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D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Materials Science 49 10483 10125 2489 2310 335 9478

Paul M. Voyles publications per year

The chart shows the history of publications by Paul M. Voyles between 1995 and 2026, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Paul M. Voyles published across 32 years, from 1995 to 2026, averaging 11.6 papers a year. Output peaked at 23 publications in 2012. 16 of the 372 publications appeared in the last two years.

No. of publications
5 10 15 20
Bar chart. Horizontal axis: year, 1995 to 2026. Vertical axis: number of publications, 0 to 23. Peak 23 publications in 2012. 1995: 1 publication 1996: 2 publications 1997: 0 publications 1998: 6 publications 1999: 5 publications 2000: 10 publications 2001: 10 publications 2002: 4 publications 2003: 13 publications 2004: 7 publications 2005: 6 publications 2006: 10 publications 2007: 14 publications 2008: 11 publications 2009: 12 publications 2010: 7 publications 2011: 15 publications 2012: 23 publications 2013: 12 publications 2014: 12 publications 2015: 18 publications 2016: 18 publications 2017: 21 publications 2018: 17 publications 2019: 15 publications 2020: 17 publications 2021: 19 publications 2022: 14 publications 2023: 18 publications 2024: 19 publications 2025: 12 publications 2026: 4 publications
1995 2026

372 publications in total across all disciplines

View publications per year as a table
Paul M. Voyles: publications per year, 1995 to 2026
Year Publications
1995 1
1996 2
1997 0
1998 6
1999 5
2000 10
2001 10
2002 4
2003 13
2004 7
2005 6
2006 10
2007 14
2008 11
2009 12
2010 7
2011 15
2012 23
2013 12
2014 12
2015 18
2016 18
2017 21
2018 17
2019 15
2020 17
2021 19
2022 14
2023 18
2024 19
2025 12
2026 4
Total 372
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Paul M. Voyles publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Paul M. Voyles sits on this spectrum.

No. of scientists
200 400 600 800
Bar chart with 57 bars. Horizontal axis: publications, 50–69 to 1,163+. Vertical axis: number of scientists, 0 to 891. Most scientists, 891, have 190–209 publications. The last bar groups every scientist with 1,163 publications or more. The highlighted bar, 330–349 publications, is where this scientist sits. 50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50–69 publications 1,163+

This scientist: 335 publications — 67th percentile

67% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

View publications distribution as a table
Number of Materials Science scientists by publication count, Research.com 2026 ranking edition. Based on 12,847 ranked scientists.
Publications Scientists This scientist
50–69 28
70–89 152
90–109 356
110–129 487
130–149 723
150–169 835
170–189 850
190–209 891
210–229 862
230–249 766
250–269 726
270–289 665
290–309 593
310–329 537
330–349 477 335
350–369 440
370–389 356
390–409 321
410–429 256
430–449 246
450–469 216
470–489 212
490–509 174
510–529 194
530–549 162
550–569 131
570–589 111
590–609 103
610–629 99
630–649 77
650–669 92
670–689 56
690–709 53
710–729 53
730–749 38
750–769 52
770–789 43
790–809 38
810–829 34
830–849 25
850–869 18
870–889 20
890–909 24
910–929 27
930–949 20
950–969 17
970–989 10
990–1,009 16
1,010–1,029 13
1,030–1,049 12
1,050–1,069 9
1,070–1,089 8
1,090–1,109 7
1,110–1,129 9
1,130–1,149 2
1,150–1,162 5
1,163+ 100
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Paul M. Voyles D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Paul M. Voyles sits on this spectrum.

No. of scientists
200 400 600
Bar chart with 64 bars. Horizontal axis: D-Index, 40–41 to 165+. Vertical axis: number of scientists, 0 to 667. Most scientists, 667, have 52–53 D-Index. The last bar groups every scientist with 165 D-Index or more. The highlighted bar, 48–49 D-Index, is where this scientist sits. 40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40–41 D-Index 165+

This scientist: 49 D-Index — 19th percentile

19% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

View D-Index distribution as a table
Number of Materials Science scientists by D-index, Research.com 2026 ranking edition. Based on 12,847 ranked scientists.
D-Index Scientists This scientist
40–41 211
42–43 450
44–45 612
46–47 612
48–49 598 49
50–51 657
52–53 667
54–55 621
56–57 597
58–59 610
60–61 587
62–63 606
64–65 533
66–67 490
68–69 469
70–71 378
72–73 421
74–75 359
76–77 323
78–79 299
80–81 230
82–83 210
84–85 195
86–87 203
88–89 175
90–91 175
92–93 142
94–95 121
96–97 117
98–99 107
100–101 88
102–103 85
104–105 68
106–107 62
108–109 57
110–111 45
112–113 49
114–115 50
116–117 34
118–119 38
120–121 37
122–123 29
124–125 28
126–127 24
128–129 33
130–131 28
132–133 21
134–135 20
136–137 23
138–139 17
140–141 12
142–143 17
144–145 21
146–147 13
148–149 11
150–151 14
152–153 13
154–155 9
156–157 10
158–159 7
160–161 4
162–163 4
164 3
165+ 98
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Overview

Paul M. Voyles is affiliated with the University of Wisconsin-Madison in the United States. Their research spans multiple areas within materials science and engineering, with a particular focus on microscopy techniques and material properties at the atomic and molecular levels.

