Optics, Non-contact atomic force microscopy, Microscopy, Microscope and Conductive atomic force microscopy are his primary areas of study. Othmar Marti has included themes like Shear force and Polymer in his Optics study. His Non-contact atomic force microscopy study combines topics from a wide range of disciplines, such as Cantilever, Electrostatic force microscope and Adhesive.
His Microscopy study incorporates themes from Resolution, Nanotechnology, Scanning probe microscopy and Diffraction. His Microscope research is multidisciplinary, incorporating elements of Limiting, Membrane and Pipette. The study incorporates disciplines such as Kelvin probe force microscope and Analytical chemistry in addition to Conductive atomic force microscopy.
Othmar Marti mainly focuses on Optics, Nanotechnology, Polymer, Composite material and Microscope. His is doing research in Laser, Scanning probe microscopy, Non-contact atomic force microscopy, Near and far field and Optical microscope, both of which are found in Optics. His Non-contact atomic force microscopy research includes elements of Cantilever and Electrostatic force microscope.
His research investigates the connection with Nanotechnology and areas like Microscopy which intersect with concerns in Graphite. His work carried out in the field of Polymer brings together such families of science as Adhesion, Small-angle X-ray scattering, Monolayer, Polymer chemistry and Chemical engineering. His research on Microscope frequently links to adjacent areas such as Normal force.
Polymer, Nanotechnology, Chemical engineering, Microrheology and Polymer chemistry are his primary areas of study. The Polymer study combines topics in areas such as Microemulsion, Monolayer, Extrusion and Surface energy. As part of the same scientific family, Othmar Marti usually focuses on Nanotechnology, concentrating on Composite material and intersecting with Microscope.
The concepts of his Polymer chemistry study are interwoven with issues in Condensation and Polystyrene. He merges Noise with Optics in his research. His research on Optics often connects related topics like Crystal.
Othmar Marti spends much of his time researching Small-angle X-ray scattering, Microemulsion, Dynamic light scattering, Analytical chemistry and PEG ratio. His Dynamic light scattering study introduces a deeper knowledge of Chemical engineering. His studies deal with areas such as Monolayer and Length scale as well as Chemical engineering.
Analytical chemistry is closely attributed to Scattering in his study. His studies in Scattering integrate themes in fields like Viscosity, Microstructure and Diffusion. In his papers, Othmar Marti integrates diverse fields, such as PEG ratio, Polymer, Polymer chemistry and Polyethylene glycol.
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The scanning ion-conductance microscope.
P. K. Hansma;B. Drake;O. Marti;S. A. C. Gould.
Science (1989)
An atomic-resolution atomic-force microscope implemented using an optical lever
S. Alexander;L. Hellemans;O. Marti;J. Schneir.
Journal of Applied Physics (1989)
Scanning tunneling microscopy and atomic force microscopy: application to biology and technology
PK Hansma;VB Elings;O Marti;CE Bracker.
Science (1988)
The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation
A Rosa-Zeiser;E Weilandt;S Hild;O Marti.
Measurement Science and Technology (1997)
Atomic force microscopy of liquid‐covered surfaces: Atomic resolution images
O. Marti;B. Drake;P. K. Hansma.
Applied Physics Letters (1987)
Combined scanning force and friction microscopy of mica
O Marti;J Colchero;J Mlynek.
Nanotechnology (1990)
Regulation of a microcantilever response by force feedback
J. Mertz;O. Marti;J. Mlynek.
Applied Physics Letters (1993)
Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy
Thomas Stifter;Othmar Marti;Bharat Bhushan.
Physical Review B (2000)
Scanning tunneling microscope combined with a scanning electron microscope
Ch. Gerber;G. Binnig;H. Fuchs;O. Marti.
Review of Scientific Instruments (1986)
Influence of the overlap parameter on the convergence of the ptychographical iterative engine.
Oliver Bunk;Martin Dierolf;Martin Dierolf;Søren Kynde;Ian Johnson.
Ultramicroscopy (2008)
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