Seizo Morita

Overview

Best Publications

• Chemical identification of individual surface atoms by atomic force microscopy

  Yoshiaki Sugimoto;Pablo Pou;Masayuki Abe;Masayuki Abe;Pavel Jelinek

  914
  Citations

• Atom inlays performed at room temperature using atomic force microscopy

  Yoshiaki Sugimoto;Masayuki Abe;Shinji Hirayama;Noriaki Oyabu

  397
  Citations

• Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

  Yasuhiro Sugawara;Masahiro Ohta;Hitoshi Ueyama;Seizo Morita

  376
  Citations

• Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy

  Yoshiaki Sugimoto;Pablo Pou;Oscar Custance;Pavel Jelinek

  326
  Citations

• Atomic force microscopy as a tool for atom manipulation

  Oscar Custance;Ruben Perez;Seizo Morita

  305
  Citations

• Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy.

  Noriaki Oyabu;Óscar Custance;Insook Yi;Yasuhiro Sugawara

  288
  Citations

• Evidence of subsurface oxygen vacancy ordering on reduced CeO2(111).

  Stefan Torbrügge;Michael Reichling;Atsushi Ishiyama;Seizo Morita

  258
  Citations

• New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.

  Sascha Sadewasser;Pavel Jelinek;Chung-Kai Fang;Oscar Custance

  188
  Citations

• Role of a covalent bonding interaction in noncontact-mode atomic-force microscopy on Si(111)7×7

  T. Uchihashi;Y. Sugawara;T. Tsukamoto;M. Ohta

  173
  Citations

• Single Atomic Contact Adhesion and Dissipation in Dynamic Force Microscopy

  Noriaki Oyabu;Pablo Pou;Yoshiaki Sugimoto;Pavel Jelinek;Pavel Jelinek

  171
  Citations

• Spatially quantized friction with a lattice periodicity

  Seizo Morita;Satoru Fujisawa;Yasuhiro Sugawara

  155
  Citations

• Mechanism for Room-Temperature Single-Atom Lateral Manipulations on Semiconductors using Dynamic Force Microscopy

  Yoshiaki Sugimoto;Pavel Jelinek;Pablo Pou;Masayuki Abe;Masayuki Abe

  154
  Citations

• Room-temperature reproducible spatial force spectroscopy using atom-tracking technique

  M. Abe;Y. Sugimoto;O. Custance;S. Morita

  140
  Citations

• Noncontact Atomic Force Microscopy: Volume 2

  Seizo Morita;Franz J. Giessibl;Roland Wiesendanger

  128
  Citations

• Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy

  Noriaki Oyabu;Yoshiaki Sugimoto;Masayuki Abe;Óscar Custance

  127
  Citations

• STABLE OPERATION MODE FOR DYNAMIC NONCONTACT ATOMIC FORCE MICROSCOPY

  H. Ueyama;Y. Sugawara;S. Morita

  123
  Citations

• Atomic-scale friction observed with a two-dimensional frictional-force microscope.

  Satoru Fujisawa;Eigo Kishi;Yasuhiro Sugawara;Seizo Morita

  119
  Citations

• Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α − Sn ∕ Si ( 111 ) − ( 3 × 3 ) R 30 ° surface

  Yoshiaki Sugimoto;Pablo Pou;Óscar Custance;Pavel Jelinek

  97
  Citations

• Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light

  Takao Okada;Akira Yagi;Yasuhiro Sugawara;Seizo Morita

  94
  Citations

• The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

  Kenji Okamoto;Yasuhiro Sugawara;Seizo Morita

  86
  Citations