Dong Myong Kim

Dong Myong Kim publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Dong Myong Kim sits on this spectrum.

Dong Myong Kim D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Dong Myong Kim sits on this spectrum.

Best Publications

• High performance amorphous oxide thin film transistors with self-aligned top-gate structure

  Jae Chul Park;Sang Wook Kim;Sun Il Kim;Huaxiang Yin

  960
  Citations

• Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

  Sangwon Lee;Sungwook Park;Sungchul Kim;Yongwoo Jeon

  182
  Citations

• Transparent, Flexible Strain Sensor Based on a Solution-Processed Carbon Nanotube Network.

  Jieun Lee;Meehyun Lim;Jinsu Yoon;Min Seong Kim

  165
  Citations

• Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

  Kichan Jeon;Changjung Kim;Ihun Song;Jaechul Park

  134
  Citations

• Study on the Photoresponse of Amorphous In–Ga–Zn–O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation

  Jun Tae Jang;Jozeph Park;Byung Du Ahn;Dong Myong Kim

  107
  Citations

• Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

  Yong Woo Jeon;Sungchul Kim;Sangwon Lee;Dong Myong Kim

  90
  Citations

• Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

  Yongsik Kim;Minkyung Bae;Woojoon Kim;Dongsik Kong

  89
  Citations

• Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

  Sungchul Kim;Yong Woo Jeon;Yongsik Kim;Dongsik Kong

  81
  Citations

• Modeling and characterization of metal-semiconductor-metal-based source-drain contacts in amorphous InGaZnO thin film transistors

  Sangwon Lee;Jun-Hyun Park;Kichan Jeon;Sungchul Kim

  77
  Citations

• Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

  Jun-Hyun Park;Kichan Jeon;Sangwon Lee;Sunil Kim

  77
  Citations

• A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor

  Jieun Lee;Jaeman Jang;Bongsik Choi;Jinsu Yoon

  76
  Citations

• Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability

  Yongsik Kim;Sungchul Kim;Woojoon Kim;Minkyung Bae

  72
  Citations

• Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

  Minkyung Bae;Daeyoun Yun;Yongsik Kim;Dongsik Kong

  70
  Citations

• Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

  Minkyung Bae;Yongsik Kim;Dongsik Kong;Hyun Kwang Jeong

  66
  Citations

• Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors.

  Sungju Choi;Jae-Young Kim;Hara Kang;Daehyun Ko

  59
  Citations

• Three-Dimensional Printed Poly(vinyl alcohol) Substrate with Controlled On-Demand Degradation for Transient Electronics.

  Jinsu Yoon;Jungmin Han;Bongsik Choi;Yongwoo Lee

  57
  Citations

• Comprehensive evaluation of early retention (fast charge loss within a few seconds) characteristics in tube-type 3-D NAND flash memory

  Bongsik Choi;Sang Hyun Jang;Jinsu Yoon;Juhee Lee

  57
  Citations

• Total Subgap Range Density of States-Based Analysis of the Effect of Oxygen Flow Rate on the Bias Stress Instabilities in a-IGZO TFTs

  Unknown

  57
  Citations

• Systematic Decomposition of the Positive Bias Stress Instability in Self-Aligned Coplanar InGaZnO Thin-Film Transistors

  Sungju Choi;Juntae Jang;Hara Kang;Ju Heyuck Baeck

  51
  Citations

• Single-Scan Monochromatic Photonic Capacitance-Voltage Technique for Extraction of Subgap DOS Over the Bandgap in Amorphous Semiconductor TFTs

  Hagyoul Bae;Hyunjun Choi;Sungwoo Jun;Chunhyung Jo

  47
  Citations