What is he best known for?
The fields of study he is best known for:
- Electrical engineering
- Statistics
- Optics
His primary areas of investigation include Electronic engineering, Optics, Calibration, Characteristic impedance and Scattering parameters.
He combines subjects such as Wireless, Reverberation, Radio frequency, Nonlinear system and Algorithm with his study of Electronic engineering.
Dylan F. Williams frequently studies issues relating to Waveform and Optics.
His Calibration research is multidisciplinary, incorporating elements of Photodiode, Oscilloscope, Jitter, Frequency response and Impedance matching.
His Characteristic impedance research includes elements of Electric power transmission, Coplanar waveguide and Network analysis.
His Scattering parameters research is multidisciplinary, incorporating perspectives in Scattering and Integrated circuit.
His most cited work include:
- Characteristic impedance determination using propagation constant measurement (326 citations)
- A General Waveguide Circuit Theory. (297 citations)
- Comparison of On-Wafer Calibrations (184 citations)
What are the main themes of his work throughout his whole career to date?
Dylan F. Williams mostly deals with Electronic engineering, Calibration, NIST, Optics and Measurement uncertainty.
His research in Electronic engineering intersects with topics in Acoustics, Characteristic impedance, Transmission line, Oscilloscope and Electric power transmission.
His work deals with themes such as Frequency response, Waveform, Electrical impedance, Scattering parameters and Microwave, which intersect with Calibration.
His work investigates the relationship between NIST and topics such as Network analyzer that intersect with problems in Signal.
Many of his studies involve connections with topics such as Coplanar waveguide and Optics.
His Measurement uncertainty study incorporates themes from Algorithm, Software, Monte Carlo method and Uncertainty analysis.
He most often published in these fields:
- Electronic engineering (45.10%)
- Calibration (31.37%)
- NIST (26.67%)
What were the highlights of his more recent work (between 2016-2020)?
- Calibration (31.37%)
- Electronic engineering (45.10%)
- NIST (26.67%)
In recent papers he was focusing on the following fields of study:
His primary scientific interests are in Calibration, Electronic engineering, NIST, Measurement uncertainty and Column.
His Calibration research integrates issues from Characterization, Scattering parameters, Microwave and Radio frequency.
He focuses mostly in the field of Scattering parameters, narrowing it down to topics relating to Port and, in certain cases, Equivalence, Mathematical analysis and Electrical impedance.
The study incorporates disciplines such as Signal, Amplifier, Communication channel and Dielectric in addition to Electronic engineering.
His studies in NIST integrate themes in fields like Wireless, Computer hardware, Optics, Traceability and Testbed.
Dylan F. Williams has researched Measurement uncertainty in several fields, including Uncertainty analysis, Electronic circuit simulation, Heterojunction bipolar transistor, Monte Carlo method and Semiconductor device modeling.
Between 2016 and 2020, his most popular works were:
- Measurement Challenges for 5G and Beyond: An Update from the National Institute of Standards and Technology (21 citations)
- Hybrid Characterization of Nanolitre Dielectric Fluids in a Single Microfluidic Channel Up to 110 GHz (20 citations)
- Waveform metrology: signal measurements in a modulated world (13 citations)
In his most recent research, the most cited papers focused on:
- Statistics
- Electrical engineering
- Operating system
Dylan F. Williams focuses on Electronic engineering, NIST, Calibration, Signal and Measurement uncertainty.
His Electronic engineering study focuses on Dynamic range in particular.
His NIST research incorporates elements of Radio spectrum, Telecommunications, Cellular network and Data transmission, Electrical engineering.
His studies deal with areas such as Optoelectronics, Digital down converter, Radio frequency, Scattering parameters and Network analysis as well as Calibration.
He focuses mostly in the field of Optoelectronics, narrowing it down to matters related to Transmission line and, in some cases, Voltage and Microwave.
The Measurement uncertainty study combines topics in areas such as Antenna measurement, Uncertainty analysis, Antenna efficiency, Optics and Monte Carlo method.
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