World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
36
Citations
6163
World Ranking
5311
National Ranking
114

Yves Rolain publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Yves Rolain sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 486 publications — 83rd percentile

83% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Yves Rolain D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Yves Rolain sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 36 D-Index — 24th percentile

24% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2006 - IEEE Fellow For contributions to measurement and modeling of nonlinear microwave devices.

Overview

Yves Rolain is affiliated with Vrije Universiteit Brussel in Belgium and has a research focus predominantly in engineering, with significant contributions to electrical and electronic engineering. The scientist's work encompasses several areas within these fields, including aerospace engineering, atomic and molecular physics and optics, pulmonary and respiratory medicine, and biomedical engineering.

The research topics addressed in their publications span:

  • Microwave Engineering and Waveguides
  • Radio Frequency Integrated Circuit Design
  • Electromagnetic Compatibility and Noise Suppression
  • Microwave and Dielectric Measurement Techniques
  • Electromagnetic Compatibility and Measurements
  • Advanced Antenna and Metasurface Technologies
  • Antenna Design and Analysis

The scientist's frequent publication venues include:

  • IEEE Transactions on Instrumentation and Measurement
  • IEEE Transactions on Microwave Theory and Techniques
  • Additive Manufacturing
  • IEEE Transactions on Dielectrics and Electrical Insulation
  • Microwave and Optical Technology Letters

Notable recent papers include:

  • Adaptive Excitation Signals for Low-Frequency Forced Oscillation Technique Measurements in Patients, 2021, IEEE Transactions on Instrumentation and Measurement
  • Direct Electrodeposition on Conductive Polymer Structures for Microwave Device Manufacturing, 2024, Additive Manufacturing
  • Adaptive Frequency Sampling Based on Local Rational Modeling for Microwave Electromagnetic Simulations, 2024, IEEE Transactions on Microwave Theory and Techniques
  • Forced Oscillation Technique Measurement Apparatus Using Fan-Speaker Hybrid, 2022, IEEE Transactions on Instrumentation and Measurement
  • Equivalent Modeling of Multilayered Conductive Composite Materials for EMI Shielding Applications, 2025, IEEE Transactions on Dielectrics and Electrical Insulation

Yves Rolain has collaborated frequently with several co-authors, among whom are Dries Peumans, Gerd Vandersteen, Francesco Ferranti, Cedric Busschots, and Sander De Keersmaeker. Dries Peumans appears as the most frequent collaborator.

In recognition of contributions to the field, the scientist was named an IEEE Fellow in 2006 for work related to measurement and modeling of nonlinear microwave devices.

Best Publications

  • Parametric identification of transfer functions in the frequency domain-a survey

    R. Pintelon;P. Guillaume;Y. Rolain;J. Schoukens

  • Identification of linear systems with nonlinear distortions

    J. Schoukens;R. Pintelon;T. Dobrowiecki;Y. Rolain

  • Low-Area Active-Feedback Low-Noise Amplifier Design in Scaled Digital CMOS

    J. Borremans;P. Wambacq;C. Soens;Y. Rolain

  • A 52 GHz Phased-Array Receiver Front-End in 90 nm Digital CMOS

    K. Scheir;S. Bronckers;J. Borremans;P. Wambacq

  • Brief Fast approximate identification of nonlinear systems

    J. Schoukens;J. G. Nemeth;P. Crama;Y. Rolain

  • A 57-to-66GHz quadrature PLL in 45nm digital CMOS

    K. Scheir;G. Vandersteen;Y. Rolain;P. Wambacq

  • Mastering System Identification in 100 Exercises

    J. Schoukens;R. Pintelon;Yves Rolain

  • Best conditioned parametric identification of transfer function models in the frequency domain

    Y. Rolain;R. Pintelon;K.Q. Xu;H. Vold

  • Brief Frequency response function measurements in the presence of nonlinear distortions

    J. Schoukens;R. Pintelon;Y. Rolain;T. Dobrowiecki

  • Analysis of windowing/leakage effects in frequency response function measurements

    J. Schoukens;Y. Rolain;R. Pintelon

  • Fully automated spectral analysis of periodic signals

    J. Schoukens;Y. Rolain;G. Simon;R. Pintelon

  • Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations

    R. Pintelon;G. Vandersteen;Ludwig De Locht;Y. Rolain

  • Parametric Identification of Parallel Hammerstein Systems

    M. Schoukens;R. Pintelon;Y. Rolain

  • A large-signal network analyzer: Why is it needed?

    Unknown

  • Improved (non-)parametric identification of dynamic systems excited by periodic signals—The multivariate case

    Rik Pintelon;Gerd Vandersteen;Joannes Schoukens;Yves Rolain

  • Towards an ideal data acquisition channel

    R. Pintelon;Y. Rolain;M.V. Bossche;J. Schoukens

  • Multirate Cascaded Discrete-Time Low-Pass ΔΣ Modulator for GSM/Bluetooth/UMTS

    Lynn Bos;Gerd Vandersteen;Pieter Rombouts;Arnd Geis

  • Brief Box-Jenkins continuous-time modeling

    R. Pintelon;J. Schoukens;Y. Rolain

  • Identification of Wiener-Hammerstein systems by a nonparametric separation of the best linear approximation

    Maarten Schoukens;Rik Pintelon;Yves Rolain

  • Broadband versus stepped sine FRF measurements

    J. Schoukens;R.M. Pintelon;Y.J. Rolain

  • Frequency Response Function Measurements in the Presence of Nonlinear Distortions

    J. Schoukens;R. Pintelon;Y. Rolain;T. Dobrowiecki

Frequent Co-Authors

Rik Pintelon
Rik Pintelon Vrije Universiteit Brussel
Gerd Vandersteen
Gerd Vandersteen Vrije Universiteit Brussel
Johan Schoukens
Johan Schoukens Eindhoven University of Technology
Piet Wambacq
Piet Wambacq Vrije Universiteit Brussel
Patrick Guillaume
Patrick Guillaume Vrije Universiteit Brussel
Tom Dhaene
Tom Dhaene Ghent University

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