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D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Materials Science 58 7548 7297 1864 1726 295 20847

J. M. Gibson publications per year

The chart shows the history of publications by J. M. Gibson between 1978 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. J. M. Gibson published across 48 years, from 1978 to 2025, averaging 6.7 papers a year. Output peaked at 24 publications in 1997. 8 of the 320 publications appeared in the last two years.

No. of publications
5 10 15 20
Bar chart. Horizontal axis: year, 1978 to 2025. Vertical axis: number of publications, 0 to 24. Peak 24 publications in 1997. 1978: 1 publication 1979: 0 publications 1980: 3 publications 1981: 4 publications 1982: 5 publications 1983: 15 publications 1984: 11 publications 1985: 20 publications 1986: 19 publications 1987: 18 publications 1988: 5 publications 1989: 19 publications 1990: 9 publications 1991: 7 publications 1992: 4 publications 1993: 4 publications 1994: 7 publications 1995: 9 publications 1996: 12 publications 1997: 24 publications 1998: 21 publications 1999: 20 publications 2000: 19 publications 2001: 13 publications 2002: 2 publications 2003: 7 publications 2004: 7 publications 2005: 5 publications 2006: 2 publications 2007: 5 publications 2008: 2 publications 2009: 2 publications 2010: 1 publication 2011: 0 publications 2012: 2 publications 2013: 0 publications 2014: 0 publications 2015: 0 publications 2016: 0 publications 2017: 1 publication 2018: 1 publication 2019: 0 publications 2020: 0 publications 2021: 0 publications 2022: 5 publications 2023: 1 publication 2024: 2 publications 2025: 6 publications
1978 2025

320 publications in total across all disciplines

View publications per year as a table
J. M. Gibson: publications per year, 1978 to 2025
Year Publications
1978 1
1979 0
1980 3
1981 4
1982 5
1983 15
1984 11
1985 20
1986 19
1987 18
1988 5
1989 19
1990 9
1991 7
1992 4
1993 4
1994 7
1995 9
1996 12
1997 24
1998 21
1999 20
2000 19
2001 13
2002 2
2003 7
2004 7
2005 5
2006 2
2007 5
2008 2
2009 2
2010 1
2011 0
2012 2
2013 0
2014 0
2015 0
2016 0
2017 1
2018 1
2019 0
2020 0
2021 0
2022 5
2023 1
2024 2
2025 6
Total 320
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J. M. Gibson publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where J. M. Gibson sits on this spectrum.

No. of scientists
200 400 600 800
Bar chart with 57 bars. Horizontal axis: publications, 50–69 to 1,163+. Vertical axis: number of scientists, 0 to 891. Most scientists, 891, have 190–209 publications. The last bar groups every scientist with 1,163 publications or more. The highlighted bar, 290–309 publications, is where this scientist sits. 50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50–69 publications 1,163+

This scientist: 295 publications — 59th percentile

59% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

View publications distribution as a table
Number of Materials Science scientists by publication count, Research.com 2026 ranking edition. Based on 12,847 ranked scientists.
Publications Scientists This scientist
50–69 28
70–89 152
90–109 356
110–129 487
130–149 723
150–169 835
170–189 850
190–209 891
210–229 862
230–249 766
250–269 726
270–289 665
290–309 593 295
310–329 537
330–349 477
350–369 440
370–389 356
390–409 321
410–429 256
430–449 246
450–469 216
470–489 212
490–509 174
510–529 194
530–549 162
550–569 131
570–589 111
590–609 103
610–629 99
630–649 77
650–669 92
670–689 56
690–709 53
710–729 53
730–749 38
750–769 52
770–789 43
790–809 38
810–829 34
830–849 25
850–869 18
870–889 20
890–909 24
910–929 27
930–949 20
950–969 17
970–989 10
990–1,009 16
1,010–1,029 13
1,030–1,049 12
1,050–1,069 9
1,070–1,089 8
1,090–1,109 7
1,110–1,129 9
1,130–1,149 2
1,150–1,162 5
1,163+ 100
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J. M. Gibson D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where J. M. Gibson sits on this spectrum.

