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40th IEEE International Conference on Computer Design

40th IEEE International Conference on Computer Design (ICCD)

Name: International Conference on Computer Design
Start: 2022-10-23
End: 2022-10-26
Location: Lake Tahoe

Location: Lake Tahoe , United States

Conference dates: 10/23/2022 - 10/26/2022

Research H-index

Official website

Ranking & Metrics

Discipline name	Position	Best Scientists	Publications	D-Index
Electronics and Electrical Engineering	141	48	61	10
Computer Science	244	88	129	13

Call for Papers

ICCD encompasses a wide range of topics in the research, design, and implementation of computer systems and their components. ICCD’s multi-disciplinary emphasis provides an ideal environment for developers and researchers to discuss practical and theoretical work covering systems and applications, computer architecture, verification and test, design tools and methodologies, circuit design, and technology.

Track 1. Computer Systems: System architecture and software (compiler, programming language/model, firmware, OS, hypervisor, runtime) design and co-design for embedded/real-time systems; System support and compilers for multi/many cores, co-processors, and accelerators; System support for security, reliability, and energy efficiency and proportionality; Virtual memory; System support for emerging technologies, including NVM, quantum, neuromorphic, bio-inspired computing, machine learning and artificial intelligence applications; Specialized OS, runtime, and storage systems for data center and cloud/edge computing, high-performance computing (HPC), exascale system, and serverless computing.

Track 2. Processor Architecture: Microarchitecture design techniques for single-threaded and multi/many-core processors, such as instruction-level parallelism, pipelining, caches, branch prediction, multithreading, and networks-on-chip; Techniques for low-power, secure, and reliable processor architectures; Hardware acceleration for emerging applications including NVM, quantum, neuromorphic, bio-inspired; Hardware support for processor virtualization; Real-life design challenges: case studies, tradeoffs, retrospectives.

Track 3. Test, Verification, and Security: Design error debug and diagnosis; Fault modeling; Fault simulation and ATPG; Analog/RF testing; Statistical test methods; Large volume yield analysis and learning; Fault tolerance; DFT and BIST; Functional, transaction-level, RTL, and gate-level modeling and verification of hardware designs; Equivalence checking, property checking, and theorem proving; Constrained-random test generation; High-level design and SoC validation; Hardware security primitives and methodologies; Side-channel analysis, attacks and mitigations for processors and accelerators; Interaction between test, security and trust.

Track 4. Electronic Design Automation: System-level design and synthesis; High-level, logic and physical synthesis; Analysis and optimization of timing, power, variability/yield, temperature, and noise; Physical design, including partitioning, floorplanning, placement, and routing; Clocktree synthesis; Verification methods at different levels of the EDA flow; Tools for multiple-clock domains, asynchronous, and mixed-timing methodologies; CAD support for accelerators, FPGAs, SoCs, ASICs, NoC, and general-purpose processors; CAD for manufacturing, test, verification, and security; Tools and design methods for emerging technologies (photonics, MEMS, spintronics, nano, quantum); interaction of EDA and AI/ML.

Track 5. Logic and Circuit Design: Circuit design techniques for digital, memory, analog and mixed-signal systems; Circuit design techniques for high performance and low power; Circuit design techniques for robustness under process variability, electromigration, and radiation; Design techniques for emerging and maturing technologies (MEMS, nano-spintronics, quantum, flexible electronics, multi-gate devices, in-memory computing); Asynchronous circuit design; Signal-processing, graphic-processor, and datapath circuits.

Overview

The scientific conference ranking featured on this page presents a comprehensive assessment of conferences within the field of Engineering and Technology. Developed by Research.com, a recognized leader in providing reliable data on scientific research since 2014, this ranking draws upon the platform’s long-standing expertise across all major scientific domains. Users can trust the rigor behind this evaluation, given Research.com’s established commitment to accuracy and depth in science metrics.

The position of each conference in this ranking is determined by a unique bibliometric score calculated by Research.com. This score integrates the estimated h-index of the conference and the number of leading scientists who have participated in the conference over the previous three years. This method ensures a holistic and representative assessment of each conference’s impact and scholarly significance within the Engineering and Technology community.

Impact Score values listed in this ranking were collected as of 2024-11-27, ensuring data freshness and relevance. The process of assembling this ranking began with the examination of over 2,262 conferences, which were carefully selected following a detailed review and rigorous analysis of more than 26,934 scientific documents published in the latest three-year period. These documents were authored by 9,385 leading and highly respected scientists active in the field of Engineering and Technology, guaranteeing that only conferences with demonstrable scholarly influence were included.

For a detailed explanation of the methodology used to compute the ranking scores, please consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at International Conference on Computer Design (based on the number of publications) are:

Jinkuan Wang (21 papers) absent at the last edition,
Sunil P. Khatri (14 papers) published 2 papers at the last edition, 1 less than at the previous edition,
Baris Taskin (11 papers) absent at the last edition,
Onur Mutlu (11 papers) published 1 paper at the last edition, 1 less than at the previous edition,
Ramesh Karri (11 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Computer Design (based on the number of publications) are:

Northeastern University (China) (71 papers) absent at the last edition,
Shandong University of Technology (27 papers) absent at the last edition,
Texas A&M University (23 papers) published 2 papers at the last edition, 1 less than at the previous edition,
University of California, San Diego (23 papers) published 2 papers at the last edition, 3 less than at the previous edition,
Chinese Academy of Sciences (22 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2018 edition, 29.35% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 22.31% were posted by at least one author from the top 10 institutions publishing at the conference. Another 23.08% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 10.00% of all publications and 44.62% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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