World's Best Scientists 2026 revealed!
Dae Hwan Kim

Dae Hwan Kim

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
42
Citations
7644
World Ranking
4088
National Ranking
137

Best Publications

  • High performance amorphous oxide thin film transistors with self-aligned top-gate structure

    Jae Chul Park;Sang Wook Kim;Sun Il Kim;Huaxiang Yin

  • Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

    Sangwon Lee;Sungwook Park;Sungchul Kim;Yongwoo Jeon

  • Highly Stable Transparent Amorphous Oxide Semiconductor Thin‐Film Transistors Having Double‐Stacked Active Layers

    Jae Chul Park;Sangwook Kim;Sunil Kim;Changjung Kim

  • Effect of channel thickness on density of states in amorphous InGaZnO thin film transistor

    Sang Yeol Lee;Do Hyung Kim;Eugene Chong;Yong Woo Jeon

  • Transparent, Flexible Strain Sensor Based on a Solution-Processed Carbon Nanotube Network.

    Jieun Lee;Meehyun Lim;Jinsu Yoon;Min Seong Kim

  • Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

    Kichan Jeon;Changjung Kim;Ihun Song;Jaechul Park

  • Instability of amorphous oxide semiconductors via carrier-mediated structural transition between disorder and peroxide state

    Ho-Hyun Nahm;Yong-Sung Kim;Dae Hwan Kim

  • Study on the Photoresponse of Amorphous In–Ga–Zn–O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation

    Jun Tae Jang;Jozeph Park;Byung Du Ahn;Dong Myong Kim

  • ZnO composite nanolayer with mobility edge quantization for multi-value logic transistors

    Lynn Lee;Jeongwoon Hwang;Jeongwoon Hwang;Jin Won Jung;Jongchan Kim

  • Cation composition effects on electronic structures of In-Sn-Zn-O amorphous semiconductors

    Unknown

  • Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

    Yong Woo Jeon;Sungchul Kim;Sangwon Lee;Dong Myong Kim

  • Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

    Yongsik Kim;Minkyung Bae;Woojoon Kim;Dongsik Kong

  • Nanoscale Multi-Line Patterning Using Sidewall Structure

    Kyung-Hoon Chung;Suk-Kang Sung;Dae Hwan Kim;Woo Young Choi

  • Simulation study on discrete charge effects of SiNW biosensors according to bound target position using a 3D TCAD simulator

    In-Young Chung;Hyeri Jang;Jieun Lee;Hyunggeun Moon

  • Density of states of amorphous In-Ga-Zn-O from electrical and optical characterization

    Eric Kai Hsiang Yu;Sungwoo Jun;Dae Hwan Kim;Jerzy Kanicki

  • Density of states-based design of metal oxide thin-film transistors for high mobility and superior photostability.

    Hyun-Suk Kim;Joon Seok Park;Hyun-Kwang Jeong;Kyoung Seok Son

  • Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

    Sungchul Kim;Yong Woo Jeon;Yongsik Kim;Dongsik Kong

  • Modeling and characterization of metal-semiconductor-metal-based source-drain contacts in amorphous InGaZnO thin film transistors

    Sangwon Lee;Jun-Hyun Park;Kichan Jeon;Sungchul Kim

  • Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

    Jun-Hyun Park;Kichan Jeon;Sangwon Lee;Sunil Kim

  • A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor

    Jieun Lee;Jaeman Jang;Bongsik Choi;Jinsu Yoon

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