No. of scientists
200 400 600
Bar chart with 64 bars. Horizontal axis: D-Index, 40–41 to 165+. Vertical axis: number of scientists, 0 to 667. Most scientists, 667, have 52–53 D-Index. The last bar groups every scientist with 165 D-Index or more. The highlighted bar, 58–59 D-Index, is where this scientist sits. 40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40–41 D-Index 165+

This scientist: 58 D-Index — 41st percentile

41% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

View D-Index distribution as a table
Number of Materials Science scientists by D-index, Research.com 2026 ranking edition. Based on 12,847 ranked scientists.
D-Index Scientists This scientist
40–41 211
42–43 450
44–45 612
46–47 612
48–49 598
50–51 657
52–53 667
54–55 621
56–57 597
58–59 610 58
60–61 587
62–63 606
64–65 533
66–67 490
68–69 469
70–71 378
72–73 421
74–75 359
76–77 323
78–79 299
80–81 230
82–83 210
84–85 195
86–87 203
88–89 175
90–91 175
92–93 142
94–95 121
96–97 117
98–99 107
100–101 88
102–103 85
104–105 68
106–107 62
108–109 57
110–111 45
112–113 49
114–115 50
116–117 34
118–119 38
120–121 37
122–123 29
124–125 28
126–127 24
128–129 33
130–131 28
132–133 21
134–135 20
136–137 23
138–139 17
140–141 12
142–143 17
144–145 21
146–147 13
148–149 11
150–151 14
152–153 13
154–155 9
156–157 10
158–159 7
160–161 4
162–163 4
164 3
165+ 98
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Research.com Recognitions

  • 1989 - Fellow of American Physical Society (APS) Citation For uses of electron microscopy of elucidate the relation between atomic structure and physical properties in condensed matter systems
  • 1986 - Burton Medal, Mineralogical Society of America

Overview

J. M. Gibson is affiliated with Northeastern University in the United States, focusing primarily on research within the fields of Materials Science and Engineering. Their work encompasses subfields such as Atomic and Molecular Physics, and Optics; Structural Biology; Surfaces, Coatings and Films; Materials Chemistry; and Biomedical Engineering.

The scientist's research concentrates on several key topics, including:

  • Advanced Electron Microscopy Techniques and Applications
  • Electron and X-Ray Spectroscopy Techniques
  • Surface and Thin Film Phenomena
  • Atomic and Subatomic Physics Research
  • Magnetic and transport properties of perovskites and related materials
  • Functional Brain Connectivity Studies
  • Thin-Film Transistor Technologies

Gibson has contributed to several recent scientific publications:

  • "Determining sensor geometry and gain in a wearable MEG system," 2025, Imaging Neuroscience
  • "Determining sensor geometry and gain in a wearable MEG system," 2024, arXiv (Cornell University)
  • "Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of Noise," 2025, Microscopy and Microanalysis
  • "Self-ion implantation and structural relaxation in amorphous silicon," 2025, Journal of Applied Physics
  • "Rapid-Acquisition FEM - Grappling the Noise," 2023, Microscopy and Microanalysis

Their frequent collaborators include several researchers with whom they have multiple coauthored papers. Among these are M.M.J. Treacy, Rafal E. Dunin-Borkowski, Aram Rezikyan, Ryan M. Hill, and G. Rivero.

Gibson's work has appeared in multiple journals, with notable frequent publication venues being:

  • Microscopy and Microanalysis
  • Imaging Neuroscience
  • Journal of Applied Physics
  • arXiv (Cornell University)
  • Journal of Biological Chemistry

Throughout their career, Gibson has received recognition from established organizations. They were awarded the Fellow of American Physical Society (APS) in 1989 for contributions involving electron microscopy to elucidate the relation between atomic structure and physical properties in condensed matter systems. Additionally, Gibson received the Burton Medal from the Mineralogical Society of America in 1986.

