2026 Paul M. Voyles: Materials Science Researcher – H-Index, Publications & Awards

Discipline name	D-Index	World Ranking	Current World Ranking	National Ranking	Current National Ranking	Publications	Citations
Materials Science	49	10485	10128	2492	2314	335	9478

Discipline name

D-Index

World Ranking

Current World Ranking

National Ranking

Current National Ranking

Publications

Citations

Materials Science

10485

10128

2492

2314

335

9478

Overview

Paul M. Voyles is affiliated with the University of Wisconsin-Madison in the United States. Their research spans multiple areas within materials science and engineering, with a particular focus on microscopy techniques and material properties at the atomic and molecular levels.

The primary fields of study for Voyles include:

Materials Science
Engineering

Within these fields, their work is concentrated in several subfields:

Materials Chemistry
Mechanical Engineering
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Condensed Matter Physics

Voyles' major research topics cover diverse aspects of materials and microscopy such as:

Metallic Glasses and Amorphous Alloys
Material Dynamics and Properties
Electron and X-Ray Spectroscopy Techniques
Advanced Electron Microscopy Techniques and Applications
Machine Learning in Materials Science
Theoretical and Computational Physics
Phase-change materials and chalcogenides

Some of their recent papers include:

"Machine learning in scanning transmission electron microscopy," 2022, Nature Reviews Methods Primers
"Supertwisted spirals of layered materials enabled by growth on non-Euclidean surfaces," 2020, Science
"Radiation-induced segregation in a ceramic," 2020, Nature Materials
"Epitaxy, exfoliation, and strain-induced magnetism in rippled Heusler membranes," 2021, Nature Communications
"Memristive Behavior Enabled by Amorphous-Crystalline 2D Oxide Heterostructure," 2020, Advanced Materials

The frequent co-authors with whom Voyles has collaborated most include:

Dane Morgan
Chenyu Zhang
Jingrui Wei
Carter Francis
Debaditya Chatterjee

Voyles has contributed extensively to several publication venues, with multiple works in:

Microscopy and Microanalysis
arXiv (Cornell University)
Ultramicroscopy
The Journal of Chemical Physics
Physical Review Materials

Best Publications

H2V3O8 Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity

Qiang Pang;Qiang Pang;Congli Sun;Yanhao Yu;Kangning Zhao

541
Citations
Atomic-scale imaging of individual dopant atoms and clusters in highly n -type bulk Si

P. M. Voyles;D. A. Muller;J. L. Grazul;P. H. Citrin

540
Citations
Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

Andrew B. Yankovich;Benjamin Berkels;W. Dahmen;P. Binev

321
Citations
Imaging individual atoms inside crystals with ADF-STEM

P.M. Voyles;J.L. Grazul;D.A. Muller

290
Citations
Nanoscale structure and structural relaxation in Zr50Cu45Al5 bulk metallic glass.

Jinwoo Hwang;Z. H. Melgarejo;Y. E. Kalay;I. Kalay

251
Citations
Stabilization of copper catalysts for liquid-phase reactions by atomic layer deposition.

Brandon J. O'Neill;David H. K. Jackson;Anthony J. Crisci;Carrie A. Farberow

229
Citations
Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition

M.-Y. Ho;H. Gong;G. D. Wilk;B. W. Busch

193
Citations
Fluctuation microscopy in the STEM.

P.M. Voyles;D.A. Muller

184
Citations
Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2

A. Matsumoto;H. Kumakura;H. Kitaguchi;B. J. Senkowicz

175
Citations
High‐Performance, Quantum Dot Nanocomposites for Nonlinear Optical and Optical Gain Applications

Melissa A. Petruska;Anton V. Malko;Paul M. Voyles;Victor I. Klimov

170
Citations
Atom pair persistence in disordered materials from fluctuation microscopy

J.M Gibson;M.M.J Treacy;P.M Voyles;P.M Voyles

155
Citations
Tm3Fe5O12/Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications

Andy Quindeau;Can O. Avci;Wenqing Liu;Wenqing Liu;Congli Sun

155
Citations
Quantitative Measurement of Density in a Shear Band of Metallic Glass Monitored Along its Propagation Direction.

Vitalij Schmidt;Harald Rösner;Martin Peterlechner;Gerhard Wilde

152
Citations
Fast flexible electronics with strained silicon nanomembranes

Han Zhou;Jung Hun Seo;Deborah M. Paskiewicz;Ye Zhu

150
Citations
Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy

William G. Stratton;Joseph Hamann;John H. Perepezko;Paul M. Voyles

136
Citations
Influence of film composition in quaternary Heusler alloy Co2(Mn,Fe)Si thin films on tunnelling magnetoresistance of Co2(Mn,Fe)Si/MgO-based magnetic tunnel junctions

Hong-xi Liu;Takeshi Kawami;Kidist Moges;Tetsuya Uemura

133
Citations
Fluctuation microscopy: a probe of atomic correlations in disordered materials

P. M. Voyles;J. M. Gibson;M. M. J. Treacy

133
Citations
Supertwisted spirals of layered materials enabled by growth on non-Euclidean surfaces.

Yuzhou Zhao;Chenyu Zhang;Daniel D. Kohler;Jason M. Scheeler

128
Citations
Structure and physical properties of paracrystalline atomistic models of amorphous silicon

P. M. Voyles;P. M. Voyles;N. Zotov;S. M. Nakhmanson;S. M. Nakhmanson;D. A. Drabold

127
Citations
Absence of an Abrupt Phase Change from Polycrystalline to Amorphous in Silicon with Deposition Temperature

P. M. Voyles;P. M. Voyles;J. E. Gerbi;M. M. J. Treacy;J. M. Gibson

119
Citations
Medium-range order in amorphous silicon measured by fluctuation electron microscopy

Paul M. Voyles;John R. Abelson

116
Citations