2026 Dylan F. Williams: Electronics and Electrical Engineering Researcher – H-Index, Publications & Awards

Discipline name	D-Index	World Ranking	Current World Ranking	National Ranking	Current National Ranking	Publications	Citations
Electronics and Electrical Engineering	42	4139	3974	1483	1387	285	6694

Dylan F. Williams publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Dylan F. Williams sits on this spectrum.

34 publications 1,065+

This scientist: 285 publications — 54th percentile

54% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Dylan F. Williams D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Dylan F. Williams sits on this spectrum.

30 D-Index 111+

This scientist: 42 D-Index — 42nd percentile

42% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Dylan F. Williams is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on engineering, with a particular emphasis on electrical and electronic engineering. Their subfields of study also include atomic and molecular physics and optics, statistics, probability and uncertainty, biomedical engineering, and aerospace engineering.

The main topics of Williams's research cover a broad range of areas within microwave and millimeter-wave technologies. These include:

Radio Frequency Integrated Circuit Design
Microwave and Dielectric Measurement Techniques
Millimeter-Wave Propagation and Modeling
Microwave Engineering and Waveguides
Electromagnetic Compatibility and Measurements
Photonic and Optical Devices
Advanced Fiber Laser Technologies

Williams has contributed to several recent papers in the field. Among these are:

Consistency in Monte Carlo Uncertainty Analyses, 2020, published in Metrologia
Methodology for Measuring the Frequency Dependence of Multipath Channels Across the Millimeter-Wave Spectrum, 2022, IEEE Open Journal of Antennas and Propagation
Precision Millimeter-Wave-Modulated Wideband Source at 92.4 GHz as a Step Toward an Over-the-Air Reference, 2020, IEEE Transactions on Microwave Theory and Techniques
Microwave Modeling and Characterization of Superconductive Circuits for Quantum Voltage Standard Applications at 4 K, 2020, IEEE Transactions on Applied Superconductivity
Accurate Gain Measurement Technique for Limited Antenna Separations, 2021, IEEE Transactions on Antennas and Propagation

Williams often collaborates with a set of frequent co-authors, which include:

Kate A. Remley
Jérôme Chéron
Benjamin F. Jamroz
A. Feldman
Peter H. Aaen

Their work has been published regularly in several established venues, such as:

IEEE Microwave Magazine
IEEE Transactions on Microwave Theory and Techniques
IEEE Microwave and Wireless Technology Letters
IEEE Transactions on Antennas and Propagation
IEEE Open Journal of Antennas and Propagation

Best Publications

Characteristic impedance determination using propagation constant measurement

R.B. Marks;D.F. Williams

478
Citations
A General Waveguide Circuit Theory.

Roger B Marks;Dylan F Williams

446
Citations
Transmission line capacitance measurement

D.F. Williams;R.B. Marks

276
Citations
Comparison of On-Wafer Calibrations

Dylan F. Williams;Roger B. Marks;Andrew Davidson

274
Citations
Design and Performance of Coplanar Waveguide Bandpass Filters

D.F. Williams;S.E. Schwarz

198
Citations
Accurate transmission line characterization

D.F. Williams;R.B. Marks

164
Citations
An optimal vector-network-analyzer calibration algorithm

D.F. Williams;J.C.M. Wang;U. Arz

163
Citations
A Statistical Study of De-Embedding Applied to Eye Diagram Analysis

P. D. Hale;J. Jargon;C. M. J. Wang;B. Grossman

156
Citations
Calibrated measurement of optoelectronic frequency response

P.D. Hale;D.F. Williams

134
Citations
Calibration of sampling oscilloscopes with high-speed photodiodes

T.S. Clement;P.D. Hale;D.F. Williams;C.M. Wang

123
Citations
Permittivity characterization of low-k thin films from transmission-line measurements

M.D. Janezic;D.F. Williams;V. Blaschke;A. Karamcheti

113
Citations
Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes

P.D. Hale;C.M. Wang;D.F. Williams;K.A. Remley

112
Citations
An optimal multiline TRL calibration algorithm

D.F. Williams;C.M. Wang;U. Arz

111
Citations
Linearization of large-signal scattering functions

J. Verspecht;D.F. Williams;D. Schreurs;K.A. Remley

103
Citations
Covariance-Based Vector-Network-Analyzer Uncertainty Analysis for Time- and Frequency-Domain Measurements

Arkadiusz Lewandowski;Dylan F Williams;Paul D Hale;Jack C M Wang

103
Citations
Covariance-based uncertainty analysis of the NIST electrooptic sampling system

D.F. Williams;A. Lewandowski;T.S. Clement;J.C.M. Wang

97
Citations
500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

Dylan F. Williams

92
Citations
LRM probe-tip calibrations using nonideal standards

D.F. Williams;R.B. Marks

88
Citations
Accurate Characteristic Impedance Measurement on Silicon

Dylan F. Williams;Uwe Arz;Hartmut Grabinski

83
Citations
Configuring and Verifying Reverberation Chambers for Testing Cellular Wireless Devices

Kate A. Remley;Jos Dortmans;Catherine Weldon;Robert D. Horansky

74
Citations
Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes

Paul D. Hale;C. M. Wang;Dylan F. Williams;Catherine A. Remley

1
Citations

Frequent Co-Authors

Kate A. Remley National Institute of Standards and Technology

Dominique Schreurs KU Leuven

Christopher L. Holloway National Institute of Standards and Technology

Amir Mortazawi University of Michigan–Ann Arbor

Miguel Urteaga Teledyne Technologies (United States)

Harish Krishnaswamy Columbia University

Nuno Borges Carvalho University of Aveiro

Sorin P. Voinigescu University of Toronto

Nada Golmie National Institute of Standards and Technology

Zhongxiang Shen Nanyang Technological University

External Links

Personal website of Dylan F. Williams Google Scholar page

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