2020 - Fellow of the Royal Society, United Kingdom
2007 - Burton Medal, Mineralogical Society of America
His primary scientific interests are in Scanning transmission electron microscopy, Optics, Spherical aberration, Detector and Contrast transfer function. His Scanning transmission electron microscopy study integrates concerns from other disciplines, such as Microscope, Scattering, Microscopy, Diffraction and Atomic number. His Optics study combines topics in areas such as Electron and Iterative reconstruction.
His study on Spherical aberration also encompasses disciplines like
Peter D. Nellist mainly focuses on Optics, Scanning transmission electron microscopy, Scanning confocal electron microscopy, Nanotechnology and Electron. His Scanning transmission electron microscopy research is included under the broader classification of Electron microscope. His studies in Scanning confocal electron microscopy integrate themes in fields like Annular dark-field imaging and Electron tomography.
His Nanotechnology study frequently draws connections to adjacent fields such as Atomic units. His Conventional transmission electron microscope research integrates issues from Contrast transfer function and High-resolution transmission electron microscopy. His Detector research includes themes of Scattering and Diffraction.
His primary areas of investigation include Optics, Ptychography, Scanning transmission electron microscopy, Electron and Detector. Much of his study explores Optics relationship to Phase retrieval. His work carried out in the field of Ptychography brings together such families of science as Deconvolution, Frame rate, Phase-contrast imaging and Microscopy.
His Scanning transmission electron microscopy study is concerned with the larger field of Electron microscope. His biological study spans a wide range of topics, including Resolution, Spherical aberration, Crystal and Nanostructure. The concepts of his Detector study are interwoven with issues in Diffraction, Artificial intelligence and Computer vision.
Peter D. Nellist mainly investigates Scanning transmission electron microscopy, Optics, Ptychography, Electron and Dark field microscopy. His Scanning transmission electron microscopy research is multidisciplinary, incorporating perspectives in Atomic units, Nanoparticle, Beam, Atom and Nuclear magnetic resonance. His Optics research focuses on Scattering in particular.
His Ptychography study combines topics from a wide range of disciplines, such as Deconvolution, Detector, Phase-contrast imaging, Microscopy and Phase retrieval. His research integrates issues of Lens, Electron microscope, Transmission electron microscopy and Nanostructure in his study of Electron. His Electron microscope research is multidisciplinary, relying on both Range and Strong interaction.
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Two-Dimensional Nanosheets Produced by Liquid Exfoliation of Layered Materials
Jonathan N. Coleman;Mustafa Lotya;Arlene O'Neill;Shane D. Bergin;Shane D. Bergin.
Direct Sub-Angstrom Imaging of a Crystal Lattice
Peter D. Nellist;Matthew F Chisholm;N. Dellby;O. L. Krivanek.
Scanning transmission electron microscopy : imaging and analysis
Stephen J. Pennycook;Peter D. Nellist.
Incoherent imaging using dynamically scattered coherent electrons
P.D. Nellist;S.J. Pennycook.
Spectroscopic imaging of single atoms within a bulk solid.
M. Varela;S. D. Findlay;A. R. Lupini;H. M. Christen.
Physical Review Letters (2004)
Direct Imaging of the Atomic Configuration of Ultradispersed Catalysts
P. D. Nellist;S. J. Pennycook.
The principles and interpretation of annular dark-field Z-contrast imaging
P.D. Nellist;S.J. Pennycook.
Advances in Imaging and Electron Physics (2000)
Progress in aberration-corrected scanning transmission electron microscopy.
Niklas Dellby;Ondrej L. Krivanek;Peter D. Nellist;Philip E. Batson.
Journal of Electron Microscopy (2001)
Scanning Transmission Electron Microscopy
Peter D. Nellist.
Scanning Transmission Electron Microscopy by Stephen J. Pennycook and Peter D. Nellist. New York: Springer (2011)
Filled and glycosylated carbon nanotubes for in vivo radioemitter localization and imaging
Sung You Hong;Gerard Tobias;Gerard Tobias;Khuloud T. Al-Jamal;Belén Ballesteros;Belén Ballesteros.
Nature Materials (2010)
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