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IEEE

2026 IEEE International Electron Devices Meeting (IEDM 2026) (IEDM)

Location: San Francisco, CA (Hilton Union Square) , United States

Conference dates: 12/12/2026 - 12/16/2026

Research H-index
38

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 10 308 608 33
Physics 4 18 28 11

Call for Papers

There is no information available for the call of papers for 2026 IEEE International Electron Devices Meeting (IEDM 2026)

Overview

This comprehensive ranking presents the leading scientific conferences in the field of Engineering and Technology. The ranking is meticulously prepared by Research.com, an authoritative platform renowned for providing reliable data and insights on scientific research and contributions across all major fields, including Engineering and Technology, since 2014.

Each conference's position in the ranking is determined by a unique bibliometric score developed by Research.com. This score is calculated based on the estimated h-index, as well as the number of leading scientists who have participated in the conference over the past three years. Such a multidimensional approach ensures that the ranking accurately reflects both the scientific impact and the prominence of expert engagement at each conference.

The Impact Score values included in this ranking were gathered as of 2024-11-27, providing the most recent and relevant assessment of conference influence. The ranking process entailed a rigorous and detailed review of more than 2,262 conferences. These were selected after exhaustive analysis of over 26,934 scientific documents published in the last three years by 9,385 distinguished and highly respected scientists within the Engineering and Technology community.

This in-depth, expert-driven evaluation process guarantees that the ranking offered here is both credible and authoritative, serving as a valuable guide for researchers, institutions, and professionals seeking to identify the most impactful scientific conferences in Engineering and Technology.

For a comprehensive overview of the methodology used to compute the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Electron Devices Meeting (based on the number of publications) are:

  • Chenming Hu (118 papers) absent at the last edition,
  • Guido Groeseneken (74 papers) published 1 paper at the last edition, 2 less than at the previous edition,
  • Dim-Lee Kwong (57 papers) absent at the last edition,
  • Naoto Horiguchi (54 papers) published 4 papers at the last edition, 2 less than at the previous edition,
  • Krishna C. Saraswat (51 papers) published 1 paper at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Electron Devices Meeting (based on the number of publications) are:

  • IBM (726 papers) published 11 papers at the last edition, 3 less than at the previous edition,
  • Bell Labs (524 papers) absent at the last edition,
  • Toshiba (463 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Katholieke Universiteit Leuven (354 papers) published 29 papers at the last edition, 1 more than at the previous edition,
  • Stanford University (337 papers) published 5 papers at the last edition, 3 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 4.76% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 28.64% were posted by at least one author from the top 10 institutions publishing at the conference. Another 19.55% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.45% of all publications and 36.36% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Related Online Degrees & Career Pathways

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