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Dong Myong Kim

Dong Myong Kim

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
33
Citations
4903
World Ranking
6033
National Ranking
212

Best Publications

  • High performance amorphous oxide thin film transistors with self-aligned top-gate structure

    Jae Chul Park;Sang Wook Kim;Sun Il Kim;Huaxiang Yin

  • Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

    Sangwon Lee;Sungwook Park;Sungchul Kim;Yongwoo Jeon

  • Transparent, Flexible Strain Sensor Based on a Solution-Processed Carbon Nanotube Network.

    Jieun Lee;Meehyun Lim;Jinsu Yoon;Min Seong Kim

  • Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

    Kichan Jeon;Changjung Kim;Ihun Song;Jaechul Park

  • Study on the Photoresponse of Amorphous In–Ga–Zn–O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation

    Jun Tae Jang;Jozeph Park;Byung Du Ahn;Dong Myong Kim

  • Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

    Yong Woo Jeon;Sungchul Kim;Sangwon Lee;Dong Myong Kim

  • Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

    Yongsik Kim;Minkyung Bae;Woojoon Kim;Dongsik Kong

  • Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

    Sungchul Kim;Yong Woo Jeon;Yongsik Kim;Dongsik Kong

  • Modeling and characterization of metal-semiconductor-metal-based source-drain contacts in amorphous InGaZnO thin film transistors

    Sangwon Lee;Jun-Hyun Park;Kichan Jeon;Sungchul Kim

  • Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

    Jun-Hyun Park;Kichan Jeon;Sangwon Lee;Sunil Kim

  • A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor

    Jieun Lee;Jaeman Jang;Bongsik Choi;Jinsu Yoon

  • Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability

    Yongsik Kim;Sungchul Kim;Woojoon Kim;Minkyung Bae

  • Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

    Minkyung Bae;Daeyoun Yun;Yongsik Kim;Dongsik Kong

  • Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

    Minkyung Bae;Yongsik Kim;Dongsik Kong;Hyun Kwang Jeong

  • Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors.

    Sungju Choi;Jae-Young Kim;Hara Kang;Daehyun Ko

  • Three-Dimensional Printed Poly(vinyl alcohol) Substrate with Controlled On-Demand Degradation for Transient Electronics.

    Jinsu Yoon;Jungmin Han;Bongsik Choi;Yongwoo Lee

  • Comprehensive evaluation of early retention (fast charge loss within a few seconds) characteristics in tube-type 3-D NAND flash memory

    Bongsik Choi;Sang Hyun Jang;Jinsu Yoon;Juhee Lee

  • Total Subgap Range Density of States-Based Analysis of the Effect of Oxygen Flow Rate on the Bias Stress Instabilities in a-IGZO TFTs

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  • Systematic Decomposition of the Positive Bias Stress Instability in Self-Aligned Coplanar InGaZnO Thin-Film Transistors

    Sungju Choi;Juntae Jang;Hara Kang;Ju Heyuck Baeck

  • Single-Scan Monochromatic Photonic Capacitance-Voltage Technique for Extraction of Subgap DOS Over the Bandgap in Amorphous Semiconductor TFTs

    Hagyoul Bae;Hyunjun Choi;Sungwoo Jun;Chunhyung Jo

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