World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
69
Citations
16600
World Ranking
968
National Ranking
408

Christopher L. Holloway publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Christopher L. Holloway sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 317 publications — 61st percentile

61% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Christopher L. Holloway D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Christopher L. Holloway sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 69 D-Index — 86th percentile

86% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2010 - IEEE Fellow For application of new material in the field of electromagnetic compatibility

Overview

Christopher L. Holloway is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on physics and astronomy, with a concentrated expertise in atomic and molecular physics, and optics. Throughout their career, Holloway's work has spanned multiple topics related to quantum optics, atomic interactions, and cold atom physics.

The main fields of study for Holloway include:

  • Physics and Astronomy

Their subfields of study highlight a specialization in:

  • Atomic and Molecular Physics, and Optics
  • Spectroscopy
  • Artificial Intelligence
  • Ecology
  • Management, Monitoring, Policy and Law

The key research topics covered by Holloway are:

  • Cold Atom Physics and Bose-Einstein Condensates
  • Atomic and Subatomic Physics Research
  • Quantum optics and atomic interactions
  • Advanced Frequency and Time Standards
  • Spectroscopy and Laser Applications
  • Quantum Information and Cryptography
  • Strong Light-Matter Interactions

Among their recent scientific papers are:

  • "Determining the angle-of-arrival of a radio-frequency source with a Rydberg atom-based sensor," 2021, Applied Physics Letters
  • "Enhancement of electromagnetically induced transparency based Rydberg-atom electrometry through population repumping," 2021, arXiv (Cornell University)
  • "Modern RF Measurements With Hot Atoms: A Technology Review of Rydberg Atom-Based Radio Frequency Field Sensors," 2022, IEEE Microwave Magazine
  • "Rydberg atom-based field sensing enhancement using a split-ring resonator," 2022, arXiv (Cornell University)
  • "Continuous radio-frequency electric-field detection through adjacent Rydberg resonance tuning," 2021, Physical review. A/Physical review, A

Holloway frequently collaborates with several co-authors, including:

  • Nikunjkumar Prajapati
  • Matthew T. Simons
  • Alexandra B. Artusio-Glimpse
  • Samuel Berweger
  • Andrew P. Rotunno

Their publications appear predominantly in the following venues:

  • arXiv (Cornell University)
  • Physical review. A/Physical review, A
  • Applied Physics Letters
  • Physical Review Applied
  • Journal of Applied Physics

Christopher L. Holloway received the IEEE Fellow award in 2010 for contributions to the application of new materials in electromagnetic compatibility.

Best Publications

  • An Overview of the Theory and Applications of Metasurfaces: The Two-Dimensional Equivalents of Metamaterials

    C. L. Holloway;E. F. Kuester;J. A. Gordon;J. O'Hara

  • Averaged transition conditions for electromagnetic fields at a metafilm

    E.F. Kuester;M.A. Mohamed;M. Piket-May;C.L. Holloway

  • A double negative (DNG) composite medium composed of magnetodielectric spherical particles embedded in a matrix

    C.L. Holloway;E.F. Kuester;J. Baker-Jarvis;P. Kabos

  • Reflection and transmission properties of a metafilm: with an application to a controllable surface composed of resonant particles

    C.L. Holloway;M.A. Mohamed;E.F. Kuester;A. Dienstfrey

  • On the Use of Reverberation Chambers to Simulate a Rician Radio Environment for the Testing of Wireless Devices

    C.L. Holloway;D.A. Hill;J.M. Ladbury;P.F. Wilson

  • Broadband Rydberg Atom-Based Electric-Field Probe for SI-Traceable, Self-Calibrated Measurements

    Christopher L. Holloway;Joshua A. Gordon;Steven Jefferts;Andrew Schwarzkopf

  • Reverberation Chamber Techniques for Determining the Radiation and Total Efficiency of Antennas

