Seizo Morita

Seizo Morita publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Seizo Morita sits on this spectrum.

Seizo Morita D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Seizo Morita sits on this spectrum.

Overview

Best Publications

• Chemical identification of individual surface atoms by atomic force microscopy

  Yoshiaki Sugimoto;Pablo Pou;Masayuki Abe;Masayuki Abe;Pavel Jelinek

  914
  Citations

• Atom inlays performed at room temperature using atomic force microscopy

  Yoshiaki Sugimoto;Masayuki Abe;Shinji Hirayama;Noriaki Oyabu

  397
  Citations

• Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

  Yasuhiro Sugawara;Masahiro Ohta;Hitoshi Ueyama;Seizo Morita

  376
  Citations

• Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy

  Yoshiaki Sugimoto;Pablo Pou;Oscar Custance;Pavel Jelinek

  326
  Citations

• Atomic force microscopy as a tool for atom manipulation

  Oscar Custance;Ruben Perez;Seizo Morita

  305
  Citations

• Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy.

  Noriaki Oyabu;Óscar Custance;Insook Yi;Yasuhiro Sugawara

  288
  Citations

• Evidence of subsurface oxygen vacancy ordering on reduced CeO2(111).

  Stefan Torbrügge;Michael Reichling;Atsushi Ishiyama;Seizo Morita

  258
  Citations

• New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.

  Sascha Sadewasser;Pavel Jelinek;Chung-Kai Fang;Oscar Custance

  188
  Citations

• Role of a covalent bonding interaction in noncontact-mode atomic-force microscopy on Si(111)7×7

  T. Uchihashi;Y. Sugawara;T. Tsukamoto;M. Ohta

  173
  Citations

• Single Atomic Contact Adhesion and Dissipation in Dynamic Force Microscopy

  Noriaki Oyabu;Pablo Pou;Yoshiaki Sugimoto;Pavel Jelinek;Pavel Jelinek

  171
  Citations

• Spatially quantized friction with a lattice periodicity

  Seizo Morita;Satoru Fujisawa;Yasuhiro Sugawara

  155
  Citations

• Mechanism for Room-Temperature Single-Atom Lateral Manipulations on Semiconductors using Dynamic Force Microscopy

  Yoshiaki Sugimoto;Pavel Jelinek;Pablo Pou;Masayuki Abe;Masayuki Abe

  154
  Citations

• Room-temperature reproducible spatial force spectroscopy using atom-tracking technique

  M. Abe;Y. Sugimoto;O. Custance;S. Morita

  140
  Citations

• Noncontact Atomic Force Microscopy: Volume 2

  Seizo Morita;Franz J. Giessibl;Roland Wiesendanger

  128
  Citations

• Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy

  Noriaki Oyabu;Yoshiaki Sugimoto;Masayuki Abe;Óscar Custance

  127
  Citations

• STABLE OPERATION MODE FOR DYNAMIC NONCONTACT ATOMIC FORCE MICROSCOPY

  H. Ueyama;Y. Sugawara;S. Morita

  123
  Citations

• Atomic-scale friction observed with a two-dimensional frictional-force microscope.

  Satoru Fujisawa;Eigo Kishi;Yasuhiro Sugawara;Seizo Morita

  119
  Citations

• Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α − Sn ∕ Si ( 111 ) − ( 3 × 3 ) R 30 ° surface

  Yoshiaki Sugimoto;Pablo Pou;Óscar Custance;Pavel Jelinek

  97
  Citations

• Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light

  Takao Okada;Akira Yagi;Yasuhiro Sugawara;Seizo Morita

  94
  Citations

• The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

  Kenji Okamoto;Yasuhiro Sugawara;Seizo Morita

  86
  Citations