Best Publications

  • Exceptionally high Young's modulus observed for individual carbon nanotubes

    M. M. J. Treacy;T. W. Ebbesen;J. M. Gibson

  • Surface derivatization and isolation of semiconductor cluster molecules

    M. L. Steigerwald;A. P. Alivisatos;J. M. Gibson;T. D. Harris

  • Size effects in the excited electronic states of small colloidal CdS crystallites

    R. Rossetti;J. L. Ellison;J. M. Gibson;L. E. Brus

  • Excited electronic states and optical spectra of ZnS and CdS crystallites in the ≊15 to 50 Å size range: Evolution from molecular to bulk semiconducting properties

    R. Rossetti;R. Hull;J. M. Gibson;L. E. Brus

  • Mesotaxy: single-crystal growth of buried CoSi2 layers

    Alice E. White;K. T. Short;R. C. Dynes;J. P. Garno

  • Interpretation of the Raman spectra of ultrananocrystalline diamond

    James Birrell;J.E. Gerbi;O. Auciello;J.M. Gibson

  • Bonding structure in nitrogen doped ultrananocrystalline diamond

    James Birrell;J. E. Gerbi;O. Auciello;J. M. Gibson

  • Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials

    M.M.J. Treacy;J.M. Gibson

  • On elastic relaxation and long wavelength microstructures in spinodally decomposed InxGa1-x.AsyP1-y epitaxial layers

    M. M. J. Treacy;J. M. Gibson;A. Howie

  • Growth of single‐crystal CoSi2 on Si(111)

    R. T. Tung;J. C. Bean;J. M. Gibson;J. M. Poate

  • Morphology and electronic structure in nitrogen-doped ultrananocrystalline diamond

    James Birrell;J. A. Carlisle;O. Auciello;D. M. Gruen

  • Transistor action in Si/CoSi2/Si heterostructures

    J. C. Hensel;A. F. J. Levi;R. T. Tung;J. M. Gibson

  • Hybrid electronic properties between the molecular and solid state limits: Lead sulfide and silver halide crystallites

    R. Rossetti;R. Hull;J. M. Gibson;L. E. Brus

  • Self-limiting oxidation of copper

    J. C. Yang;B. Kolasa;J. M. Gibson;M. Yeadon

  • Diminished Medium-Range Order Observed in Annealed Amorphous Germanium

    J. M. Gibson;M. M. J. Treacy

  • Paracrystallites found in evaporated amorphous tetrahedral semiconductors

    M.M.J Treacy;J.M Gibson;P.J Keblinski

  • New approach to projection-electron lithography with demonstrated 0.1 μm linewidth

    S. D. Berger;J. M. Gibson

  • Stability of semiconductor strained‐layer superlattices

    R. Hull;J. C. Bean;F. Cerdeira;A. T. Fiory

  • Growth of single crystal epitaxial silicides on silicon by the use of template layers

    R. T. Tung;J. M. Gibson;J. M. Poate

  • High quality Si‐on‐SiO2 films by large dose oxygen implantation and lamp annealing

    George Celler;P. L.F. Hemment;K. W. West;J. M. Gibson

  • Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures

    R. T. Tung;J. M. Gibson;J. M. Poate

Frequent Co-Authors

Paul M. Voyles
Paul M. Voyles University of Wisconsin–Madison
Robert S Averback
Robert S Averback University of Illinois at Urbana-Champaign
Raymond T. Tung
Raymond T. Tung City University of New York
John R. Abelson
John R. Abelson University of Illinois at Urbana-Champaign
John M. Poate
John M. Poate Nokia (United States)
Robert Hull
Robert Hull Rensselaer Polytechnic Institute
Louis E. Brus
Louis E. Brus Columbia University
Judith C. Yang
Judith C. Yang Brookhaven National Laboratory
John C. Bean
John C. Bean University of Virginia
A. F. J. Levi
A. F. J. Levi University of Southern California

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