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Materials Science

D-Index
58
Citations
20847
World Ranking
7550
National Ranking
1866

Research.com Recognitions

  • 1989 - Fellow of American Physical Society (APS) Citation For uses of electron microscopy of elucidate the relation between atomic structure and physical properties in condensed matter systems
  • 1986 - Burton Medal, Mineralogical Society of America

Overview

J. M. Gibson is affiliated with Northeastern University in the United States, focusing primarily on research within the fields of Materials Science and Engineering. Their work encompasses subfields such as Atomic and Molecular Physics, and Optics; Structural Biology; Surfaces, Coatings and Films; Materials Chemistry; and Biomedical Engineering.

The scientist's research concentrates on several key topics, including:

  • Advanced Electron Microscopy Techniques and Applications
  • Electron and X-Ray Spectroscopy Techniques
  • Surface and Thin Film Phenomena
  • Atomic and Subatomic Physics Research
  • Magnetic and transport properties of perovskites and related materials
  • Functional Brain Connectivity Studies
  • Thin-Film Transistor Technologies

Gibson has contributed to several recent scientific publications:

  • "Determining sensor geometry and gain in a wearable MEG system," 2025, Imaging Neuroscience
  • "Determining sensor geometry and gain in a wearable MEG system," 2024, arXiv (Cornell University)
  • "Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of Noise," 2025, Microscopy and Microanalysis
  • "Self-ion implantation and structural relaxation in amorphous silicon," 2025, Journal of Applied Physics
  • "Rapid-Acquisition FEM - Grappling the Noise," 2023, Microscopy and Microanalysis

Their frequent collaborators include several researchers with whom they have multiple coauthored papers. Among these are M.M.J. Treacy, Rafal E. Dunin-Borkowski, Aram Rezikyan, Ryan M. Hill, and G. Rivero.

Gibson's work has appeared in multiple journals, with notable frequent publication venues being:

  • Microscopy and Microanalysis
  • Imaging Neuroscience
  • Journal of Applied Physics
  • arXiv (Cornell University)
  • Journal of Biological Chemistry

Throughout their career, Gibson has received recognition from established organizations. They were awarded the Fellow of American Physical Society (APS) in 1989 for contributions involving electron microscopy to elucidate the relation between atomic structure and physical properties in condensed matter systems. Additionally, Gibson received the Burton Medal from the Mineralogical Society of America in 1986.

Best Publications

  • Exceptionally high Young's modulus observed for individual carbon nanotubes

    M. M. J. Treacy;T. W. Ebbesen;J. M. Gibson

  • Surface derivatization and isolation of semiconductor cluster molecules

    M. L. Steigerwald;A. P. Alivisatos;J. M. Gibson;T. D. Harris

  • Size effects in the excited electronic states of small colloidal CdS crystallites

    R. Rossetti;J. L. Ellison;J. M. Gibson;L. E. Brus

  • Excited electronic states and optical spectra of ZnS and CdS crystallites in the ≊15 to 50 Å size range: Evolution from molecular to bulk semiconducting properties

    R. Rossetti;R. Hull;J. M. Gibson;L. E. Brus

  • Mesotaxy: single-crystal growth of buried CoSi2 layers

    Alice E. White;K. T. Short;R. C. Dynes;J. P. Garno

  • Interpretation of the Raman spectra of ultrananocrystalline diamond

    James Birrell;J.E. Gerbi;O. Auciello;J.M. Gibson

  • Bonding structure in nitrogen doped ultrananocrystalline diamond

    James Birrell;J. E. Gerbi;O. Auciello;J. M. Gibson

  • Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials

    M.M.J. Treacy;J.M. Gibson

  • On elastic relaxation and long wavelength microstructures in spinodally decomposed InxGa1-x.AsyP1-y epitaxial layers

    M. M. J. Treacy;J. M. Gibson;A. Howie

  • Growth of single‐crystal CoSi2 on Si(111)

    R. T. Tung;J. C. Bean;J. M. Gibson;J. M. Poate

  • Morphology and electronic structure in nitrogen-doped ultrananocrystalline diamond

    James Birrell;J. A. Carlisle;O. Auciello;D. M. Gruen

  • Transistor action in Si/CoSi2/Si heterostructures

    J. C. Hensel;A. F. J. Levi;R. T. Tung;J. M. Gibson

  • Hybrid electronic properties between the molecular and solid state limits: Lead sulfide and silver halide crystallites

    R. Rossetti;R. Hull;J. M. Gibson;L. E. Brus

  • Self-limiting oxidation of copper

    J. C. Yang;B. Kolasa;J. M. Gibson;M. Yeadon

  • Diminished Medium-Range Order Observed in Annealed Amorphous Germanium

    J. M. Gibson;M. M. J. Treacy

  • Paracrystallites found in evaporated amorphous tetrahedral semiconductors

    M.M.J Treacy;J.M Gibson;P.J Keblinski

  • New approach to projection-electron lithography with demonstrated 0.1 μm linewidth

    S. D. Berger;J. M. Gibson

  • Stability of semiconductor strained‐layer superlattices

    R. Hull;J. C. Bean;F. Cerdeira;A. T. Fiory

  • Growth of single crystal epitaxial silicides on silicon by the use of template layers

    R. T. Tung;J. M. Gibson;J. M. Poate

  • High quality Si‐on‐SiO2 films by large dose oxygen implantation and lamp annealing

    George Celler;P. L.F. Hemment;K. W. West;J. M. Gibson

  • Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures

    R. T. Tung;J. M. Gibson;J. M. Poate

Frequent Co-Authors

Paul M. Voyles
Paul M. Voyles University of Wisconsin–Madison
Robert S Averback
Robert S Averback University of Illinois at Urbana-Champaign
Raymond T. Tung
Raymond T. Tung City University of New York
John R. Abelson
John R. Abelson University of Illinois at Urbana-Champaign
John M. Poate
John M. Poate Nokia (United States)
Robert Hull
Robert Hull Rensselaer Polytechnic Institute
Louis E. Brus
Louis E. Brus Columbia University
Judith C. Yang
Judith C. Yang Brookhaven National Laboratory
John C. Bean
John C. Bean University of Virginia
A. F. J. Levi
A. F. J. Levi University of Southern California

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