World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
48
Citations
14587
World Ranking
3015
National Ranking
1133

Albert E. Ruehli publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Albert E. Ruehli sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 270 publications — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Albert E. Ruehli D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Albert E. Ruehli sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 48 D-Index — 56th percentile

56% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 1984 - IEEE Fellow For key contributions to the field of computer-aided design.

Overview

Albert E. Ruehli is affiliated with the Missouri University of Science and Technology in the United States. Their research primarily focuses on engineering, with a substantial body of work in electrical and electronic engineering, complemented by contributions in atomic and molecular physics and optics, computational mechanics, mechanics of materials, and numerical analysis.

Their research topics cover multiple domains within electromagnetics and numerical methods, including:

  • Electromagnetic Compatibility and Noise Suppression
  • Electromagnetic Simulation and Numerical Methods
  • Electromagnetic Scattering and Analysis
  • 3D IC and TSV technologies
  • Advanced Numerical Analysis Techniques
  • Numerical methods in engineering
  • Microwave Engineering and Waveguides

Albert E. Ruehli has contributed to numerous papers published primarily in IEEE-affiliated venues. Their recent papers include:

  • "Time-Domain Analysis of Retarded Partial Element Equivalent Circuit Models Using Numerical Inversion of Laplace Transform," 2020, IEEE Transactions on Electromagnetic Compatibility
  • "The Partial Elements Equivalent Circuit Method: The State of the Art," 2023, IEEE Transactions on Electromagnetic Compatibility
  • "Accurate Inductance Models of Mounted Two-Terminal Decoupling Capacitors," 2020, IEEE Transactions on Electromagnetic Compatibility
  • "Cagniard-DeHoop Technique-Based Computation of Retarded Partial Coefficients: The Coplanar Case," 2020, IEEE Access
  • "A Methodical Approach for PCB PDN Decoupling Minimizing Overdesign with Genetic Algorithm Optimization," 2022, 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

The frequent co-authors collaborating with Albert E. Ruehli include:

  • Giulio Antonini
  • Fabrizio Loreto
  • Siqi Bai
  • Samuel Connor
  • James L. Drewniak

The dissemination of their work frequently appears in publication venues such as:

  • IEEE Transactions on Electromagnetic Compatibility
  • IEEE Transactions on Signal and Power Integrity
  • IEEE Electromagnetic Compatibility Magazine
  • 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
  • arXiv (Cornell University)

Albert E. Ruehli was recognized as an IEEE Fellow in 1984 for key contributions to the field of computer-aided design. This distinction highlights their involvement in advancing engineering methodologies through computational techniques.

Best Publications

  • The modified nodal approach to network analysis

    Chung-Wen Ho;A. Ruehli;P. Brennan

  • Equivalent Circuit Models for Three-Dimensional Multiconductor Systems

    A.E. Ruehli

  • Inductance calculations in a complex integrated circuit environment

    A. E. Ruehli

  • The Waveform Relaxation Method for Time-Domain Analysis of Large Scale Integrated Circuits

    E. Lelarasmee;A.E. Ruehli;A.L. Sangiovanni-Vincentelli

  • An Overview of the BlueGene/L Supercomputer

    N.R. Adiga;G. Almasi;G.S. Almasi;Y. Aridor

  • Efficient Capacitance Calculations for Three-Dimensional Multiconductor Systems

    A.E. Ruehli;P.A. Brennan

  • Circuit models for three-dimensional geometries including dielectrics

    A.E. Ruehli;H. Heeb

  • Methods for linear systems of circuit delay differential equations of neutral type

    A. Bellen;N. Guglielmi;A.E. Ruehli

  • Nonorthogonal PEEC formulation for time- and frequency-domain EM and circuit modeling

    A.E. Ruehli;G. Antonini;J. Esch;J. Ekman

  • Three-dimensional interconnect analysis using partial element equivalent circuits

    H. Heeb;A.E. Ruehli

  • Progress in the methodologies for the electrical modeling of interconnects and electronic packages

    A.E. Ruehli;A.C. Cangellaris

  • Circuit Oriented Electromagnetic Modeling Using the PEEC Techniques

    Albert E. Ruehli;Giulio Antonini;Lijun Jiang

  • Transient analysis of lossy transmission lines: an efficient approach based on the method of Characteristics

    S. Grivet-Talocia;Hao-Ming Huang;A.E. Ruehli;F. Canavero

  • Survey of computer-aided electrical analysis of integrated circuit interconnections

    Albert E. Ruehli

  • Enhanced skin effect for partial-element equivalent-circuit (PEEC) models

    K.M. Coperich;A.E. Ruehli;A. Cangellaris

  • WAVEFORM RELAXATION: THEORY AND PRACTICE

    J. White;F. Odeh;A. S. Vincentelli;A. Ruehli

  • Three-dimensional inductance computations with partial element equivalent circuits

    Pierce A. Brennan;Norman Raver;Albert E. Ruehli

  • Capacitance models for integrated circuit metallization wires

    A.E. Ruehli;P.A. Brennan

  • Full-wave PEEC time-domain method for the modeling of on-chip interconnects

    P.J. Restle;A.E. Ruehli;S.G. Walker;G. Papadopoulos

  • Analysis of power/ground-plane EMI decoupling performance using the partial-element equivalent circuit technique

    B. Archambeault;A.E. Ruehli

Frequent Co-Authors

Andreas C. Cangellaris
Andreas C. Cangellaris University of Illinois at Urbana-Champaign
Giulio Antonini
Giulio Antonini University of L'Aquila
Michel Nakhla
Michel Nakhla Carleton University
Martin J. Gander
Martin J. Gander University of Geneva
James L. Drewniak
James L. Drewniak Missouri University of Science and Technology
Xiaoxiong Gu
Xiaoxiong Gu IBM (United States)
Tom Dhaene
Tom Dhaene Ghent University
Antonio Orlandi
Antonio Orlandi University of L'Aquila
Phillip J. Restle
Phillip J. Restle IBM (United States)
Christopher L. Holloway
Christopher L. Holloway National Institute of Standards and Technology

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