The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Tai-Chang Chiang sits on this spectrum.
This scientist: 447 publications — 82nd percentile
82% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Tai-Chang Chiang sits on this spectrum.
This scientist: 67 D-Index — 61st percentile
61% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Tai-Chang Chiang is affiliated with the University of Illinois at Urbana-Champaign in the United States. Their research focuses extensively on the fields of Materials Science and Physics and Astronomy, with significant contributions to subfields such as Materials Chemistry, Atomic and Molecular Physics, and Optics. Their specialization also extends to Condensed Matter Physics, Electronic, Optical and Magnetic Materials, and Electrical and Electronic Engineering.
Their primary topics of study include:
Tai-Chang Chiang has co-authored numerous papers with frequent collaborators including Meng-Kai Lin, Joseph A. Hlevyack, Guang Bian, Sung-Kwan Mo, and Peter Abbamonte. Their work appears in a range of scientific journals and repositories, most notably:
Among their recent publications are:
Their research addresses quantum and electronic properties of thin films and low-dimensional materials, investigating topics such as semimetal-to-semiconductor transitions, Dirac fermions, and topological semimetals.
In 1986, Tai-Chang Chiang was recognized as a Fellow of the American Physical Society (APS) for contributions to the understanding of bulk, surface, and interface states of metals and semiconductors using photoemission techniques.
T.-C Chiang
Anshul Kogar;Melinda S. Rak;Sean Vig;Ali A. Husain
Baojie Feng;Osamu Sugino;Ro Ya Liu;Jin Zhang
D. E. Eastman;T. C. Chiang;P. Heimann;F. J. Himpsel
T. C. Chiang;J. A. Knapp;M. Aono;D. E. Eastman
Y. I. Joe;X. M. Chen;P. Ghaemi;K. D. Finkelstein
Peng Chen;Yang-hao Chan;Xinyue Fang;Yi Zhang
Baojie Feng;Botao Fu;Shusuke Kasamatsu;Suguru Ito
T. E. Kidd;T. Miller;M. Y. Chou;T.-C. Chiang
J. J. Paggel;T. Miller;T.-C. Chiang
G. Kaindl;T. C. Chiang;D. E. Eastman;F. J. Himpsel
P. Chen;P. Chen;Woei Wu Pai;Y.-H. Chan;V. Madhavan
D.-A. Luh;T. Miller;J. J. Paggel;M. Y. Chou
Y. Liu;G. Bian;T. Miller;T.-C. Chiang
Baojie Feng;Botao Fu;Shusuke Kasamatsu;Suguru Ito
M. H. Upton;C. M. Wei;C. M. Wei;M. Y. Chou;T. Miller
M. Holt;P. Zschack;Hawoong Hong;M. Y. Chou
T. Miller;A. Samsavar;G. E. Franklin;T.-C. Chiang
P. Chen;P. Chen;Woei Wu Pai;Y.-H. Chan;W.-L. Sun
T.-C. Chiang;G. Kaindl;T. Mandel
T. Miller;W. E. McMahon;T.-C. Chiang
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