World's Best Scientists 2026 revealed!

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Engineering and Technology

D-Index
38
Citations
6976
World Ranking
7960
National Ranking
118

Research.com Recognitions

  • 2019 - IEEE Fellow For contributions to digital magnetic tape recording

Overview

Mark A. Lantz is affiliated with IBM Research - Zurich in Switzerland. Their research primarily lies within the fields of Computer Science and Engineering, with specific focus areas including Computer Networks and Communications, Biomedical Engineering, Atomic and Molecular Physics and Optics, Information Systems, and Electrical and Electronic Engineering.

The scientist's main topics of work encompass:

  • Characterization and Applications of Magnetic Nanoparticles
  • Advanced Data Storage Technologies
  • Magnetic properties of thin films
  • Ferroelectric and Negative Capacitance Devices
  • Magnetic Field Sensors Techniques
  • Distributed systems and fault tolerance
  • Caching and Content Delivery

Mark A. Lantz has contributed to several recent papers, including:

  • "317 Gb/in2 Recording Areal Density on Strontium Ferrite Tape", 2021, IEEE Transactions on Magnetics
  • "Magnetic Tape Storage Technology", 2024, ACM Transactions on Storage
  • "Performance evaluation of tape library systems", 2022, Performance Evaluation
  • "Track-following system optimization for future magnetic tape data storage", 2021, Mechatronics
  • "Acceleration-as-a-μService: A Cloud-native Monte-Carlo Option Pricing Engine on CPUs, GPUs and Disaggregated FPGAs", 2021, arXiv (Cornell University)

Frequent co-authors include:

  • Simeon Furrer
  • Giovanni Cherubini
  • Ilias Iliadis
  • Patrick Ebermann
  • H. Rothuizen

Their work has been published across various recognized venues:

  • Performance Evaluation
  • IEEE Transactions on Magnetics
  • ACM Transactions on Storage
  • Mechatronics
  • arXiv (Cornell University)

In 2019, Mark A. Lantz was awarded the IEEE Fellow distinction for contributions to digital magnetic tape recording.

Best Publications

  • The "millipede" - nanotechnology entering data storage

    P. Vettiger;G. Cross;M. Despont;U. Drechsler

  • Quantitative measurement of short-range chemical bonding forces.

    M. A. Lantz;H. J. Hug;R. Hoffmann;P. J. A. van Schendel

  • "Millipede": a MEMS-based scanning-probe data-storage system

    E. Eleftheriou;T. Antonakopoulos;G.K. Binnig;G. Cherubini

  • Atomic-force-microscope study of contact area and friction on NbSe 2

    M. A. Lantz;S. J. O'Shea;M. E. Welland;K. L. Johnson

  • Atomistic wear in a single asperity sliding contact.

    Bernd Gotsmann;Mark A. Lantz

  • Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon

    Harish Bhaskaran;Bernd Gotsmann;Abu Sebastian;Ute Drechsler

  • Lateral stiffness of the tip and tip-sample contact in frictional force microscopy

    M. A. Lantz;S. J. O’Shea;A. C. F. Hoole;M. E. Welland

  • 29.5- $\hbox{Gb/in}^{2}$ Recording Areal Density on Barium Ferrite Tape

    G Cherubini;R D Cideciyan;L Dellmann;E Eleftheriou

  • Quantized thermal transport across contacts of rough surfaces

    B. Gotsmann;M. A. Lantz

  • Probe-based ultrahigh-density storage technology

    A. Pantazi;A. Sebastian;T. A. Antonakopoulos;P. Bächtold

  • On the Application of Transition State Theory to Atomic-Scale Wear

    Tevis D. B. Jacobs;Bernd Gotsmann;Mark A. Lantz;Robert W. Carpick

  • Dynamic superlubricity and the elimination of wear on the nanoscale

    Mark A. Lantz;Dorothea Wiesmann;Bernd Gotsmann

  • Low temperature scanning force microscopy of the Si(111)-(7x7) surface

    M. A. Lantz;H. J. Hug;P. J. A. van Schendel;R. Hoffmann

  • Simultaneous force and conduction measurements in atomic force microscopy

    M. A. Lantz;S. J. O’Shea;M. E. Welland

  • High density timing based servo format for use with tilted transducer arrays

    Robert G. Biskeborn;Mark A. Lantz

  • A micromechanical thermal displacement sensor with nanometre resolution

    Mark A Lantz;Gerd K Binnig;Michel Despont;Ute Drechsler

  • A Vibration Resistant Nanopositioner for Mobile Parallel-Probe Storage Applications

    M.A. Lantz;H.E. Rothuizen;U. Drechsler;W. Haberle

  • High resolution vacuum scanning thermal microscopy of HfO2 and SiO2

    M. Hinz;O. Marti;B. Gotsmann;M. A. Lantz

  • Stretching the α-helix: a direct measure of the hydrogen-bond energy of a single-peptide molecule

    Mark A. Lantz;Suzanne P. Jarvis;Hiroshi Tokumoto;Tomasz Martynski

  • Control of MEMS-Based Scanning-Probe Data-Storage Devices

    A. Pantazi;A. Sebastian;G. Cherubini;M. Lantz

  • 201 Gb/in 2 Recording Areal Density on Sputtered Magnetic Tape

    Simeon Furrer;Mark A. Lantz;Peter Reininger;Angeliki Pantazi

Frequent Co-Authors

Hugo E. Rothuizen
Hugo E. Rothuizen IBM Research - Zurich
Bernd Gotsmann
Bernd Gotsmann IBM Research - Zurich
Michel Despont
Michel Despont Swiss Center for Electronics and Microtechnology (Switzerland)
Ute Drechsler
Ute Drechsler IBM Research - Zurich
Mark E. Welland
Mark E. Welland University of Cambridge
Peter Vettiger
Peter Vettiger École Polytechnique Fédérale de Lausanne
Abu Sebastian
Abu Sebastian IBM Research - Zurich
H.-J. Güntherodt
H.-J. Güntherodt University of Basel
Christoph Hagleitner
Christoph Hagleitner IBM (United States)

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