The primary fields of study for Voyles include:

  • Materials Science
  • Engineering

Within these fields, their work is concentrated in several subfields:

  • Materials Chemistry
  • Mechanical Engineering
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Voyles' major research topics cover diverse aspects of materials and microscopy such as:

  • Metallic Glasses and Amorphous Alloys
  • Material Dynamics and Properties
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • Machine Learning in Materials Science
  • Theoretical and Computational Physics
  • Phase-change materials and chalcogenides

Some of their recent papers include:

  • "Machine learning in scanning transmission electron microscopy," 2022, Nature Reviews Methods Primers
  • "Supertwisted spirals of layered materials enabled by growth on non-Euclidean surfaces," 2020, Science
  • "Radiation-induced segregation in a ceramic," 2020, Nature Materials
  • "Epitaxy, exfoliation, and strain-induced magnetism in rippled Heusler membranes," 2021, Nature Communications
  • "Memristive Behavior Enabled by Amorphous-Crystalline 2D Oxide Heterostructure," 2020, Advanced Materials

The frequent co-authors with whom Voyles has collaborated most include:

  • Dane Morgan
  • Chenyu Zhang
  • Jingrui Wei
  • Carter Francis
  • Debaditya Chatterjee

Voyles has contributed extensively to several publication venues, with multiple works in:

  • Microscopy and Microanalysis
  • arXiv (Cornell University)
  • Ultramicroscopy
  • The Journal of Chemical Physics
  • Physical Review Materials

Best Publications

  • H2V3O8 Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity

    Qiang Pang;Qiang Pang;Congli Sun;Yanhao Yu;Kangning Zhao

  • Atomic-scale imaging of individual dopant atoms and clusters in highly n -type bulk Si

    P. M. Voyles;D. A. Muller;J. L. Grazul;P. H. Citrin

  • Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

    Andrew B. Yankovich;Benjamin Berkels;W. Dahmen;P. Binev

  • Imaging individual atoms inside crystals with ADF-STEM

    P.M. Voyles;J.L. Grazul;D.A. Muller

  • Nanoscale structure and structural relaxation in Zr50Cu45Al5 bulk metallic glass.

    Jinwoo Hwang;Z. H. Melgarejo;Y. E. Kalay;I. Kalay

  • Stabilization of copper catalysts for liquid-phase reactions by atomic layer deposition.

    Brandon J. O'Neill;David H. K. Jackson;Anthony J. Crisci;Carrie A. Farberow

  • Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition

    M.-Y. Ho;H. Gong;G. D. Wilk;B. W. Busch

  • Fluctuation microscopy in the STEM.

    P.M. Voyles;D.A. Muller

  • Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2

    A. Matsumoto;H. Kumakura;H. Kitaguchi;B. J. Senkowicz

  • High‐Performance, Quantum Dot Nanocomposites for Nonlinear Optical and Optical Gain Applications

    Melissa A. Petruska;Anton V. Malko;Paul M. Voyles;Victor I. Klimov

  • Atom pair persistence in disordered materials from fluctuation microscopy

    J.M Gibson;M.M.J Treacy;P.M Voyles;P.M Voyles

  • Tm3Fe5O12/Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications

    Andy Quindeau;Can O. Avci;Wenqing Liu;Wenqing Liu;Congli Sun

  • Quantitative Measurement of Density in a Shear Band of Metallic Glass Monitored Along its Propagation Direction.

    Vitalij Schmidt;Harald Rösner;Martin Peterlechner;Gerhard Wilde

  • Fast flexible electronics with strained silicon nanomembranes

    Han Zhou;Jung Hun Seo;Deborah M. Paskiewicz;Ye Zhu

  • Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy

    William G. Stratton;Joseph Hamann;John H. Perepezko;Paul M. Voyles

  • Influence of film composition in quaternary Heusler alloy Co2(Mn,Fe)Si thin films on tunnelling magnetoresistance of Co2(Mn,Fe)Si/MgO-based magnetic tunnel junctions

    Hong-xi Liu;Takeshi Kawami;Kidist Moges;Tetsuya Uemura

  • Fluctuation microscopy: a probe of atomic correlations in disordered materials

    P. M. Voyles;J. M. Gibson;M. M. J. Treacy

  • Supertwisted spirals of layered materials enabled by growth on non-Euclidean surfaces.

    Yuzhou Zhao;Chenyu Zhang;Daniel D. Kohler;Jason M. Scheeler

  • Structure and physical properties of paracrystalline atomistic models of amorphous silicon

    P. M. Voyles;P. M. Voyles;N. Zotov;S. M. Nakhmanson;S. M. Nakhmanson;D. A. Drabold

  • Absence of an Abrupt Phase Change from Polycrystalline to Amorphous in Silicon with Deposition Temperature

    P. M. Voyles;P. M. Voyles;J. E. Gerbi;M. M. J. Treacy;J. M. Gibson

  • Medium-range order in amorphous silicon measured by fluctuation electron microscopy

    Paul M. Voyles;John R. Abelson

Frequent Co-Authors

Dane Morgan
Dane Morgan University of Wisconsin–Madison
John R. Abelson
John R. Abelson University of Illinois at Urbana-Champaign
David A. Muller
David A. Muller Cornell University
J. M. Gibson
J. M. Gibson Northeastern University
Jinwoo Hwang
Jinwoo Hwang The Ohio State University
David C. Larbalestier
David C. Larbalestier Florida State University
Ümit Özgür
Ümit Özgür Virginia Commonwealth University
Hadis Morkoç
Hadis Morkoç Virginia Commonwealth University
Matthew J. Kramer
Matthew J. Kramer Ames Laboratory
John H. Perepezko
John H. Perepezko University of Wisconsin–Madison

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