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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
69
Citations
16600
World Ranking
968
National Ranking
407

Research.com Recognitions

  • 2010 - IEEE Fellow For application of new material in the field of electromagnetic compatibility

Overview

Christopher L. Holloway is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on physics and astronomy, with a concentrated expertise in atomic and molecular physics, and optics. Throughout their career, Holloway's work has spanned multiple topics related to quantum optics, atomic interactions, and cold atom physics.

The main fields of study for Holloway include:

  • Physics and Astronomy

Their subfields of study highlight a specialization in:

  • Atomic and Molecular Physics, and Optics
  • Spectroscopy
  • Artificial Intelligence
  • Ecology
  • Management, Monitoring, Policy and Law

The key research topics covered by Holloway are:

  • Cold Atom Physics and Bose-Einstein Condensates
  • Atomic and Subatomic Physics Research
  • Quantum optics and atomic interactions
  • Advanced Frequency and Time Standards
  • Spectroscopy and Laser Applications
  • Quantum Information and Cryptography
  • Strong Light-Matter Interactions

Among their recent scientific papers are:

  • "Determining the angle-of-arrival of a radio-frequency source with a Rydberg atom-based sensor," 2021, Applied Physics Letters
  • "Enhancement of electromagnetically induced transparency based Rydberg-atom electrometry through population repumping," 2021, arXiv (Cornell University)
  • "Modern RF Measurements With Hot Atoms: A Technology Review of Rydberg Atom-Based Radio Frequency Field Sensors," 2022, IEEE Microwave Magazine
  • "Rydberg atom-based field sensing enhancement using a split-ring resonator," 2022, arXiv (Cornell University)
  • "Continuous radio-frequency electric-field detection through adjacent Rydberg resonance tuning," 2021, Physical review. A/Physical review, A

Holloway frequently collaborates with several co-authors, including:

  • Nikunjkumar Prajapati
  • Matthew T. Simons
  • Alexandra B. Artusio-Glimpse
  • Samuel Berweger
  • Andrew P. Rotunno

Their publications appear predominantly in the following venues:

  • arXiv (Cornell University)
  • Physical review. A/Physical review, A
  • Applied Physics Letters
  • Physical Review Applied
  • Journal of Applied Physics

Christopher L. Holloway received the IEEE Fellow award in 2010 for contributions to the application of new materials in electromagnetic compatibility.

Best Publications

  • An Overview of the Theory and Applications of Metasurfaces: The Two-Dimensional Equivalents of Metamaterials

    C. L. Holloway;E. F. Kuester;J. A. Gordon;J. O'Hara

  • Averaged transition conditions for electromagnetic fields at a metafilm

    E.F. Kuester;M.A. Mohamed;M. Piket-May;C.L. Holloway

  • A double negative (DNG) composite medium composed of magnetodielectric spherical particles embedded in a matrix

    C.L. Holloway;E.F. Kuester;J. Baker-Jarvis;P. Kabos

  • Reflection and transmission properties of a metafilm: with an application to a controllable surface composed of resonant particles

    C.L. Holloway;M.A. Mohamed;E.F. Kuester;A. Dienstfrey

  • On the Use of Reverberation Chambers to Simulate a Rician Radio Environment for the Testing of Wireless Devices

    C.L. Holloway;D.A. Hill;J.M. Ladbury;P.F. Wilson

  • Broadband Rydberg Atom-Based Electric-Field Probe for SI-Traceable, Self-Calibrated Measurements

    Christopher L. Holloway;Joshua A. Gordon;Steven Jefferts;Andrew Schwarzkopf

  • Reverberation Chamber Techniques for Determining the Radiation and Total Efficiency of Antennas

    C. L. Holloway;H. A. Shah;R. J. Pirkl;W. F. Young

  • Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

    Christopher L. Holloway;Matt T. Simons;Joshua A. Gordon;Andrew Dienstfrey

  • Analyzing carbon-fiber composite materials with equivalent-Layer models

    C.L. Holloway;M.S. Sarto;M. Johansson

  • Sub-Wavelength Imaging and Field Mapping via EIT and Autler-Townes Splitting In Rydberg Atoms ∗

    Christopher L. Holloway;Joshua A. Gordon;Andrew Schwarzkopf;David A. Anderson

  • A Rydberg atom-based mixer: Measuring the phase of a radio frequency wave

    Matthew T. Simons;Abdulaziz H. Haddab;Joshua A. Gordon;Christopher L. Holloway

  • Comparison of electromagnetic absorber used in anechoic and semi-anechoic chambers for emissions and immunity testing of digital devices

    C.L. Holloway;R.R. DeLyser;R.F. German;P. McKenna

  • Shielding effectiveness measurements of materials using nested reverberation chambers

    C.L. Holloway;D.A. Hill;J. Ladbury;G. Koepke

  • Sub-wavelength imaging and field mapping via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms

    Christopher L. Holloway;Joshua A. Gordon;Andrew Schwarzkopf;David A. Anderson

  • Simulating the Multipath Channel With a Reverberation Chamber: Application to Bit Error Rate Measurements

    E Genender;C L Holloway;K A Remley;J M Ladbury

  • Characterizing Metasurfaces/Metafilms: The Connection Between Surface Susceptibilities and Effective Material Properties

    C. L. Holloway;E. F. Kuester;A. Dienstfrey

  • A low-frequency model for wedge or pyramid absorber arrays-I: theory

    E.F. Kuester;C.L. Holloway

  • Effects of reinforced concrete structures on RF communications

    R.A. Dalke;C.L. Holloway;P. McKenna;M. Johansson

  • Broadband Rydberg Atom-Based Electric-Field Probe: From Self-Calibrated Measurements to Sub-Wavelength Imaging

    Christopher L. Holloway;Josh A. Gordon;Steven Jefferts;Andrew Schwarzkopf

  • Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials

    James R. Baker-Jarvis;Michael D. Janezic;Billy F. Riddle;Christopher L. Holloway

  • Optical Measurements of Strong Microwave Fields with Rydberg Atoms in a Vapor Cell

    D. A. Anderson;S. A. Miller;G. Raithel;J. A. Gordon

Frequent Co-Authors

Dylan F. Williams
Dylan F. Williams National Institute of Standards and Technology
David W. Matolak
David W. Matolak University of South Carolina
Richard W. Ziolkowski
Richard W. Ziolkowski University of Arizona
Maria Sabrina Sarto
Maria Sabrina Sarto Sapienza University of Rome
Matteo Pasquali
Matteo Pasquali Rice University
John F. O'Hara
John F. O'Hara Oklahoma State University
Flavio Canavero
Flavio Canavero Polytechnic University of Turin
Farhad Rachidi
Farhad Rachidi École Polytechnique Fédérale de Lausanne
Nader Engheta
Nader Engheta University of Pennsylvania
Judith L. MacManus-Driscoll
Judith L. MacManus-Driscoll University of Cambridge

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