David J. H. Cockayne

Overview

Best Publications

• Investigations of dislocation strain fields using weak beams

  D. J. H. Cockayne;I. L. F. Ray;M. J. Whelan

  907
  Citations

• Effects of interdiffusion on the luminescence of InGaAs/GaAs quantum dots

  R. Leon;Yong Kim;C. Jagadish;M. Gal

  343
  Citations

• The measurement of stacking-fault energies of pure face-centred cubic metals

  Unknown

  305
  Citations

• The structure of the C 70 molecule

  D. R. McKenzie;C. A. Davis;D. J. H. Cockayne;D. A. Muller

  295
  Citations

• The Dissociation of Dislocations in Silicon

  I. L. F. Ray;David John Hugh Cockayne

  256
  Citations

• Electron diffraction analysis of polycrystalline and amorphous thin films

  D. J. H. Cockayne;D. R. McKenzie

  231
  Citations

• Dissociation of near-screw dislocations in germanium and silicon

  A. Gomez;D. J. H. Cockayne;P. B. Hirsch;V. Vitek

  186
  Citations

• A Theoretical Analysis of the Weak-beam Method of Electron Microscopy

  D.J.H. Cockayne

  175
  Citations

• The principles and practice of the weak-beam method of electron microscopy

  D. J. H. Cockayne

  171
  Citations

• Rare earth element trends and cerium-uranium-manganese associations in weathered rock from Koongarra, Northern Territory, Australia

  Anthony J. Koppi;Robert Edis;Damien J. Field;Harold R. Geering

  169
  Citations

• Damage to epitaxial GaN layers by silicon implantation

  H. H. Tan;J. S. Williams;J. Zou;D. J. H. Cockayne

  156
  Citations

• The Study of Nanovolumes of Amorphous Materials Using Electron Scattering

  David J. H. Cockayne

  152
  Citations

• Inhibited carrier transfer in ensembles of isolated quantum dots

  C Lobo;R Leon;S Marcinkevicius;W Yang

  143
  Citations

• Strain relaxation by alloying effects in Ge islands grown on Si(001)

  X. Z. Liao;J. Zou;D. J. H. Cockayne;J. Qin

  142
  Citations

• Electrical and structural analysis of high-dose Si implantation in GaN

  J. C. Zolper;H. H. Tan;J. S. Williams;J. Zou

  139
  Citations

• A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.

  John L. Hutchison;John M. Titchmarsh;David J.H. Cockayne;Ron C. Doole

  135
  Citations

• Annealing of ion implanted gallium nitride

  H. H. Tan;J. S. Williams;J. Zou;D. J. H. Cockayne

  114
  Citations

• Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots

  X Z Liao;Jin Zou;David John Hugh Cockayne;R Leon

  112
  Citations

• The observation of dissociated dislocations in silicon

  I. L. F. Ray;D. J. H. Cockayne

  110
  Citations

• Electron optical characterization of cubic boron nitride thin films prepared by reactive ion plating

  D. R. McKenzie;D. J. H. Cockayne;D. A. Muller;M. Murakawa

  106
  Citations

• Bulk Nanocrystalline Fe3Al-Based Material Prepared by Aluminothermic Reaction

  Peiqing La;Peiqing La;Jim Yang;David J. H. Cockayne;Weimin Liu

  99
  Citations