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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
42
Citations
6694
World Ranking
4139
National Ranking
1482

Overview

Dylan F. Williams is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on engineering, with a particular emphasis on electrical and electronic engineering. Their subfields of study also include atomic and molecular physics and optics, statistics, probability and uncertainty, biomedical engineering, and aerospace engineering.

The main topics of Williams's research cover a broad range of areas within microwave and millimeter-wave technologies. These include:

  • Radio Frequency Integrated Circuit Design
  • Microwave and Dielectric Measurement Techniques
  • Millimeter-Wave Propagation and Modeling
  • Microwave Engineering and Waveguides
  • Electromagnetic Compatibility and Measurements
  • Photonic and Optical Devices
  • Advanced Fiber Laser Technologies

Williams has contributed to several recent papers in the field. Among these are:

  • Consistency in Monte Carlo Uncertainty Analyses, 2020, published in Metrologia
  • Methodology for Measuring the Frequency Dependence of Multipath Channels Across the Millimeter-Wave Spectrum, 2022, IEEE Open Journal of Antennas and Propagation
  • Precision Millimeter-Wave-Modulated Wideband Source at 92.4 GHz as a Step Toward an Over-the-Air Reference, 2020, IEEE Transactions on Microwave Theory and Techniques
  • Microwave Modeling and Characterization of Superconductive Circuits for Quantum Voltage Standard Applications at 4 K, 2020, IEEE Transactions on Applied Superconductivity
  • Accurate Gain Measurement Technique for Limited Antenna Separations, 2021, IEEE Transactions on Antennas and Propagation

Williams often collaborates with a set of frequent co-authors, which include:

  • Kate A. Remley
  • Jérôme Chéron
  • Benjamin F. Jamroz
  • A. Feldman
  • Peter H. Aaen

Their work has been published regularly in several established venues, such as:

  • IEEE Microwave Magazine
  • IEEE Transactions on Microwave Theory and Techniques
  • IEEE Microwave and Wireless Technology Letters
  • IEEE Transactions on Antennas and Propagation
  • IEEE Open Journal of Antennas and Propagation

Best Publications

  • Characteristic impedance determination using propagation constant measurement

    R.B. Marks;D.F. Williams

  • A General Waveguide Circuit Theory.

    Roger B Marks;Dylan F Williams

  • Transmission line capacitance measurement

    D.F. Williams;R.B. Marks

  • Comparison of On-Wafer Calibrations

    Dylan F. Williams;Roger B. Marks;Andrew Davidson

  • Design and Performance of Coplanar Waveguide Bandpass Filters

    D.F. Williams;S.E. Schwarz

  • Accurate transmission line characterization

    D.F. Williams;R.B. Marks

  • An optimal vector-network-analyzer calibration algorithm

    D.F. Williams;J.C.M. Wang;U. Arz

  • A Statistical Study of De-Embedding Applied to Eye Diagram Analysis

    P. D. Hale;J. Jargon;C. M. J. Wang;B. Grossman

  • Calibrated measurement of optoelectronic frequency response

    P.D. Hale;D.F. Williams

  • Calibration of sampling oscilloscopes with high-speed photodiodes

    T.S. Clement;P.D. Hale;D.F. Williams;C.M. Wang

  • Permittivity characterization of low-k thin films from transmission-line measurements

    M.D. Janezic;D.F. Williams;V. Blaschke;A. Karamcheti

  • Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes

    P.D. Hale;C.M. Wang;D.F. Williams;K.A. Remley

  • An optimal multiline TRL calibration algorithm

    D.F. Williams;C.M. Wang;U. Arz

  • Linearization of large-signal scattering functions

    J. Verspecht;D.F. Williams;D. Schreurs;K.A. Remley

  • Covariance-Based Vector-Network-Analyzer Uncertainty Analysis for Time- and Frequency-Domain Measurements

    Arkadiusz Lewandowski;Dylan F Williams;Paul D Hale;Jack C M Wang

  • Covariance-based uncertainty analysis of the NIST electrooptic sampling system

    D.F. Williams;A. Lewandowski;T.S. Clement;J.C.M. Wang

  • 500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

    Dylan F. Williams

  • LRM probe-tip calibrations using nonideal standards

    D.F. Williams;R.B. Marks

  • Accurate Characteristic Impedance Measurement on Silicon

    Dylan F. Williams;Uwe Arz;Hartmut Grabinski

  • Configuring and Verifying Reverberation Chambers for Testing Cellular Wireless Devices

    Kate A. Remley;Jos Dortmans;Catherine Weldon;Robert D. Horansky

  • Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes

    Paul D. Hale;C. M. Wang;Dylan F. Williams;Catherine A. Remley

Frequent Co-Authors

Christopher L. Holloway
Christopher L. Holloway National Institute of Standards and Technology
Amir Mortazawi
Amir Mortazawi University of Michigan–Ann Arbor
Miguel Urteaga
Miguel Urteaga Teledyne Technologies (United States)
Sorin P. Voinigescu
Sorin P. Voinigescu University of Toronto
Harish Krishnaswamy
Harish Krishnaswamy Columbia University
Zhongxiang Shen
Zhongxiang Shen Nanyang Technological University
Nuno Borges Carvalho
Nuno Borges Carvalho University of Aveiro
Andreas F. Molisch
Andreas F. Molisch University of Southern California
Samuel P. Benz
Samuel P. Benz National Institute of Standards and Technology

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