His scientific interests lie mostly in Crystallography, Ion, Scattering, Optics and Condensed matter physics. His studies deal with areas such as Ion beam, Lattice, Thermodynamics and Analytical chemistry as well as Crystallography. His Ion research includes themes of Thermal, Relaxation, Molecular physics and Silicon.
His Scattering study combines topics from a wide range of disciplines, such as Excited state, Air gap and Nucleation. His work on X-ray crystallography and Attenuation as part of his general Optics study is frequently connected to Formalism and Planar, thereby bridging the divide between different branches of science. His work deals with themes such as Ultimate tensile strength, Thin film, Single crystal and Melting point, which intersect with Condensed matter physics.
J.F. van der Veen focuses on Scattering, Ion, Crystallography, Analytical chemistry and Optics. In his research, Energy minimization is intimately related to Molecular physics, which falls under the overarching field of Scattering. His work in the fields of Ion, such as Medium energy, overlaps with other areas such as Monolayer.
J.F. van der Veen has researched Crystallography in several fields, including Oxide, Melting point, Metal and Thermodynamics. His studies in Analytical chemistry integrate themes in fields like Silicide, Silicon, Epitaxy, Layer and Substrate. His Optics research is multidisciplinary, incorporating elements of Electron density and Mica.
His main research concerns Diffraction, Optics, Scattering, Structure and Electron density. His work carried out in the field of Diffraction brings together such families of science as Coating and Condensed matter physics. He combines subjects such as Buckling, Charge density and Dielectric with his study of Condensed matter physics.
His Acousto-optics, Fresnel diffraction and Diffraction grating study in the realm of Optics connects with subjects such as Autocorrelation and Narrow gap. His study in the field of Scattering theory also crosses realms of Bilayer. The Electron density study combines topics in areas such as X-ray reflectivity, Silane, Nanometre, Mica and Molecular physics.
His scientific interests lie mostly in Scattering, Diffraction, Structure, Planar and Statistical physics. His Scattering study necessitates a more in-depth grasp of Optics. His work in the fields of Diffraction, such as X-ray crystallography, intersects with other areas such as Nanomesh.
He performs integrative study on Structure and Anisotropy.
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Observation of surface melting
Joost W. M. Frenken;J. F. van der Veen.
Physical Review Letters (1985)
Ion beam crystallography of surfaces and interfaces
J.F. van der Veen.
Surface Science Reports (1985)
Generation of misfit dislocations in semiconductors
P. M. J. Marée;J. C. Barbour;J. F. van der Veen;K. L. Kavanagh.
Journal of Applied Physics (1987)
Crystal-face dependence of surface melting.
B. Pluis;A. W. Denier van der Gon;J. W. M. Frenken;J. F. van der Veen.
Physical Review Letters (1987)
Layering of a liquid metal in contact with a hard wall
W.J. Huisman;J.F. Peters;M.J. Zwanenburg;S.A. de Vries.
Surface-induced melting and freezing. II, A semi-empirical landau-type model
B Pluis;D Frenkel;J.F van der Veen.
Surface Science (1990)
Thin epitaxial Ge-Si(111) films: Study and control of morphology
P.M.J. Marée;K. Nakagawa;F.M. Mulders;J.F. van der Veen.
Surface Science (1987)
Melting of al surfaces
A.W.Denier van der Gon;R.J. Smith;D.J. O'connor.
Surface Science (1990)
GaAs ( 001 ) − c ( 4 × 4 ) : A chemisorbed structure
P. K. Larsen;J. H. Neave;J. F. van der Veen;P. J. Dobson.
Physical Review B (1983)
Structure-Dependent 4 f —Core-Level Binding Energies for Surface Atoms on Ir(111), Ir(100)-(5 × 1), and Metastable Ir(100)-(1 × 1)
J. F. van der Veen;F. J. Himpsel;D. E. Eastman.
Physical Review Letters (1980)
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