries Vande Ginste;Daniel De Zutter;Flavio G. Canavero

  • Stochastic transmission line analysis via polynomial chaos methods: an overview

    Paolo Manfredi;Dries Vande Ginste;Igor S. Stievano;Daniël De Zutter

  • Machine Learning for the Performance Assessment of High-Speed Links

    Riccardo Trinchero;Paolo Manfredi;Igor S. Stievano;Flavio G. Canavero

  • Efficient Statistical Simulation of Microwave Devices Via Stochastic Testing-Based Circuit Equivalents of Nonlinear Components

    Paolo Manfredi;Flavio G. Canavero

  • Polynomial Chaos for Random Field Coupling to Transmission Lines

    P. Manfredi;F. G. Canavero

  • Variability Analysis of Interconnects Terminated by General Nonlinear Loads

    Alessandro Biondi;Dries Vande Ginste;Daniel De Zutter;Paolo Manfredi

  • Mpilog, Macromodeling via Parametric Identification of Logic Gates

    Flavio Canavero;Ivano Adolfo Maio;Igor Simone Stievano

Frequent Co-Authors

D. De Zutter
D. De Zutter Ghent University
Madhavan Swaminathan
Madhavan Swaminathan Pennsylvania State University
Kye Yak See
Kye Yak See Nanyang Technological University
Tom Dhaene
Tom Dhaene Ghent University
Christos Christopoulos
Christos Christopoulos University of Nottingham
Dirk Deschrijver
Dirk Deschrijver Ghent University
Jose C. Pedro
Jose C. Pedro University of Aveiro
Michel Nakhla
Michel Nakhla Carleton University
Farhad Rachidi
Farhad Rachidi École Polytechnique Fédérale de Lausanne
Athanassia Athanassiou
Athanassia Athanassiou Italian Institute of Technology

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