    C. L. Holloway;H. A. Shah;R. J. Pirkl;W. F. Young

  • Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

    Christopher L. Holloway;Matt T. Simons;Joshua A. Gordon;Andrew Dienstfrey

  • Analyzing carbon-fiber composite materials with equivalent-Layer models

    C.L. Holloway;M.S. Sarto;M. Johansson

  • Sub-Wavelength Imaging and Field Mapping via EIT and Autler-Townes Splitting In Rydberg Atoms ∗

    Christopher L. Holloway;Joshua A. Gordon;Andrew Schwarzkopf;David A. Anderson

  • A Rydberg atom-based mixer: Measuring the phase of a radio frequency wave

    Matthew T. Simons;Abdulaziz H. Haddab;Joshua A. Gordon;Christopher L. Holloway

  • Comparison of electromagnetic absorber used in anechoic and semi-anechoic chambers for emissions and immunity testing of digital devices

    C.L. Holloway;R.R. DeLyser;R.F. German;P. McKenna

  • Shielding effectiveness measurements of materials using nested reverberation chambers

    C.L. Holloway;D.A. Hill;J. Ladbury;G. Koepke

  • Sub-wavelength imaging and field mapping via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms

    Christopher L. Holloway;Joshua A. Gordon;Andrew Schwarzkopf;David A. Anderson

  • Simulating the Multipath Channel With a Reverberation Chamber: Application to Bit Error Rate Measurements

    E Genender;C L Holloway;K A Remley;J M Ladbury

  • Characterizing Metasurfaces/Metafilms: The Connection Between Surface Susceptibilities and Effective Material Properties

    C. L. Holloway;E. F. Kuester;A. Dienstfrey

  • A low-frequency model for wedge or pyramid absorber arrays-I: theory

    E.F. Kuester;C.L. Holloway

  • Effects of reinforced concrete structures on RF communications

    R.A. Dalke;C.L. Holloway;P. McKenna;M. Johansson

  • Broadband Rydberg Atom-Based Electric-Field Probe: From Self-Calibrated Measurements to Sub-Wavelength Imaging

    Christopher L. Holloway;Josh A. Gordon;Steven Jefferts;Andrew Schwarzkopf

  • Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials

    James R. Baker-Jarvis;Michael D. Janezic;Billy F. Riddle;Christopher L. Holloway

  • Optical Measurements of Strong Microwave Fields with Rydberg Atoms in a Vapor Cell

    D. A. Anderson;S. A. Miller;G. Raithel;J. A. Gordon

Frequent Co-Authors

Edward F. Kuester
Edward F. Kuester University of Colorado Boulder
Kate A. Remley
Kate A. Remley National Institute of Standards and Technology
Dylan F. Williams
Dylan F. Williams National Institute of Standards and Technology
David W. Matolak
David W. Matolak University of South Carolina
Richard J. Doviak
Richard J. Doviak National Oceanic and Atmospheric Administration
Richard W. Ziolkowski
Richard W. Ziolkowski University of Arizona
Maria Sabrina Sarto
Maria Sabrina Sarto Sapienza University of Rome
Nada Golmie
Nada Golmie National Institute of Standards and Technology
John F. O'Hara
John F. O'Hara Oklahoma State University
Matteo Pasquali
Matteo Pasquali Rice University

If you think any of the details on this page are incorrect, let us know.

Report an issue

We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:

Related Online Degrees & Career Pathways

For those exploring studies in Electronics and Electrical Engineering, online education offers flexible alternatives that cater to diverse needs. Many students find value in programs like the online masters in instructional design, which can complement engineering skills with expertise in educational technology and training development.

Choosing the right program is crucial, and some learners prefer competency-based models that emphasize mastering skills over traditional credit hours. This approach is highlighted in the best competency-based colleges guide, useful for students seeking self-paced progress in technical fields.

Furthermore, military spouses and dependents may benefit from specialized support through institutions recognized in the military spouse online college listings, which offer tailored resources and flexible scheduling options to accommodate their unique circumstances.

For prospective students eager to start promptly, exploring online colleges that start soon can provide immediate access to coursework, enabling them to jumpstart their careers without delay.

Best Scientists Citing Christopher L. Holloway

Trending Scientists

Recently Published Articles